optical engineering
VOL. 13 · NO. 4 | August 1974
CONTENTS
IN THIS ISSUE

Journal Articles
Irving Abel
Opt. Eng. 13(4), 134288 (1 August 1974) doi:10.1117/12.7971707
TOPICS: Target detection, Visible radiation, Sensors, Electro optics, Electro optical systems, Infrared detectors, Infrared imaging, Thermography, Infrared radiation, Stars
I. Abel, B. Reynolds
Opt. Eng. 13(4), 134292 (1 August 1974) doi:10.1117/12.7971708
TOPICS: Scanners, Spectroscopy, Mirrors, Telescopes, Detector arrays, Line scan image sensors, Reflectivity, Relays, Spherical lenses, Beam splitters
Tien Chou
Opt. Eng. 13(4), 134299 (1 August 1974) doi:10.1117/12.7971709
TOPICS: Monte Carlo methods, Optical analysis, Photon transport, Ray tracing, Complex systems, Ranging, Image quality, Quality systems, Signal attenuation, Radiative energy transfer
W. Williamson, D. Shafer, D. Dilworth
Opt. Eng. 13(4), 134303 (1 August 1974) doi:10.1117/12.7971710
TOPICS: Troposphere, Stratosphere, Mesosphere
V. Mazurczyk, R. Graney, J. McCullough
Opt. Eng. 13(4), 134307 (1 August 1974) doi:10.1117/12.7971711
TOPICS: Sensors, Mercury, Electrons
T. Koehler, P. McNally
Opt. Eng. 13(4), 134312 (1 August 1974) doi:10.1117/12.7971712
TOPICS: Photodiodes, Sensors, Mercury, Telecommunications, Sensor performance, Infrared sensors, Infrared detectors, Infrared radiation, Laser sources, Optical communications
C. Bohne, L. Harkless, B. Yap
Opt. Eng. 13(4), 134316 (1 August 1974) doi:10.1117/12.7971713
TOPICS: Cryogenics, Interferometers, Spectroscopy, Rockets, Infrared spectroscopy, Infrared imaging, Infrared radiation, Michelson interferometers, Optical scanning systems
Steven Tomczak
Opt. Eng. 13(4), 134322 (1 August 1974) doi:10.1117/12.7971714
TOPICS: Cryogenics, Interferometers, Laser interferometry, Interferometry, Spectroscopy, Spectral resolution, Calibration, Laser damage threshold
R. Heinisch, R. Young
Opt. Eng. 13(4), 134327 (1 August 1974) doi:10.1117/12.7971715
TOPICS: Mirrors, Contamination, Photography, Infrared radiation, Reflectivity, Metals, Aspheric optics
David Shafer
Opt. Eng. 13(4), 134331 (1 August 1974) doi:10.1117/12.7971716
TOPICS: Sensors, Imaging systems, Laser energy
R. Anderson
Opt. Eng. 13(4), 134335 (1 August 1974) doi:10.1117/12.7971717
TOPICS: Forward looking infrared, Sensors
John Merchant
Opt. Eng. 13(4), 134339 (1 August 1974) doi:10.1117/12.7971718
TOPICS: Signal processing, Electro optics, Measurement devices, Eye, Head
B. Yap
Opt. Eng. 13(4), 134343 (1 August 1974) doi:10.1117/12.7971719
TOPICS: Point spread functions, Thermography, Sensors, Imaging systems, Optical scanning systems, Electronics, Thermal effects, Image sensors, Optical sensors, Optical components
C. Roychoudhuri, B. Thompson
Opt. Eng. 13(4), 134347 (1 August 1974) doi:10.1117/12.7971720
TOPICS: Wavefronts, Holography, Continuous wave operation, Phase measurement, Interferometry, Holograms, Optical testing
Gerald Marshall
Opt. Eng. 13(4), 134354 (1 August 1974) doi:10.1117/12.7971721
TOPICS: Beryllium, Optics manufacturing, Product engineering, Systems engineering, Mirrors, Reflectors, Surveillance systems, Stress analysis, Metal optics, Design for manufacturability
D. Nyyssonen
Opt. Eng. 13(4), 134362 (1 August 1974) doi:10.1117/12.7971722
TOPICS: Coherence (optics), Imaging systems, Spatial coherence
R. Johnson
Opt. Eng. 13(4), 134368 (1 August 1974) doi:10.1117/12.7971723
TOPICS: Thermography, Breast, Photography, Diagnostics
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