14 February 2014 Publisher’s note: Tunable stoichiometry of BCxNy thin films through multitarget pulsed laser deposition monitored via in situ ellipsometry
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Abstract
This article [J. Nanophoton.. 8, (1 ), 083890 ( Feb 5 , 2014)] mistakenly appeared in the Special Section on Metamaterials and Photonic Nanostructures. It was republished in the Special Section on Nanostructured Thin Films VI with a corrected CID on 10 February 2014. The updated citation is shown below:
Jones, Sun, Murphy, Back, Lange, Remmert, Terrence Murray, and Jakubiak: Publisher’s note: Tunable stoichiometry of BCxNy thin films through multitarget pulsed laser deposition monitored via in situ ellipsometry

This article [J. Nanophoton. 8(1), 083890 (Feb 5, 2014)] mistakenly appeared in the Special Section on Metamaterials and Photonic Nanostructures. It was republished in the Special Section on Nanostructured Thin Films VI with a corrected CID on 10 February 2014. The updated citation is shown below:

J. G. Joneset al., “Tunable stoichiometry of BCxNy thin films through multitarget pulsed laser deposition monitored via in situ ellipsometry,” J. Nanophoton. 8, 083999 (2014).

© The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
John G. Jones, John G. Jones, Lirong Sun, Lirong Sun, Neil R. Murphy, Neil R. Murphy, Tyson C. Back, Tyson C. Back, Matthew A. Lange, Matthew A. Lange, Jessica L. Remmert, Jessica L. Remmert, Paul T. Murray, Paul T. Murray, } "Publisher’s note: Tunable stoichiometry of BCxNy thin films through multitarget pulsed laser deposition monitored via in situ ellipsometry," Journal of Nanophotonics 8(1), 089999 (14 February 2014). https://doi.org/10.1117/1.JNP.8.089999 . Submission:
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