journal of electronic imaging
VOL. 4 · NO. 3 | July 1995

Articles (9)
Articles (1)
J. Electron. Imag. 4(3), (1 July 1995) doi:10.1117/12.214836
TOPICS: Image processing, Electrical engineering, Nonlinear image processing, Image segmentation, Image compression, Document imaging, Multimedia, Image analysis, Mathematical modeling, Real time imaging
James Kasson, Sigfredo Nin, Wil Plouffe, James Hafner
J. Electron. Imag. 4(3), (1 July 1995) doi:10.1117/12.208656
TOPICS: Prisms, Mathematical modeling, Polonium, Error analysis, CMYK color model, Printing, CRTs, Anisotropy, Solids, 3D modeling
C. Alexopoulos, Nikolaos Bourbakis, N. Ioannou
J. Electron. Imag. 4(3), (1 July 1995) doi:10.1117/12.208654
TOPICS: Image encryption, Fractal analysis, Composites, Image processing, Raster graphics, Imaging arrays, Algorithm development, Digital imaging, Binary data, Matrices
W. Tariq, Nikolaos Bourbakis, J. Mertoguno, C. Alexopoulos
J. Electron. Imag. 4(3), (1 July 1995) doi:10.1117/12.208653
TOPICS: Image processing, Convolution, Image sensors, Video, Photomasks, Clocks, Device simulation, Integrated circuits, Video processing, Application specific integrated circuits
Martin Hahn, Stefan Wolf, Maati Talmi, Michael Karl
J. Electron. Imag. 4(3), (1 July 1995) doi:10.1117/12.212195
TOPICS: Motion estimation, Reliability, Digital signal processing, Very large scale integration, Signal processing, Optical filters, Field programmable gate arrays, Upconversion, Clocks, Video
Wee-Soon Ching
J. Electron. Imag. 4(3), (1 July 1995) doi:10.1117/12.210718
TOPICS: Imaging systems, Cameras, Signal to noise ratio, Image analysis, Information technology, Image acquisition, CCD cameras, Head, Image registration, Electronics engineering
Larry Rystrom, Robert Haralick, Philip Katz
J. Electron. Imag. 4(3), (1 July 1995) doi:10.1117/12.210717
TOPICS: Binary data, Image processing, Nonlinear filtering, Mathematical morphology, Distance measurement, Image filtering, Heart, Electroluminescence, Applied physics, Linear filtering
Hsin-Chia Fu, Ting-Shan Cheng, Cheng-Chin Chiang, Shing-Ming Roan
J. Electron. Imag. 4(3), (1 July 1995) doi:10.1117/12.208652
TOPICS: Detection and tracking algorithms, Optical character recognition, Computer science, Information science, Electronic imaging, Computer architecture, Computing systems, Picosecond phenomena
Mandava Rajeswari, K. Saravanan
J. Electron. Imag. 4(3), (1 July 1995) doi:10.1117/12.210719
TOPICS: Inspection, Prototyping, Integrated circuits, Image processing, Image enhancement, Defect inspection, Integrated modeling, Lead, Image segmentation, Manufacturing
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