Optical Engineering
VOL. 17 · NO. 2 | April 1978
CONTENTS
IN THIS ISSUE

Journal Articles
Opt. Eng. 17(2), 170218 (1 April 1978) https://doi.org/10.1117/12.7972210
TOPICS: Gases, LIDAR
Opt. Eng. 17(2), 170228 (1 April 1978) https://doi.org/10.1117/12.7972211
TOPICS: Signal to noise ratio, Forward looking infrared, Infrared sensors, Sensors, Interference (communication), Detector arrays
Opt. Eng. 17(2), 172107 (1 April 1978) https://doi.org/10.1117/12.7972192
TOPICS: Laser engineering, Semiconductors
Opt. Eng. 17(2), 172108 (1 April 1978) https://doi.org/10.1117/12.7972193
TOPICS: Infrared imaging, Imaging systems, Upconversion, Infrared radiation, Visible radiation, Nonlinear crystals, Photonic crystals, Ultraviolet radiation, Crystals, Photodetectors
Opt. Eng. 17(2), 172114 (1 April 1978) https://doi.org/10.1117/12.7972194
TOPICS: Waveguides, Optical fibers, Optical fiber cables, Connectors, Telecommunications, Tolerancing, Optical design, Optics manufacturing
Opt. Eng. 17(2), 172120 (1 April 1978) https://doi.org/10.1117/12.7972195
TOPICS: Crystals, Nd:YAG lasers, Second-harmonic generation, Refraction, Diffraction, Birefringence, Phase matching
Opt. Eng. 17(2), 172125 (1 April 1978) https://doi.org/10.1117/12.7972196
TOPICS: Helium neon lasers, Manufacturing, Yield improvement, Performance modeling
Opt. Eng. 17(2), 172129 (1 April 1978) https://doi.org/10.1117/12.7972197
TOPICS: Scattering, Bacteria, Mie scattering, Rayleigh scattering, Particles, Scatter measurement, Latex, Optical spheres, Refractive index
Opt. Eng. 17(2), 172135 (1 April 1978) https://doi.org/10.1117/12.7972198
TOPICS: X-rays, Calibration, Diagnostics
Opt. Eng. 17(2), 172139 (1 April 1978) https://doi.org/10.1117/12.7972199
TOPICS: Pollution, Luminescence, Systems modeling, Laser systems engineering, Laser induced fluorescence, Pollution detection
Opt. Eng. 17(2), 172143 (1 April 1978) https://doi.org/10.1117/12.7972200
TOPICS: Optical filters, Cameras, Reflectivity, Radiometry, Sensors, Electroluminescence, Silicon, Glasses, Signal detection, Interference filters
Opt. Eng. 17(2), 172147 (1 April 1978) https://doi.org/10.1117/12.7972201
TOPICS: Dye lasers, Spectroscopy, Gases, Pollution detection, Atmospheric sensing, Spectroscopic atmospheric monitoring techniques, Absorption, Spectral calibration, Calibration, Sodium
Opt. Eng. 17(2), 172153 (1 April 1978) https://doi.org/10.1117/12.7972202
TOPICS: Fourier transforms, Raman spectroscopy, Luminescence, LIDAR, Convolution, Raman scattering, Scattering
Opt. Eng. 17(2), 172156 (1 April 1978) https://doi.org/10.1117/12.7972203
TOPICS: Interferometers, Photography, Image intensifiers, Astronomical telescopes
Opt. Eng. 17(2), 172160 (1 April 1978) https://doi.org/10.1117/12.7972204
TOPICS: Mirrors, Optics manufacturing, Metals, Absorption, Laser damage threshold, Optical properties, Light scattering, Surface finishing, Laser applications, Laser induced damage
Opt. Eng. 17(2), 172167 (1 April 1978) https://doi.org/10.1117/12.7972205
TOPICS: Optical signal processing, Mathematics
Opt. Eng. 17(2), 172170 (1 April 1978) https://doi.org/10.1117/12.7972206
TOPICS: Heterodyning, Radiometry, Signal detection, Oscillators, Doppler effect, Minerals, Receivers, Sensors, Microwave radiation, Radio optics
Opt. Eng. 17(2), 172176 (1 April 1978) https://doi.org/10.1117/12.7972207
TOPICS: Polarization, Spectroscopy, Photoelastic modulators, Superconductors, Polymethylmethacrylate, Temperature metrology
Opt. Eng. 17(2), 172180 (1 April 1978) https://doi.org/10.1117/12.7972208
TOPICS: Wave plates, Mercury, Reflection
Opt. Eng. 17(2), 172185 (1 April 1978) https://doi.org/10.1117/12.7972209
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