Optical Engineering
VOL. 19 · NO. 6 | December 1980
CONTENTS
IN THIS ISSUE

Journal Articles
Opt. Eng. 19(6), 196174 (1 December 1980) https://doi.org/10.1117/12.7972611
Opt. Eng. 19(6), 196176 (1 December 1980) https://doi.org/10.1117/12.7972644
TOPICS: Infrared technology
Opt. Eng. 19(6), 196797 (1 December 1980) https://doi.org/10.1117/12.7972612
TOPICS: Interferometry, Interferometers, Optical engineering
Opt. Eng. 19(6), 196798 (1 December 1980) https://doi.org/10.1117/12.7972613
TOPICS: Liquids, Thin films
Opt. Eng. 19(6), 196801 (1 December 1980) https://doi.org/10.1117/12.7972614
TOPICS: Thin films, Interferometers, Refractive index, Absorption
Opt. Eng. 19(6), 196806 (1 December 1980) https://doi.org/10.1117/12.7972615
TOPICS: Moire patterns, Heterodyning, Interferometry, Wavefronts, Profiling, Phase measurement, Transparency, Spatial frequencies, Holograms
Opt. Eng. 19(6), 196810 (1 December 1980) https://doi.org/10.1117/12.7972616
TOPICS: Fizeau interferometers, Modulation, Laser scattering, Scattering, Laser damage threshold, Interferometry, Sensors, Signal detection
Opt. Eng. 19(6), 196815 (1 December 1980) https://doi.org/10.1117/12.7972617
TOPICS: Interferometry
Opt. Eng. 19(6), 196825 (1 December 1980) https://doi.org/10.1117/12.7972618
TOPICS: Interferometry, Laser interferometry, Laser welding, Laser systems engineering, Oscillators, Reflectivity, Optical spheres, Beam splitters, Interferometers, Picosecond phenomena
Opt. Eng. 19(6), 196828 (1 December 1980) https://doi.org/10.1117/12.7972619
TOPICS: Optical signal processing, Anisotropy, Photography, Polarizers
Opt. Eng. 19(6), 196834 (1 December 1980) https://doi.org/10.1117/12.7972620
TOPICS: Interferometry, Reflection, Interferometers, Mercury, Optical scanning systems, Optical testing, Fabry–Perot interferometers, Fabry–Perot interferometry, Calibration, Helium neon lasers
Opt. Eng. 19(6), 196843 (1 December 1980) https://doi.org/10.1117/12.7972621
TOPICS: Photography, Error analysis
Opt. Eng. 19(6), 196849 (1 December 1980) https://doi.org/10.1117/12.7972622
TOPICS: Holographic interferometry, Holography, Rectangular pulse, Interferometry
Opt. Eng. 19(6), 196853 (1 December 1980) https://doi.org/10.1117/12.7972623
TOPICS: Particles, Optical testing, Particle sizing
Opt. Eng. 19(6), 196854 (1 December 1980) https://doi.org/10.1117/12.7972624
TOPICS: Particles, Diagnostics, Integrated optics, Particle diagnostics, Photography, Holography
Opt. Eng. 19(6), 196861 (1 December 1980) https://doi.org/10.1117/12.7972625
TOPICS: Particles, Light scattering, Optical testing, Scatter measurement, Crystals, Process control, Minerals, Cements, Abrasives, Glasses
Opt. Eng. 19(6), 196870 (1 December 1980) https://doi.org/10.1117/12.7972626
TOPICS: Particles, Scattering, Latex, Calibration
Opt. Eng. 19(6), 196873 (1 December 1980) https://doi.org/10.1117/12.7972627
TOPICS: Particles, Diagnostics, Holography, Interferometry, Laser scattering, Light scattering, Holography applications, Combustion
Opt. Eng. 19(6), 196878 (1 December 1980) https://doi.org/10.1117/12.7972628
TOPICS: Reticles, Image fusion, Zoom lenses, Cameras, Relays, Sensors, Lenses, Helium neon lasers, Fiber optic illuminators, Laser welding
Opt. Eng. 19(6), 196883 (1 December 1980) https://doi.org/10.1117/12.7972629
TOPICS: Electro optical systems, Complex systems, Electro-optic testing, Electro optics, Missiles
Opt. Eng. 19(6), 196888 (1 December 1980) https://doi.org/10.1117/12.7972630
TOPICS: Thermography, Telescopes, Monochromatic aberrations, Control systems, Optical instrument design, Chromatic aberrations, Radiometry, Spherical lenses, Aspheric lenses
Opt. Eng. 19(6), 196894 (1 December 1980) https://doi.org/10.1117/12.7972631
TOPICS: Sensors, Modulation, Lead, Active sensors, Fabrication, Data centers
Opt. Eng. 19(6), 196901 (1 December 1980) https://doi.org/10.1117/12.7972632
TOPICS: Acousto-optics, Infrared radiation, Infrared materials, Crystals, Laser scanners, 3D scanning, LIDAR, Surveillance, Satellites, Tunable filters
Opt. Eng. 19(6), 196908 (1 December 1980) https://doi.org/10.1117/12.7972633
TOPICS: Moire patterns, Photography, Humidity, Cameras
Opt. Eng. 19(6), 196911 (1 December 1980) https://doi.org/10.1117/12.7972634
TOPICS: Beam splitters
Opt. Eng. 19(6), 196915 (1 December 1980) https://doi.org/10.1117/12.7972635
TOPICS: Combined lens-mirror systems, Spherical lenses, Visualization, Eye
Opt. Eng. 19(6), 196918 (1 December 1980) https://doi.org/10.1117/12.7972636
TOPICS: Monochromatic aberrations, Mirrors
Opt. Eng. 19(6), 196921 (1 December 1980) https://doi.org/10.1117/12.7972637
TOPICS: Sensors, Electro optics, Pattern recognition, Detection and tracking algorithms, Electro optical systems, Systems modeling, Electro optical modeling, Transmitters, Receivers
Opt. Eng. 19(6), 196926 (1 December 1980) https://doi.org/10.1117/12.7972638
TOPICS: X-rays, Reconstruction algorithms, X-ray sources, Detector arrays
Opt. Eng. 19(6), 196932 (1 December 1980) https://doi.org/10.1117/12.7972639
TOPICS: Cameras, Scintillation, Floods, Device simulation
Opt. Eng. 19(6), 196936 (1 December 1980) https://doi.org/10.1117/12.7972640
TOPICS: Image segmentation, Forward looking infrared
Opt. Eng. 19(6), 196941 (1 December 1980) https://doi.org/10.1117/12.7972641
TOPICS: Sensors, Optical signal processing, Waveguides, Semiconductor lasers, Pulsed laser operation, Laser sources, Diodes, Photodiodes, Modulation, Mode locking
Opt. Eng. 19(6), 196945 (1 December 1980) https://doi.org/10.1117/12.7972642
TOPICS: Spectroscopy, Laser spectroscopy, Tunable diode lasers, Semiconductor lasers, Calibration
Opt. Eng. 19(6), 196961 (1 December 1980) https://doi.org/10.1117/12.7972643
TOPICS: Beam splitters, Retroreflectors
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