3 September 2015 Impacts of tapered sidewall profile on subwavelength grating wideband reflectors
Wenxi Yu, Mao Ye, Ya Sha Yi
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Abstract
We have demonstrated the significant impacts of grating tapered sidewall profile on the subwavelength grating wideband reflector characteristics when taking into account the practical fabrication process. Two different classes of wideband reflectors, referred to as zero-contrast gratings and high-contrast gratings, are numerically investigated in detail and the distinct differences of the impacts due to a grating tapered sidewall are observed. Our works reveal that this tapered sidewall profile plays a critical role in determining the reflection bandwidth, average reflectance, and the band edge. The results could be widely utilized in applications of a variety of nanophotonic devices and their integration, as well as facilitate the design of the fabrication process on how to control the degree of tapered sidewall profile for the integrated subwavelength grating nanophotonic devices.
© 2015 Society of Photo-Optical Instrumentation Engineers (SPIE) 1934-2608/2015/$25.00 © 2015 SPIE
Wenxi Yu, Mao Ye, and Ya Sha Yi "Impacts of tapered sidewall profile on subwavelength grating wideband reflectors," Journal of Nanophotonics 9(1), 093058 (3 September 2015). https://doi.org/10.1117/1.JNP.9.093058
Published: 3 September 2015
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CITATIONS
Cited by 6 scholarly publications.
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KEYWORDS
Reflectors

Reflectivity

Diffraction gratings

Diffraction

Dry etching

Nanophotonics

Control systems

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