optical engineering
VOL. 18 · NO. 2 | April 1979
CONTENTS
IN THIS ISSUE

Journal Articles
Curt Deckert
Opt. Eng. 18(2), 180232 (1 April 1979) doi:10.1117/12.7972357
TOPICS: Patents
Harold Bennett, Eugene Church
Opt. Eng. 18(2), 182103 (1 April 1979) doi:10.1117/12.7972334
TOPICS: Stray light, Light scattering, Electro-optical engineering, Light, Computer simulations, Data modeling, Scattering
C. Carniglia
Opt. Eng. 18(2), 182104 (1 April 1979) doi:10.1117/12.7972335
TOPICS: Multilayers, Scattering, Electromagnetic scattering theory, Optical coatings, Surface roughness, Refractive index, Reflectivity, Transmittance
J. Elson, J. Bennett
Opt. Eng. 18(2), 182116 (1 April 1979) doi:10.1117/12.7972336
TOPICS: Surface plasmons, Electromagnetic scattering theory, Scattering, Surface roughness, Light scattering, Dielectrics, Reflectivity, Absorption
E. Church, H. Jenkinson, J. Zavada
Opt. Eng. 18(2), 182125 (1 April 1979) doi:10.1117/12.7972337
TOPICS: Scattering, Surface roughness, Surface finishing, Light scattering, Electromagnetic scattering theory
Robert Noll
Opt. Eng. 18(2), 182137 (1 April 1979) doi:10.1117/12.7972338
TOPICS: Optics manufacturing, Aspheric lenses, Wavefronts, Spatial frequencies, Optical design, Point spread functions, Electro-optical engineering, Optical spheres, Optical components, VHF band
W. Barnes, Jr., R. McDonough
Opt. Eng. 18(2), 182143 (1 April 1979) doi:10.1117/12.7972339
TOPICS: Surface finishing, Aspheric optics, Polishing, Silica
D. Stierwalt
Opt. Eng. 18(2), 182147 (1 April 1979) doi:10.1117/12.7972340
TOPICS: Absorption, Infrared radiation, Infrared imaging, Temperature metrology, Stray light, Metals
Vernon Williams, Richard Lockie
Opt. Eng. 18(2), 182152 (1 April 1979) doi:10.1117/12.7972341
TOPICS: Bidirectional reflectance transmission function, Mirrors, Contamination, Light scattering, Coating
P. Kellen, M. Smith
Opt. Eng. 18(2), 182157 (1 April 1979) doi:10.1117/12.7972342
TOPICS: Resonators, Confocal microscopy, Gas lasers
James Trolinger, Gerald Simpson
Opt. Eng. 18(2), 182161 (1 April 1979) doi:10.1117/12.7972343
TOPICS: Turbulence, Diagnostics, Holography, Holographic interferometry, Wavefronts, Heterodyning, Interferometry
Thomas George
Opt. Eng. 18(2), 182167 (1 April 1979) doi:10.1117/12.7972344
TOPICS: Chemistry, Laser applications, Molecular spectroscopy, Spectroscopy, Molecular interactions, Laser development
Daniel Novak
Opt. Eng. 18(2), 182173 (1 April 1979) doi:10.1117/12.7972345
TOPICS: Photography, Light sources, Information visualization, Cameras, High speed photography, Ruby lasers, Light, Visualization, Aerodynamics
M. Murty, R. Shukla
Opt. Eng. 18(2), 182177 (1 April 1979) doi:10.1117/12.7972346
TOPICS: Refractive index, Liquids, Light, Helium neon lasers
Terence Donohue
Opt. Eng. 18(2), 182181 (1 April 1979) doi:10.1117/12.7972347
TOPICS: Europium, Lanthanides, Liquids, Cerium, Oxidation
John Workum, James Plascyk, Michael Skolnick
Opt. Eng. 18(2), 182187 (1 April 1979) doi:10.1117/12.7972348
TOPICS: Wavefronts, Carbon dioxide lasers, Calibration, Phase measurement, Optical components, Interferometers, Optical testing, Weapons, Carbon dioxide, Gas lasers
E. Garmire, S. Allen, J. Marburger
Opt. Eng. 18(2), 182194 (1 April 1979) doi:10.1117/12.7972349
TOPICS: Optical components, Integrated optics, Fiber optics, Fabry–Perot interferometry
Poohsan Tamura, James Wyant
Opt. Eng. 18(2), 182198 (1 April 1979) doi:10.1117/12.7972350
TOPICS: Matrix multiplication, Matrices, Transmittance, Transparency, Holograms
Robert Crane, Jr.
Opt. Eng. 18(2), 182205 (1 April 1979) doi:10.1117/12.7972351
TOPICS: Interferometers, Holograms, Fringe analysis
Robert Crane, Jr.
Opt. Eng. 18(2), 182212 (1 April 1979) doi:10.1117/12.7972352
TOPICS: Fabry–Perot interferometers, Receivers, Interferometers, Modulators, Fabry–Perot interferometry, Logic, Pulsed laser operation
F. Dickey, J. White, J. Crill
Opt. Eng. 18(2), 182218 (1 April 1979) doi:10.1117/12.7972353
TOPICS: Photography, Halftones, Optical signal processing, Optical filters, Optimal filtering
Takeo Sawatari, Richard Zipin
Opt. Eng. 18(2), 182222 (1 April 1979) doi:10.1117/12.7972354
TOPICS: Transducers, Optical testing, Microscopes, Fiber optic illuminators, Photodetectors, Diamond
Roland Shack, George Hopkins
Opt. Eng. 18(2), 182226 (1 April 1979) doi:10.1117/12.7972355
TOPICS: Interferometers, Optical components, Optical alignment
Sadao Nakajima, Yoshio Maruyama, Kyoko Kosasa
Opt. Eng. 18(2), 182229 (1 April 1979) doi:10.1117/12.7972356
TOPICS: Continuous wave operation, Power meters, High power lasers, Carbon dioxide lasers, Temperature metrology, Aluminum, Absorption
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