Characterization of intrinsic ZnO thin film deposited by sputtering and its effects on CuIn1−xGaxSe2 solar cells

Minlin Jiang; Xingzhong Yan; Ken Tang

doi:10.1117/1.JPE.2.028502

26 July 2012 Characterization of intrinsic ZnO thin film deposited by sputtering and its effects on CuIn1−xGaxSe2 solar cells

Minlin Jiang, Xingzhong Yan, Ken Tang

Author Affiliations +

Journal of Photonics for Energy, Vol. 2, Issue 1, 028502 (July 2012). https://doi.org/10.1117/1.JPE.2.028502

Abstract

Intrinsic ZnO (i-ZnO) thin films were deposited on glass substrates by radio-frequency magnetron sputtering for exploring the effects of the deposition conditions. These films were optically, electrically, and structurally characterized. Results showed that the properties of i-ZnO thin films changed with the changing of deposition conditions. These i-ZnO films were also integrated into CuIn_1-xGa_xSe₂ (CIGS) solar cells. It was found that the incorporation of an i-ZnO layer in CIGS solar cells led to a significant improvement of homogeneity and efficiency of CIGS solar cells. An increment of 1.71% was gained in the average cell efficiency through adjusting the deposition conditions of i-ZnO layers. Detailed analysis showed that there was no improvement in cell efficiency under the deposition conditions favorable for growing the i-ZnO films. These results indicate that there should be a balance among the optimized performance of each layer deposited for high quality multi-layer devices.

Citation Download Citation

Minlin Jiang, Xingzhong Yan, and Ken Tang "Characterization of intrinsic ZnO thin film deposited by sputtering and its effects on CuIn1−xGaxSe2 solar cells," Journal of Photonics for Energy 2(1), 028502 (26 July 2012). https://doi.org/10.1117/1.JPE.2.028502

Published: 26 July 2012

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