Metallized slit-shaped pyramidal Si probe with extremely high resolution for 1.5-Tbit/in2 density near-field optical storage

Takashi Yatsui; Wataru Nomura; Motoichi Ohtsu

doi:10.1117/1.2794357

1 September 2007 Metallized slit-shaped pyramidal Si probe with extremely high resolution for 1.5-Tbit/in2 density near-field optical storage

Takashi Yatsui, Wataru Nomura, Motoichi Ohtsu

Author Affiliations +

Journal of Nanophotonics, Vol. 1, Issue 1, 011550 (September 2007). https://doi.org/10.1117/1.2794357

Abstract

We have developed a near-field optical probe by introducing the metallized pyramidal structure of a Si probe with a slit-shaped tip for high-density optical storage. Numerical analysis using the finite-difference time-domain method showed that the optical spot generated at the aperture measured 13×30 nm. We fabricated a slit-type Si probe and evaluated the spot size using fluorescence imaging of a single dye molecule. The full-width at half maximum of the signal profiles was 16 nm×26 nm, which corresponds to a data density of 1.5 Tbit/in². Furthermore, a large extinction coefficient depending on the polarization was confirmed.

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Takashi Yatsui, Wataru Nomura, and Motoichi Ohtsu "Metallized slit-shaped pyramidal Si probe with extremely high resolution for 1.5-Tbit/in2 density near-field optical storage," Journal of Nanophotonics 1(1), 011550 (1 September 2007). https://doi.org/10.1117/1.2794357

Published: 1 September 2007

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