Journal of Electronic Imaging
VOL. 4 · NO. 3 | July 1995
CONTENTS
IN THIS ISSUE

Articles (10)
Articles
J. Electron. Imag. 4(3), (1 July 1995) https://doi.org/10.1117/12.214836
TOPICS: Image processing, Electrical engineering, Nonlinear image processing, Image segmentation, Image compression, Document imaging, Multimedia, Image analysis, Mathematical modeling, Real time imaging
J. Electron. Imag. 4(3), (1 July 1995) https://doi.org/10.1117/12.208656
TOPICS: Prisms, Mathematical modeling, Polonium, Error analysis, CMYK color model, Printing, CRTs, Anisotropy, Solids, 3D modeling
J. Electron. Imag. 4(3), (1 July 1995) https://doi.org/10.1117/12.208654
TOPICS: Image encryption, Fractal analysis, Composites, Image processing, Raster graphics, Imaging arrays, Algorithm development, Digital imaging, Binary data, Matrices
J. Electron. Imag. 4(3), (1 July 1995) https://doi.org/10.1117/12.208653
TOPICS: Image processing, Convolution, Image sensors, Video, Photomasks, Clocks, Device simulation, Integrated circuits, Video processing, Application specific integrated circuits
J. Electron. Imag. 4(3), (1 July 1995) https://doi.org/10.1117/12.212195
TOPICS: Motion estimation, Reliability, Digital signal processing, Very large scale integration, Signal processing, Optical filters, Field programmable gate arrays, Upconversion, Clocks, Video
J. Electron. Imag. 4(3), (1 July 1995) https://doi.org/10.1117/12.210718
TOPICS: Imaging systems, Cameras, Signal to noise ratio, Image analysis, Information technology, Image acquisition, CCD cameras, Head, Image registration, Electronics engineering
J. Electron. Imag. 4(3), (1 July 1995) https://doi.org/10.1117/12.210717
TOPICS: Binary data, Image processing, Nonlinear filtering, Mathematical morphology, Distance measurement, Image filtering, Heart, Electroluminescence, Applied physics, Linear filtering
J. Electron. Imag. 4(3), (1 July 1995) https://doi.org/10.1117/12.208652
TOPICS: Detection and tracking algorithms, Optical character recognition, Computer science, Information science, Electronic imaging, Computer architecture, Computing systems, Picosecond phenomena
J. Electron. Imag. 4(3), (1 July 1995) https://doi.org/10.1117/12.210719
TOPICS: Inspection, Prototyping, Integrated circuits, Image processing, Image enhancement, Defect inspection, Integrated modeling, Lead, Image segmentation, Manufacturing
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