journal of electronic imaging
VOL. 6 · NO. 1 | January 1997
CONTENTS
IN THIS ISSUE

Articles (15)
Articles
J. Electron. Imag. 6(1), (1 January 1997) doi:10.1117/12.283650
TOPICS: Electronic imaging, Optical engineering
Dominique Jeulin
J. Electron. Imag. 6(1), (1 January 1997) doi:10.1117/12.283653
TOPICS: Mathematical modeling, Mining, Monte Carlo methods, Data modeling, Statistical modeling, 3D modeling, Analytical research, Image analysis, Image segmentation, Networks
Jean Serra
J. Electron. Imag. 6(1), (1 January 1997) doi:10.1117/12.260395
TOPICS: Mathematical modeling, Image filtering, Convolution, Video microscopy, Motion models, Transform theory, Microscopy, Video, Visual process modeling, Image processing
Dominique Jeulin, Pascal Laurenge
J. Electron. Imag. 6(1), (1 January 1997) doi:10.1117/12.261930
TOPICS: Statistical modeling, Metals, Computer simulations, Volume rendering, Data modeling, Electrodes, Liquids, Dielectrics, Spherical lenses, Image processing
Krishnamoorthy Sivakumar, John Goutsias
J. Electron. Imag. 6(1), (1 January 1997) doi:10.1117/12.261931
TOPICS: Monte Carlo methods, Binary data, Image filtering, Signal to noise ratio, Image restoration, Image classification, Magnetorheological finishing, Statistical analysis, Image analysis, Digital filtering
Junior Barrera, Edward Dougherty, Nina Tomita
J. Electron. Imag. 6(1), (1 January 1997) doi:10.1117/12.260010
TOPICS: Binary data, Computer programming, Statistical analysis, Image analysis, Image processing, Optimal filtering, Neural networks, Error analysis, Systems modeling, Signal processing
Sergei Zuyev, Pascal Desnogues, Hery Rakotoarisoa
J. Electron. Imag. 6(1), (1 January 1997) doi:10.1117/12.260011
TOPICS: Stochastic processes, Networks, Computer simulations, Systems modeling, Telecommunications, Performance modeling, Visual process modeling, Algorithm development, Optimization (mathematics), Statistical analysis
Luc Decker, Dominique Jeulin
J. Electron. Imag. 6(1), (1 January 1997) doi:10.1117/12.261879
TOPICS: Particles, Diffusion, Solids, Motion models, Computer simulations, Chemical reactions, Coating, Binary data, Chemical species, Scattering
Eric Bouvier, Eyal Cohen, Laurent Najman
J. Electron. Imag. 6(1), (1 January 1997) doi:10.1117/12.261175
TOPICS: Particles, Particle systems, Systems modeling, Computer simulations, Molecules, Visualization, Atmospheric particles, Motion models, Fluid dynamics, Etching
Liviu Voicu, Harley Myler, Arthur Weeks
J. Electron. Imag. 6(1), (1 January 1997) doi:10.1117/12.251157
TOPICS: RGB color model, Image filtering, Optical filters, Image processing, Image enhancement, Linear filtering, Color image processing, Fourier transforms, Color difference, Electronic filtering
J. McDonnell, Robert Shorten, Anthony Fagan
J. Electron. Imag. 6(1), (1 January 1997) doi:10.1117/12.251159
TOPICS: Digital filtering, Quantization, Image filtering, Image processing, Image classification, Nonlinear filtering, Image compression, Image quality, Distortion, Signal processing
Sheng Lin, Ezzatollah Salari
J. Electron. Imag. 6(1), (1 January 1997) doi:10.1117/12.251160
TOPICS: Quantization, Image compression, Wavelet transforms, Wavelets, Distortion, Computer programming, Image quality, Reconstruction algorithms, Linear filtering, Image filtering
Wei-Yu Han, Ja-Chen Lin
J. Electron. Imag. 6(1), (1 January 1997) doi:10.1117/12.251155
TOPICS: Diffusion, Image filtering, Halftones, Image quality standards, Binary data, Visualization, Image processing, Standards development, Digital filtering, Printing
Timo Vuori, Clifton Smith
J. Electron. Imag. 6(1), (1 January 1997) doi:10.1117/12.251156
TOPICS: Cameras, Calibration, Imaging systems, Light sources, 3D image processing, Range imaging, Light sources and illumination, Security technologies, Information security, Image processing
Lawrence Ray
J. Electron. Imag. 6(1), (1 January 1997) doi:10.1117/12.283654
TOPICS: Computer graphics, Systems modeling, Visual process modeling, Computing systems, Mathematics, 3D image processing, Mathematical modeling, Numerical analysis, Machine vision, Computer vision technology
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