optical engineering
VOL. 17 · NO. 5 | October 1978
CONTENTS
IN THIS ISSUE

Journal Articles
R. Johnson
Opt. Eng. 17(5), 170594 (1 October 1978) doi:10.1117/12.7972279
TOPICS: Sensors, Sensor performance, Surveillance systems, Optical filters
Roy Potter
Opt. Eng. 17(5), 175445 (1 October 1978) doi:10.1117/12.7972263
TOPICS: Optical properties, Electronics, Laser optics, Quantum optics, Electro optics, Optoelectronics, Laser applications
Allen Bloom, R. Bartolini, H. Weakliem
Opt. Eng. 17(5), 175446 (1 October 1978) doi:10.1117/12.7972264
TOPICS: Organic materials, Optical components, Volume holography, Holography, Integrated optics, Optical properties, Interferometry, Absorption, Emission spectroscopy, Light emitting diodes
Albert Feldman
Opt. Eng. 17(5), 175453 (1 October 1978) doi:10.1117/12.7972265
TOPICS: Photoelasticity, Acousto-optics, Refractive index, Distortion, High power lasers, Computing systems, Laser systems engineering, Interferometry, Polarimetry, Laser scattering
M. Weber, D. Milam, W. Smith
Opt. Eng. 17(5), 175463 (1 October 1978) doi:10.1117/12.7972266
TOPICS: Refractive index, Glasses, Crystals, Nonlinear crystals, Laser beam propagation, Dielectrics, High power lasers, Laser systems engineering, Anisotropy, Interferometry
A. Glass
Opt. Eng. 17(5), 175470 (1 October 1978) doi:10.1117/12.7972267
TOPICS: Photorefraction, Refractive index, Electro optics, Crystals, Optical recording, Silver, Optical storage, Holographic interferometry, Integrated optics
H. Bennett
Opt. Eng. 17(5), 175480 (1 October 1978) doi:10.1117/12.7972268
TOPICS: Light scattering, Scattering, Surface finishing, Laser scattering, Light, Optical components, Visible radiation, Ultraviolet radiation, Polishing, Infrared radiation
W. Smith
Opt. Eng. 17(5), 175489 (1 October 1978) doi:10.1117/12.7972269
TOPICS: Laser induced damage, Failure analysis, Ionization, Solids, Metals, Liquids, Gases, Absorption
Victor Rehn, Vernon Jones
Opt. Eng. 17(5), 175504 (1 October 1978) doi:10.1117/12.7972270
TOPICS: Mirrors, Vacuum ultraviolet, X-rays, Synchrotron radiation, Light scattering, Laser scattering, Scattering, Scatter measurement, Thermography
E. Palik, R. Holm
Opt. Eng. 17(5), 175512 (1 October 1978) doi:10.1117/12.7972271
TOPICS: Thin films, Prisms, Spectroscopy, Infrared spectroscopy, Infrared radiation, Electromagnetic radiation, Refractive index, Absorption, Opacity, Molecules
Marvin Hass
Opt. Eng. 17(5), 175525 (1 October 1978) doi:10.1117/12.7972272
TOPICS: Absorption, Calorimetry, Crystals, Glasses
N. Bottka
Opt. Eng. 17(5), 175530 (1 October 1978) doi:10.1117/12.7972273
TOPICS: Electro optical systems, Modulators, Sensors
William Egbert
Opt. Eng. 17(5), 175539 (1 October 1978) doi:10.1117/12.7972274
TOPICS: Light scattering, Thermography, Thermodynamics, Technetium, Surface plasmons, Absorbance, Magnetism, Dye lasers, Modulators, Optical amplifiers
S. Jacobs
Opt. Eng. 17(5), 175544 (1 October 1978) doi:10.1117/12.7972275
TOPICS: Switching, Motion measurement
Lenwood Clark, John DiBattista
Opt. Eng. 17(5), 175547 (1 October 1978) doi:10.1117/12.7972276
TOPICS: Electro optical systems, Astronomical imaging, Aerospace engineering, Optical components, Space operations
John McIntyre
Opt. Eng. 17(5), 175553 (1 October 1978) doi:10.1117/12.7972277
TOPICS: Gamma radiation, Cameras, Tomography, Nuclear medicine, Stereoscopy
B. Hildebrand, E. Allen
Opt. Eng. 17(5), 175561 (1 October 1978) doi:10.1117/12.7972278
TOPICS: Ruby lasers, Laser development
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