optical engineering
VOL. 18 · NO. 5 | October 1979
CONTENTS
IN THIS ISSUE

Journal Articles
H. Caulfield
Opt. Eng. 18(5), 185120 (1 October 1979) doi:10.1117/12.7972428
TOPICS: Optical engineering, Electro-optical engineering
H. Caulfield
Opt. Eng. 18(5), 185447 (1 October 1979) doi:10.1117/12.7972408
TOPICS: Optical metrology, Process control
F. Chiang
Opt. Eng. 18(5), 185448 (1 October 1979) doi:10.1117/12.7972409
TOPICS: Moire patterns, Stress analysis, Fringe analysis, Speckle
F. Chiang, B. Parker, D. Oplinger, J. Slepetz
Opt. Eng. 18(5), 185456 (1 October 1979) doi:10.1117/12.7972410
TOPICS: Moire patterns
Robert Moore
Opt. Eng. 18(5), 185461 (1 October 1979) doi:10.1117/12.7972411
TOPICS: Error analysis, Interferometers, Wavefront analysis, Wavefronts, Interferometry, Optical alignment, Precision optics, Glasses, Distortion, Monochromatic aberrations
F. Mottier
Opt. Eng. 18(5), 185464 (1 October 1979) doi:10.1117/12.7972412
TOPICS: Interferometers, Heterodyning, Interferometry, Visualization, Photography, Diagnostics, Adaptive optics, Deformable mirrors, Mirrors
D. Tichenor, V. Madsen
Opt. Eng. 18(5), 185469 (1 October 1979) doi:10.1117/12.7972413
TOPICS: Holography, Nondestructive evaluation, Analytical research, Televisions, Cameras
James Waters
Opt. Eng. 18(5), 185473 (1 October 1979) doi:10.1117/12.7972414
TOPICS: Photodetectors, Head, Optical tracking, Signal generators, Motion measurement, Computer programming, Dynamical systems
Robert Zielinski
Opt. Eng. 18(5), 185479 (1 October 1979) doi:10.1117/12.7972415
TOPICS: Interferometers, Optical testing, Optical components
H. Caulfield, David Kryger
Opt. Eng. 18(5), 185483 (1 October 1979) doi:10.1117/12.7972416
TOPICS: Metrology
Philip Considine,, Thomas Lianza, Bruce Radl
Opt. Eng. 18(5), 185486 (1 October 1979) doi:10.1117/12.7972417
TOPICS: Transparency, Electro optics, Diodes, Sensors, Zoom lenses, Optical design, Projection systems
George Saridis, C. Lee
Opt. Eng. 18(5), 185492 (1 October 1979) doi:10.1117/12.7972418
TOPICS: Visualization, Evolutionary algorithms, Algorithm development, Detection and tracking algorithms, Algorithms, Artificial intelligence, Control systems, Feedback control, Visual process modeling, Object recognition
Harvey Kasdan
Opt. Eng. 18(5), 185496 (1 October 1979) doi:10.1117/12.7972419
TOPICS: Diffraction, Transparency, Image analysis, Systems modeling, Video
Satoru Tanaka
Opt. Eng. 18(5), 185504 (1 October 1979) doi:10.1117/12.7972420
TOPICS: Modulation transfer functions, Charge-coupled devices, Imaging arrays
Ravindra Athale, Sing Lee
Opt. Eng. 18(5), 185513 (1 October 1979) doi:10.1117/12.7972421
TOPICS: Logic devices, Digital electronics, Digital electronic circuits, Optical circuits, Digital optical processing, Binary data, Photoresistors, Electro optics, Modulation, Logic
James Leger, Sing Lee
Opt. Eng. 18(5), 185518 (1 October 1979) doi:10.1117/12.7972422
TOPICS: Optical correlators, Optical filters, Spatial filters, Holography, Laser scanners, 3D scanning, Signal to noise ratio
Kendall Carder
Opt. Eng. 18(5), 185524 (1 October 1979) doi:10.1117/12.7972423
TOPICS: Particles, Holography, Holograms, Glasses, Helium neon lasers, In situ metrology
M. Murty, R. Shukla
Opt. Eng. 18(5), 185526 (1 October 1979) doi:10.1117/12.7972424
TOPICS: Glasses
J. Fienup
Opt. Eng. 18(5), 185529 (1 October 1979) doi:10.1117/12.7972425
TOPICS: Interferometers, Space telescopes, Telescopes, Atmospheric optics, Diffraction, Speckle, Space operations, Image processing, Fourier transforms, Iterative methods
B. Capone, L. Skolnik, R. Taylor, F. Shepherd, S. Roosild, W. Ewing, W. Kosonocky, E. Kohn
Opt. Eng. 18(5), 185535 (1 October 1979) doi:10.1117/12.7972426
TOPICS: Thermography, Charge-coupled devices, Infrared radiation, Sensors, Infrared imaging, Infrared sensors, Integrated circuits, Silicon, Photodiodes, Amplifiers
L. Barr
Opt. Eng. 18(5), 185542 (1 October 1979) doi:10.1117/12.7972427
TOPICS: Telescopes, Astronomical telescopes, Optical telescopes, Large telescopes, Sensors, Diffraction gratings, Reflectivity, Mirrors, Optical coatings, Computing systems
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