optical engineering
VOL. 19 · NO. 4 | August 1980
CONTENTS
IN THIS ISSUE

Journal Articles
Stuart Collins, Jr., Kenneth Wasmundt
Opt. Eng. 19(4), (1 August 1980) https://doi.org/10.1117/12.7972546
TOPICS: Bistability, Magnetism, Chemical species, Optical resonators, Mirrors, Fabry–Perot interferometers, Modulators, Optical components, Image processing, Resonators
G . Hernandez
Opt. Eng. 19(4), (1 August 1980) https://doi.org/10.1117/12.7972553
TOPICS: Temperature metrology, Fabry–Perot interferometers, Thermosphere, Spectrometers, Wind measurement, Observatories, Mirrors, Satellites, Spectroscopy, Reflectivity
H. Caulfield
Opt. Eng. 19(4), 194106 (1 August 1980) https://doi.org/10.1117/12.7972540
TOPICS: Optical engineering
Stuart Collins, Jr.
Opt. Eng. 19(4), 194441 (1 August 1980) https://doi.org/10.1117/12.7972541
TOPICS: Partial differential equations, Binary data, Logic devices
G. Ferrano, G. Hausler
Opt. Eng. 19(4), 194442 (1 August 1980) https://doi.org/10.1117/12.7972542
TOPICS: Analog electronics, Optical amplifiers
Ulrich Gerlach, Uday Sengupta, Stuart Collins, Jr.
Opt. Eng. 19(4), 194452 (1 August 1980) https://doi.org/10.1117/12.7972543
TOPICS: Spatial light modulators, Modulators, Optical matrix switches, Switching, Feedback loops
Joseph Pierluissi, Glenn Gibson, J. Hall
Opt. Eng. 19(4), 194453 (1 August 1980) https://doi.org/10.1117/12.7972555
TOPICS: Transmittance, Meteorology, Molecular lasers, Absorption
H. Gibbs, S. McCall, T. Venkatesan
Opt. Eng. 19(4), 194463 (1 August 1980) https://doi.org/10.1117/12.7972544
TOPICS: Switching, Bistability, Semiconductors, Optical logic, Logic devices, Temperature metrology
J. Farina, L. Narducci, J. Yuan, L. Lugiato
Opt. Eng. 19(4), 194469 (1 August 1980) https://doi.org/10.1117/12.7972545
Tomas Hirschfeld
Opt. Eng. 19(4), 194488 (1 August 1980) https://doi.org/10.1117/12.7972547
TOPICS: Atmospheric optics, Instrumentation engineering, Optical engineering
V. Abreu
Opt. Eng. 19(4), 194489 (1 August 1980) https://doi.org/10.1117/12.7972548
TOPICS: LIDAR
T. Mcllrath
Opt. Eng. 19(4), 194494 (1 August 1980) https://doi.org/10.1117/12.7972549
TOPICS: LIDAR, Luminescence, Stratosphere, Active remote sensing, Atmospheric laser remote sensing, Atmospheric monitoring, Atmospheric sensing, Fluorescence spectroscopy, Chemical species, Molecules
Richard Stewart, Jack Bufton
Opt. Eng. 19(4), 194503 (1 August 1980) https://doi.org/10.1117/12.7972550
TOPICS: LIDAR, Absorption, Carbon dioxide lasers, Receivers, Troposphere, Ozone
William Herget, James Brasher
Opt. Eng. 19(4), 194508 (1 August 1980) https://doi.org/10.1117/12.7972551
TOPICS: FT-IR spectroscopy, Air contamination, Interferometers, Absorption, Gases, Fourier transforms, Infrared imaging, Infrared radiation, Spectral resolution, Pollution detection
Doran Baker
Opt. Eng. 19(4), 194515 (1 August 1980) https://doi.org/10.1117/12.7972552
TOPICS: Environmental sensing, Interferometers, Pollution control, Remote sensing, Optical sensing, Michelson interferometers, Spectral resolution
James Bilbro
Opt. Eng. 19(4), 194533 (1 August 1980) https://doi.org/10.1117/12.7972554
TOPICS: Laser Doppler velocimetry, Wind measurement, Doppler effect, Associative arrays, Satellites, Carbon dioxide, Pulsed laser operation
U. Gronemann, A. Bar-Lev
Opt. Eng. 19(4), 194546 (1 August 1980) https://doi.org/10.1117/12.7972556
TOPICS: Argon ion lasers, Graphic arts, Color image processing, Lithography, Binary data, Printing, Cartography, Satellites, Digital recording
M. Lind, J. Hartman, H. Hampton
Opt. Eng. 19(4), 194551 (1 August 1980) https://doi.org/10.1117/12.7972557
TOPICS: Photovoltaic materials, Fourier transforms, Glasses, Image analysis, Sensors
Robert Reedy
Opt. Eng. 19(4), 194556 (1 August 1980) https://doi.org/10.1117/12.7972558
TOPICS: Fiber optics tests, Data modeling, Optics manufacturing, Image transmission, Electro optical modeling, Electro optics, Electro optical systems, Fiber optics, Optical testing, Modulation transfer functions
Thomas Bulpitt, Richard Walker
Opt. Eng. 19(4), 194561 (1 August 1980) https://doi.org/10.1117/12.7972559
TOPICS: Photometry, Objectives, Scanners, Polarization
Leonard Snyder
Opt. Eng. 19(4), 194566 (1 August 1980) https://doi.org/10.1117/12.7972560
TOPICS: Televisions, Jupiter, Saturn, Space operations, Photography
Jae Lim
Opt. Eng. 19(4), 194577 (1 August 1980) https://doi.org/10.1117/12.7972561
TOPICS: Quantization, Modulation, Image compression, Denoising, Interference (communication), Transform theory
James Merz
Opt. Eng. 19(4), 194581 (1 August 1980) https://doi.org/10.1117/12.7972562
TOPICS: Heterojunctions, Integrated optics, Photonic integrated circuits, Optical circuits, Wet etching, Optical fibers, Gallium arsenide
N. Papanicolaou, H. Lin, H. Benz
Opt. Eng. 19(4), 194587 (1 August 1980) https://doi.org/10.1117/12.7972563
TOPICS: Acoustics, Silicon, Charge-coupled devices, Zinc oxide, Silica, Silicon films, Sputter deposition, Transducers, Interfaces, Sensors
Richard Claus
Opt. Eng. 19(4), 194590 (1 August 1980) https://doi.org/10.1117/12.7972564
TOPICS: Interferometry, Interfaces, Acousto-optics, Ultrasonics, Solids, Laser beam diagnostics, Particles, Acoustics, Glasses
J. Leader
Opt. Eng. 19(4), 194593 (1 August 1980) https://doi.org/10.1117/12.7972565
TOPICS: Laser scattering, Scattering
R. Catura, W. Brown, L. Acton
Opt. Eng. 19(4), 194602 (1 August 1980) https://doi.org/10.1117/12.7972566
TOPICS: X-ray optics, X-ray telescopes, Optical design, X-ray astronomy, X-rays, Astronomy, Observatories, Grazing incidence, Diamond turning, Ray tracing
H. Bennett
Opt. Eng. 19(4), 194610 (1 August 1980) https://doi.org/10.1117/12.7972567
TOPICS: X-ray optics, Surface finishing, Optical testing, Quality testing methods
H. Hughes, J. Richter
Opt. Eng. 19(4), 194616 (1 August 1980) https://doi.org/10.1117/12.7972568
TOPICS: Aerosols, Atmospheric modeling, Coastal modeling, Oceanography, Environmental sensing, Ocean optics, Humidity, Mass attenuation coefficient
M. Murty, R. Shukla
Opt. Eng. 19(4), 194621 (1 August 1980) https://doi.org/10.1117/12.7972569
TOPICS: Prisms, Reflection, Reflectivity, Argon ion lasers
Roy Esplin
Opt. Eng. 19(4), 194623 (1 August 1980) https://doi.org/10.1117/12.7972570
TOPICS: Spectroscopy, Optical aberrations
Eric Rawson, M. Bailey
Opt. Eng. 19(4), 194628 (1 August 1980) https://doi.org/10.1117/12.7972571
TOPICS: Relays, Fiber optics, Computer networks, Reliability, Fiber optic networks, Prototyping
T. Healey
Opt. Eng. 19(4), 194630 (1 August 1980) https://doi.org/10.1117/12.7972572
TOPICS: Optical engineering, Diagnostics, Radiography, Nomenclature
Back to Top