optical engineering
VOL. 17 · NO. 2 | April 1978
CONTENTS
IN THIS ISSUE

Journal Articles
Edward Murray
Opt. Eng. 17(2), 170218 (1 April 1978) doi:10.1117/12.7972210
TOPICS: Gases, LIDAR
Barry Johnson
Opt. Eng. 17(2), 170228 (1 April 1978) doi:10.1117/12.7972211
TOPICS: Signal to noise ratio, Forward looking infrared, Infrared sensors, Sensors, Interference (communication), Detector arrays
Malcolm Stitch
Opt. Eng. 17(2), 172107 (1 April 1978) doi:10.1117/12.7972192
TOPICS: Laser engineering, Semiconductors
Kamala Krishnan, John Ostrem, Eddie Stappaerts
Opt. Eng. 17(2), 172108 (1 April 1978) doi:10.1117/12.7972193
TOPICS: Infrared imaging, Imaging systems, Upconversion, Infrared radiation, Visible radiation, Nonlinear crystals, Photonic crystals, Ultraviolet radiation, Crystals, Photodetectors
Roy Love, Donald Keck
Opt. Eng. 17(2), 172114 (1 April 1978) doi:10.1117/12.7972194
TOPICS: Waveguides, Optical fibers, Optical fiber cables, Connectors, Telecommunications, Tolerancing, Optical design, Optics manufacturing
R. Kogan., R. Pixton, T. Crow
Opt. Eng. 17(2), 172120 (1 April 1978) doi:10.1117/12.7972195
TOPICS: Crystals, Nd:YAG lasers, Second-harmonic generation, Refraction, Diffraction, Birefringence, Phase matching
J. Eynon, W. Kolb, I. Ramsay
Opt. Eng. 17(2), 172125 (1 April 1978) doi:10.1117/12.7972196
TOPICS: Helium neon lasers, Manufacturing, Yield improvement, Performance modeling
Koichi Shimizu, Akira Ishimaru
Opt. Eng. 17(2), 172129 (1 April 1978) doi:10.1117/12.7972197
TOPICS: Scattering, Bacteria, Mie scattering, Rayleigh scattering, Particles, Scatter measurement, Latex, Optical spheres, Refractive index
Jonathan Shapiro, Anthony Pellegrino, Vincent Berluti
Opt. Eng. 17(2), 172135 (1 April 1978) doi:10.1117/12.7972198
TOPICS: X-rays, Calibration, Diagnostics
Richard Grojean, John Sousa, Joseph Roach, Elliot Wyner, Masato Nakashima
Opt. Eng. 17(2), 172139 (1 April 1978) doi:10.1117/12.7972199
TOPICS: Pollution, Luminescence, Systems modeling, Laser systems engineering, Laser induced fluorescence, Pollution detection
Joseph Berry, Frederick Heimes, James Smith
Opt. Eng. 17(2), 172143 (1 April 1978) doi:10.1117/12.7972200
TOPICS: Optical filters, Cameras, Reflectivity, Radiometry, Sensors, Electroluminescence, Silicon, Glasses, Signal detection, Interference filters
Yoichi Fujii, Tatsuro Masamura
Opt. Eng. 17(2), 172147 (1 April 1978) doi:10.1117/12.7972201
TOPICS: Dye lasers, Spectroscopy, Gases, Pollution detection, Atmospheric sensing, Spectroscopic atmospheric monitoring techniques, Absorption, Spectral calibration, Calibration, Sodium
C. Bressel, S. Wisotsky, W. Vander Velde
Opt. Eng. 17(2), 172153 (1 April 1978) doi:10.1117/12.7972202
TOPICS: Fourier transforms, Raman spectroscopy, Luminescence, LIDAR, Convolution, Raman scattering, Scattering
James Breckinridge
Opt. Eng. 17(2), 172156 (1 April 1978) doi:10.1117/12.7972203
TOPICS: Interferometers, Photography, Image intensifiers, Astronomical telescopes
D. Decker, J. Bennett, M. Soileau, J. Porteus, H. Bennett
Opt. Eng. 17(2), 172160 (1 April 1978) doi:10.1117/12.7972204
TOPICS: Mirrors, Optics manufacturing, Metals, Absorption, Laser damage threshold, Optical properties, Light scattering, Surface finishing, Laser applications, Laser induced damage
Robert Marks II, Steven Bell
Opt. Eng. 17(2), 172167 (1 April 1978) doi:10.1117/12.7972205
TOPICS: Optical signal processing, Mathematics
Malvin Teich
Opt. Eng. 17(2), 172170 (1 April 1978) doi:10.1117/12.7972206
TOPICS: Heterodyning, Radiometry, Signal detection, Oscillators, Doppler effect, Minerals, Receivers, Sensors, Microwave radiation, Radio optics
K. Hipps, G. Crosby
Opt. Eng. 17(2), 172176 (1 April 1978) doi:10.1117/12.7972207
TOPICS: Polarization, Spectroscopy, Photoelastic modulators, Superconductors, Polymethylmethacrylate, Temperature metrology
A. Zaghloul, R. Azzam, N. Bashara
Opt. Eng. 17(2), 172180 (1 April 1978) doi:10.1117/12.7972208
TOPICS: Wave plates, Mercury, Reflection
Joseph Geary
Opt. Eng. 17(2), 172185 (1 April 1978) doi:10.1117/12.7972209
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