Editorial
OE 56(8), 080101 (19 August 2017) doi:10.1117/1.OE.56.8.080101
Special Section on Imaging Spectrometry
OE 56(8), 081802 (2 May 2017) doi:10.1117/1.OE.56.8.081802
TOPICS: Image registration, Spectroscopy, Image processing, Distortion, Imaging spectroscopy, Fourier transforms, Imaging arrays, Image restoration, Detection and tracking algorithms, Optical engineering
OE 56(8), 081803 (2 May 2017) doi:10.1117/1.OE.56.8.081803
TOPICS: Spectroscopy, Imaging systems, Polishing, Spectral resolution, Sensors, Prisms, Hyperspectral imaging, Image filtering, Optical engineering, Prototyping
Michael Pieper, Dimitris Manolakis, Eric Truslow, Thomas Cooley, Michael Brueggeman, John Jacobson, Andrew Weisner
OE 56(8), 081804 (29 May 2017) doi:10.1117/1.OE.56.8.081804
TOPICS: Infrared imaging, Infrared radiation, Hyperspectral imaging, Long wavelength infrared, Thermography, Sensors, Algorithm development, Solid modeling, Performance modeling, Data acquisition
Di Bai, David Messinger, David Howell
OE 56(8), 081805 (2 June 2017) doi:10.1117/1.OE.56.8.081805
TOPICS: Analytical research, Cultural heritage, Hyperspectral imaging, Image enhancement, Visualization, Imaging systems, Visual analytics
OE 56(8), 081806 (7 June 2017) doi:10.1117/1.OE.56.8.081806
TOPICS: Interferometers, Spectrometers, Imaging spectrometry, Spectral resolution, Sensors, Target recognition, Remote sensing, Polarization, Heterodyning, Calibration
OE 56(8), 081807 (7 June 2017) doi:10.1117/1.OE.56.8.081807
TOPICS: Signal to noise ratio, Interference (communication), Sensors, Remote sensing, Atmospheric sensing, Atmospheric optics, Sensor performance, Multispectral imaging, Hyperspectral imaging, Image sensors
OE 56(8), 081808 (15 June 2017) doi:10.1117/1.OE.56.8.081808
TOPICS: Sensors, Hyperspectral target detection, Target detection, Detection and tracking algorithms, Digital filtering, Hyperspectral imaging
OE 56(8), 081809 (19 June 2017) doi:10.1117/1.OE.56.8.081809
TOPICS: Data modeling, Long wavelength infrared, Infrared radiation, Content addressable memory, Temperature metrology
Jie Chen, Lifu Zhang, Taixia Wu, Peng Zhang, Hongming Zhang
OE 56(8), 081810 (6 July 2017) doi:10.1117/1.OE.56.8.081810
TOPICS: Imaging systems, Imaging spectroscopy, Infrared spectroscopy, Spectral resolution, Visible radiation, Near infrared, Shortwaves, Infrared imaging, Short wave infrared radiation, Infrared radiation
Francis D. Hallada, Anthony L. Franz, Michael R. Hawks
OE 56(8), 081811 (21 July 2017) doi:10.1117/1.OE.56.8.081811
OE 56(8), 081812 (22 July 2017) doi:10.1117/1.OE.56.8.081812
OE 56(8), 081813 (18 August 2017) doi:10.1117/1.OE.56.8.081813
Imaging Components, Systems, and Processing
Xiaoquan Liu, Xinwei Wang, Pengdao Ren, Yinan Cao, Yan Zhou, Yuliang Liu
OE 56(8), 083101 (4 August 2017) doi:10.1117/1.OE.56.8.083101
Michael Teutsch, Wolfgang Krüger, Jürgen Beyerer
OE 56(8), 083102 (16 August 2017) doi:10.1117/1.OE.56.8.083102
Yi Li, Rui Tian, Luqiao Yin, Jianhua Zhang
OE 56(8), 083103 (18 August 2017) doi:10.1117/1.OE.56.8.083103
Gaoli Sang, Feixiang He, Rong Zhu, Shibin Xuan
OE 56(8), 083104 (19 August 2017) doi:10.1117/1.OE.56.8.083104
Chao Zhang, Bindang Xue, Fugen Zhou
OE 56(8), 083105 (19 August 2017) doi:10.1117/1.OE.56.8.083105
Instrumentation, Techniques, and Measurement
Ling Xiong, Xiao Luo, Hai-xiang Hu, Zhi-yu Zhang, Feng Zhang, Li-gong Zheng, Xue-jun Zhang
OE 56(8), 084101 (4 August 2017) doi:10.1117/1.OE.56.8.084101
OE 56(8), 084102 (18 August 2017) doi:10.1117/1.OE.56.8.084102
Xinghua Chai, Fuqiang Zhou, Xin Chen
OE 56(8), 084103 (19 August 2017) doi:10.1117/1.OE.56.8.084103
Tao Liu, Feng Wang, Xuping Zhang, Lin Zhang, Quan Yuan, Yu Liu, Zhijun Yan
OE 56(8), 084104 (19 August 2017) doi:10.1117/1.OE.56.8.084104
Chao Deng, Wei Ren, Yao Mao, Ge Ren
OE 56(8), 084105 (21 August 2017) doi:10.1117/1.OE.56.8.084105
Abhijit Mahalanobis, Richard Shilling, Robert Muise, Mark Neifeld
OE 56(8), 084106 (22 August 2017) doi:10.1117/1.OE.56.8.084106
Dali Ramu Burada, Kamal K. Pant, Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger, Chandra Shakher
OE 56(8), 084107 (22 August 2017) doi:10.1117/1.OE.56.8.084107
Optical Design and Engineering
Wei Ren, Chao Deng, Yao Mao, Ge Ren
OE 56(8), 085101 (4 August 2017) doi:10.1117/1.OE.56.8.085101
OE 56(8), 085102 (19 August 2017) doi:10.1117/1.OE.56.8.085102
Takao Tanabe, Masato Shibuya, Kazuhisa Maehara
OE 56(8), 085103 (21 August 2017) doi:10.1117/1.OE.56.8.085103
Lasers, Fiber Optics, and Communications
Hiroki Kishikawa, Tadashi Kondo, Nobuo Goto, Srinivas Talabattula
OE 56(8), 086101 (4 August 2017) doi:10.1117/1.OE.56.8.086101
Yiwang Chen, Yichao Teng, Baofu Zhang, Pin Zhang, Jianhua Li, Lin Lu
OE 56(8), 086102 (18 August 2017) doi:10.1117/1.OE.56.8.086102
OE 56(8), 086103 (19 August 2017) doi:10.1117/1.OE.56.8.086103
Liang Qiao, Shangyu Liang, Xingyu Lu, Yingjun Zhou, Yi Jiang, Nan Chi
OE 56(8), 086104 (21 August 2017) doi:10.1117/1.OE.56.8.086104
Jiamin Li, Jian Yang, Sheng Cui, Wenjuan Xia, Zhixiang Luo, Changjian Ke
OE 56(8), 086105 (21 August 2017) doi:10.1117/1.OE.56.8.086105
Farzaneh Mehrfar, Hadi Soofi, Ali Pourziad
OE 56(8), 086106 (21 August 2017) doi:10.1117/1.OE.56.8.086106
Mohamad Dernaika, Niall P. Kelly, Ludovic Caro, Kevin Shortiss, Frank H. Peters
OE 56(8), 086107 (22 August 2017) doi:10.1117/1.OE.56.8.086107
Xiao-Yu Wu, Bo Tian, Xi-Yang Xie, Jun Chai, He Li, Yan Jiang
OE 56(8), 086108 (22 August 2017) doi:10.1117/1.OE.56.8.086108
Materials, Photonic Devices, and Sensors
Md. Rabiul Hasan, Sanjida Akter, M. Saifur Rahman, Kawsar Ahmed
OE 56(8), 087101 (17 August 2017) doi:10.1117/1.OE.56.8.087101
Vitaly B. Voloshinov, Dmitriy L. Porokhovnichenko, Evgeniy A. Dyakonov
OE 56(8), 087102 (22 August 2017) doi:10.1117/1.OE.56.8.087102
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