Relationship between Surface Scattering and Microtopographic Features

E. L. Church; H. A. Jenkinson; J. M. Zavada

doi:10.1117/12.7972337

1 April 1979 Relationship between Surface Scattering and Microtopographic Features

E. L. Church, H. A. Jenkinson, J. M. Zavada

Author Affiliations +

Optical Engineering, Vol. 18, Issue 2, 182125 (April 1979). https://doi.org/10.1117/12.7972337

Abstract

In the smooth-surface limit, the angular distribution of the light scattered from a surface maps the power spectral density of its residual surface roughness. This result is essentially independent of the scattering theory used and the statistical properties of the surface roughness. The power spectral densities of engineering surfaces are generally broad and increase with increasing spatial wavelength. As a result, practical surface finish parameters are not intrinsic properties of the surface, but depend, with varying degrees of sensitivity, on the bandwidth limits inherent in their measurement or dictated by their application. These issues are discussed with reference to two classes of finish parameters: those related to the central moments of the scattering spectrum, and those related to the coefficients in the expansion of the shape of the spectrum in inverse powers of the scattering angle. The significance of "1/02" scattering in this context is emphasized. A shot model of surface roughness is then introduced to gain further insight into the relationship between scattering and surface features. In this model inverse power terms are related to "edge" scattering effects from critical points in various types of elemental microdefects. The relationship between this view and electronic noise is pointed out; in particular, the correspondence between "1/02" scattering and "1/f" or flicker-noise phenomena.

Citation Download Citation

E. L. Church, H. A. Jenkinson, and J. M. Zavada "Relationship between Surface Scattering and Microtopographic Features," Optical Engineering 18(2), 182125 (1 April 1979). https://doi.org/10.1117/12.7972337

Published: 1 April 1979

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available