7 February 2024 Effect of tilt angle and drying temperature on the surface coverage rate of polystyrene nanospheres in evaporation-driven self-assembly process
Ayşe Aygül Ergürhan, Onur Şenel, Elif Yılmaz, Burcu Arpapay, Mustafa Kulakcı, Uğur Serincan
Author Affiliations +
Abstract

Masking with polystyrene (PS) nanospheres, also known as colloidal lithography, is suitable for many technological applications. In this study, an evaporation-driven self-assembly process was applied and the surface coverage behavior of the nanospheres was monitored in terms of the surface coverage rate of the PS nanospheres and the change in the amount of hexagonal closed packed structures as a function of the suspension ratio, the drying temperature, and the tilt angle. Using this method, a well-ordered and homogeneous PS monolayer with a surface coverage rate of 82% (or relative surface coverage rate of 98%) was achieved on a 1×1 cm2 substrate surface.

© 2024 Society of Photo-Optical Instrumentation Engineers (SPIE)
Ayşe Aygül Ergürhan, Onur Şenel, Elif Yılmaz, Burcu Arpapay, Mustafa Kulakcı, and Uğur Serincan "Effect of tilt angle and drying temperature on the surface coverage rate of polystyrene nanospheres in evaporation-driven self-assembly process," Journal of Micro/Nanopatterning, Materials, and Metrology 23(1), 013001 (7 February 2024). https://doi.org/10.1117/1.JMM.23.1.013001
Received: 15 July 2023; Accepted: 9 January 2024; Published: 7 February 2024
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Sampling rates

Scanning electron microscopy

Statistical analysis

Polystyrene

Lithography

Monolayers

Picosecond phenomena

Back to Top