Semi-continuous silver film templates are fabricated by focused ion beams (FIB), and surface-enhanced Raman scattering spectra from C60-fullerene deposited on these templates are recorded. Films of silver deposited by thermal evaporation are dry-etched by the ion beams with various etching times. The films tend to become semi-continuous as the etch-time increases. The Raman spectra of C60 show an increase in intensity upon correction with a silver coverage area for increasing etch-times. Increase in Raman intensity is due to the sharp edges of the FIB-etched semi-continuous templates, and the moderate enhancements are attributed to dissipation induced by gallium incorporation. A maximum enhancement factor of about 4×106 is observed, which is comparable with other experimental values. Controlling gallium incorporation during processing or by post processing treatments is being explored, which can help increase the enhancement factor.
"Surface-enhanced Raman scattering from semi-continuous silver film templates etched by focused ion beams," Journal of Nanophotonics 4(1), 049504 (1 September 2010). https://doi.org/10.1117/1.3502030