11 February 2013 Measurement of the gauge factor of few-layer graphene
Xiaohu Zheng, Xing Chen, Ji-Kwan Kim, Dong-Weon Lee, Xinxin Li
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Abstract
Graphene, one of the recently discovered carbon nanostructures, has shown good piezoresistive properties. One of the most important areas of research for graphene sheets, in terms of basic science and application in strain or stress sensors, is the measurement of gauge factors. The gauge factors of various layers of graphene sheets are measured based on the equivalent stress beam. The measurement is carried out using a beam-bending method to detect the change in resistance of graphene sheets in different bending states. The gauge factor ranges from 10 to 15, depending on the number of layers in the graphene sheet. These results reveal the piezoresistance effect of single- and multi-layer graphene sheets, which will be of benefit in the fabrication of microsensors. The resistance of graphene sheets decreases as temperature increases from 20°C to 60°C, and the gauge factor is not very sensitive to changes in environmental temperature.
© 2013 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2013/$25.00 © 2013 SPIE
Xiaohu Zheng, Xing Chen, Ji-Kwan Kim, Dong-Weon Lee, and Xinxin Li "Measurement of the gauge factor of few-layer graphene," Journal of Micro/Nanolithography, MEMS, and MOEMS 12(1), 013009 (11 February 2013). https://doi.org/10.1117/1.JMM.12.1.013009
Published: 11 February 2013
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CITATIONS
Cited by 17 scholarly publications.
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KEYWORDS
Graphene

Resistance

Temperature metrology

Carbon

Electrodes

Metals

Environmental sensing

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