optical engineering
VOL. 15 · NO. 3 | June 1976

Journal Articles
L. Baker
Opt. Eng. 15(3), 153189 (1 June 1976) https://doi.org/10.1117/12.7971947
TOPICS: Optical engineering
M. Hutley
Opt. Eng. 15(3), 153190 (1 June 1976) https://doi.org/10.1117/12.7971948
TOPICS: Photoresist materials, Diffraction gratings, Manufacturing, Photosensitive materials, Image processing, Modulation, Near infrared spectroscopy, Spectroscopes, Polarizers, Near infrared
H. Howden, J. Clarke
Opt. Eng. 15(3), 153197 (1 June 1976) https://doi.org/10.1117/12.7971949
TOPICS: Glasses, Aspheric optics, Lenses, New and emerging technologies, Optics manufacturing, Thermography, Manufacturing, Aspheric lenses, Polishing, Spherical lenses
J. Abbiss, M. Marchant, A. Marchant
Opt. Eng. 15(3), 153202 (1 June 1976) https://doi.org/10.1117/12.7971950
TOPICS: Aerospace engineering, Coherent optics, Interferometry, Cameras, Argon ion lasers, Holographic interferometry, Nondestructive evaluation, Composites, Imaging systems, Metals
W. Shand
Opt. Eng. 15(3), 153211 (1 June 1976) https://doi.org/10.1117/12.7971951
TOPICS: Modulation transfer functions, Night vision, Lenses
A. Spooner
Opt. Eng. 15(3), 153215 (1 June 1976) https://doi.org/10.1117/12.7971952
TOPICS: Collimation, Visualization
K. Lindsey, A. Penfold
Opt. Eng. 15(3), 153220 (1 June 1976) https://doi.org/10.1117/12.7971953
TOPICS: Surface finishing, Polishing, Glasses, Vitreous, Silica, Metals, Inspection, Optical microscopy, X-ray optics, Interferometry
A. Franks, D. Butler, B. Gale, M. Stedman, P. Stuart
Opt. Eng. 15(3), 153226 (1 June 1976) https://doi.org/10.1117/12.7971954
TOPICS: X-rays, Spectroscopy, Diffraction gratings, Grazing incidence, Etching, Vitreous, Silica, Diffraction, Spectrometer engineering
Anthony Cardew
Opt. Eng. 15(3), 153231 (1 June 1976) https://doi.org/10.1117/12.7971955
TOPICS: Optics manufacturing, Zoom lenses, Standards development, Electronics, Tolerancing, Spindles, Diamond, Radium
B. Hopkins
Opt. Eng. 15(3), 153236 (1 June 1976) https://doi.org/10.1117/12.7971956
TOPICS: Image analysis, Imaging systems, Cameras, Video, Visual analytics, Visualization, Optoelectronics, Image processing, Video processing, Motion analysis
I. Few
Opt. Eng. 15(3), 153241 (1 June 1976) https://doi.org/10.1117/12.7971957
TOPICS: Telecommunications, Optical testing, Optical fibers, Sensors, Signal attenuation, Laser systems engineering, Nondestructive evaluation, Optical communications, In situ metrology, Gallium
L. Baker, B. Biddies
Opt. Eng. 15(3), 153244 (1 June 1976) https://doi.org/10.1117/12.7971958
TOPICS: Inspection, Surface finishing, Optical inspection, Wafer-level optics, Optical semiconductors, Semiconductors, Polishing, Lenses, Laser scanners, Objectives
R. Jones
Opt. Eng. 15(3), 153247 (1 June 1976) https://doi.org/10.1117/12.7971959
TOPICS: Calibration, Antireflective coatings, Reflection, Tungsten, Silicon, Refractive index
N. Evershed, G. Richards
Opt. Eng. 15(3), 153251 (1 June 1976) https://doi.org/10.1117/12.7971960
TOPICS: Night vision, Infrared imaging, Infrared radiation, Power supplies
W. Bates, N. Player, J. Roberts
Opt. Eng. 15(3), 153255 (1 June 1976) https://doi.org/10.1117/12.7971961
TOPICS: Infrared spectroscopy, Infrared radiation, Spectrophotometry, Airglow
David Casasent, Demetri Psaltis
Opt. Eng. 15(3), 153258 (1 June 1976) https://doi.org/10.1117/12.7971962
TOPICS: Data processing, Optical pattern recognition
A. Hartman
Opt. Eng. 15(3), 153262 (1 June 1976) https://doi.org/10.1117/12.7971963
TOPICS: Scanners, Microscopes
Robert Altenhof
Opt. Eng. 15(3), 153265 (1 June 1976) https://doi.org/10.1117/12.7971964
TOPICS: Optics manufacturing, Beryllium, Design for manufacturability, Optical design, Optical components
Robert Lewis
Opt. Eng. 15(3), 153274 (1 June 1976) https://doi.org/10.1117/12.7971965
TOPICS: Speckle, Coherence imaging, Imaging systems, Image resolution
D. Cronin, J. DeVelis, G. Reynolds
Opt. Eng. 15(3), 153276 (1 June 1976) https://doi.org/10.1117/12.7971966
TOPICS: Phase contrast, Denoising
P. Hariharan
Opt. Eng. 15(3), 153279 (1 June 1976) https://doi.org/10.1117/12.7971967
TOPICS: Holographic interferometry
William Hendee
Opt. Eng. 15(3), 153280 (1 June 1976) https://doi.org/10.1117/12.7971968
TOPICS: X-rays, Safety
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