Differential cross section for reflected electrons measured by electron mirror method

Younis Mohamed Atiah Al-zahy

doi:10.1117/1.JNP.9.093096

23 January 2015 Differential cross section for reflected electrons measured by electron mirror method

Younis Mohamed Atiah Al-zahy

Author Affiliations +

Journal of Nanophotonics, Vol. 9, Issue 1, 093096 (January 2015). https://doi.org/10.1117/1.JNP.9.093096

Abstract

We derive an equation for the differential cross-section dσ/dΩ of reflected electrons by using Electron Mirror method. The mathematical derivation of differential cross-section equation is based on the Rutherford scattering model as well as the equation of electric potential difference. We describe the interaction of focused electron beams with a polyethylene terephthalate sample using focused ion beam-scanning electron microscope electron mirror image. The electron differential cross-section dσ/dΩ for different working distances h=33, 20, and 10 mm, with a scattering angle θ ranged from 10 deg to 55 deg, incident electrons energies η=500, 750, and 1000 eV, and scanning potential Δφ ranged from 1 to 2 kV has been calculated. According to our findings, the differential cross-section dσ/dΩ of reflected electrons decreases with increasing scattering angle θ and the working distance h and is directly proportional to the difference potential Δφ and the energy of incident electrons η. Distort the electron mirror images with increased Δφ.

Citation Download Citation

Younis Mohamed Atiah Al-zahy "Differential cross section for reflected electrons measured by electron mirror method," Journal of Nanophotonics 9(1), 093096 (23 January 2015). https://doi.org/10.1117/1.JNP.9.093096

Published: 23 January 2015

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