Optical Engineering
VOL. 18 · NO. 1 | February 1979

Journal Articles
Opt. Eng. 18(1), 180102 (1 February 1979) https://doi.org/10.1117/12.7972328
TOPICS: Optical design, Optical engineering, Optical fabrication, Plastic lenses, Manufacturing, Optical tolerancing, Glasses
Opt. Eng. 18(1), 180105 (1 February 1979) https://doi.org/10.1117/12.7972311
TOPICS: Reflectometry, Fiber optics, Fiber characterization, Polarization, Photodetectors, Temporal resolution
Opt. Eng. 18(1), 180109 (1 February 1979) https://doi.org/10.1117/12.7972312
TOPICS: Fiber optics sensors, Signal detection, Signal processing, Fiber optics, Sensors, Phase shift keying, Single mode fibers, Waveguides, Interferometers, Modulation
Opt. Eng. 18(1), 180114 (1 February 1979) https://doi.org/10.1117/12.7972313
TOPICS: Channel waveguides, Integrated optics, Optical communications, Channel projecting optics, Sensors, Charge-coupled devices, Optoelectronics, Silicon, Optoelectronic devices, Optical signal processing
Opt. Eng. 18(1), 180120 (1 February 1979) https://doi.org/10.1117/12.7972314
TOPICS: Fiber lasers, Heterojunctions, Fiber optics, Laser applications, Laser optics, Laser development, Reliability, Laser systems engineering
Opt. Eng. 18(1), 180125 (1 February 1979) https://doi.org/10.1117/12.7972315
TOPICS: Detection and tracking algorithms, Video, Pattern recognition, Image processing, Data processing, Missiles
Opt. Eng. 18(1), 180133 (1 February 1979) https://doi.org/10.1117/12.7972316
TOPICS: Visualization, Signal detection, Detection theory, Visual optics, Eye, Telescopes, Modulation transfer functions
Opt. Eng. 18(1), 180139 (1 February 1979) https://doi.org/10.1117/12.7972317
TOPICS: Computer simulations, Analog electronics, Wavefronts, Electronic components, CRTs
Opt. Eng. 18(1), 180146 (1 February 1979) https://doi.org/10.1117/12.7972318
TOPICS: Signal detection, Phase interferometry, Interferometry, Servomechanisms, Phase shift keying, Signal processing, Fringe analysis, Wavefronts, Interferometers, Mirrors
Opt. Eng. 18(1), 180153 (1 February 1979) https://doi.org/10.1117/12.7972319
TOPICS: Acoustics, Electron beam lithography, Lithography, Bandpass filters, Pulse filters, Interfaces, Electron beams, Interferometers, X-ray lithography, Photomasks
Opt. Eng. 18(1), 180159 (1 February 1979) https://doi.org/10.1117/12.7972320
TOPICS: Photoresist developing, Capacitance, Photoresist materials, Etching, Capacitors, Composites, Analog electronics
Opt. Eng. 18(1), 180163 (1 February 1979) https://doi.org/10.1117/12.7972321
TOPICS: Profilometers, Image sensors, Sensors, Calibration
Opt. Eng. 18(1), 180167 (1 February 1979) https://doi.org/10.1117/12.7972322
TOPICS: Extreme ultraviolet, Ultraviolet telescopes, Telescopes, Grazing incidence
Opt. Eng. 18(1), 180170 (1 February 1979) https://doi.org/10.1117/12.7972323
TOPICS: Ronchi rulings, Gaussian beams, Optical testing
Opt. Eng. 18(1), 180176 (1 February 1979) https://doi.org/10.1117/12.7972324
TOPICS: Image segmentation, Image processing, Image processing algorithms and systems
Opt. Eng. 18(1), 180179 (1 February 1979) https://doi.org/10.1117/12.7972325
TOPICS: Gaussian beams, Optical resolution, Optical components, Detector arrays
Opt. Eng. 18(1), 180182 (1 February 1979) https://doi.org/10.1117/12.7972326
TOPICS: Electro optics, Satellites, Electro optical systems, Sensors, Surveillance, Missiles, Electro optical modeling, Space operations
Opt. Eng. 18(1), 180192 (1 February 1979) https://doi.org/10.1117/12.7972327
TOPICS: Vacuum ultraviolet, Optical coatings, Ultraviolet radiation, Reflectivity, Laser applications, Reflectors, Multilayers, Laser welding, Photochemistry, Analytical research
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