optical engineering
VOL. 19 · NO. 6 | December 1980

Journal Articles
H. Caulfield
Opt. Eng. 19(6), 196174 (1 December 1980) https://doi.org/10.1117/12.7972611
Irving Spiro
Opt. Eng. 19(6), 196176 (1 December 1980) https://doi.org/10.1117/12.7972644
TOPICS: Infrared technology
George Hopkins, Chris Koliopoulos
Opt. Eng. 19(6), 196797 (1 December 1980) https://doi.org/10.1117/12.7972612
TOPICS: Interferometry, Interferometers, Optical engineering
L. Fisher, N. Parker, F. Sharpies
Opt. Eng. 19(6), 196798 (1 December 1980) https://doi.org/10.1117/12.7972613
TOPICS: Liquids, Thin films
Joseph Shamir
Opt. Eng. 19(6), 196801 (1 December 1980) https://doi.org/10.1117/12.7972614
TOPICS: Thin films, Interferometers, Refractive index, Absorption
R. Shagam
Opt. Eng. 19(6), 196806 (1 December 1980) https://doi.org/10.1117/12.7972615
TOPICS: Moire patterns, Heterodyning, Interferometry, Wavefronts, Profiling, Phase measurement, Transparency, Spatial frequencies, Holograms
J. Eastman
Opt. Eng. 19(6), 196810 (1 December 1980) https://doi.org/10.1117/12.7972616
TOPICS: Fizeau interferometers, Modulation, Laser scattering, Scattering, Laser damage threshold, Interferometry, Sensors, Signal detection
Lawrence Rubin
Opt. Eng. 19(6), 196815 (1 December 1980) https://doi.org/10.1117/12.7972617
TOPICS: Interferometry
John Hoose
Opt. Eng. 19(6), 196825 (1 December 1980) https://doi.org/10.1117/12.7972618
TOPICS: Interferometry, Laser interferometry, Laser welding, Laser systems engineering, Oscillators, Reflectivity, Optical spheres, Beam splitters, Interferometers, Picosecond phenomena
J. Jonathan, M. May
Opt. Eng. 19(6), 196828 (1 December 1980) https://doi.org/10.1117/12.7972619
TOPICS: Optical signal processing, Anisotropy, Photography, Polarizers
W. Clothier, G. Sloggett, H. Bairnsfather
Opt. Eng. 19(6), 196834 (1 December 1980) https://doi.org/10.1117/12.7972620
TOPICS: Interferometry, Reflection, Interferometers, Mercury, Optical scanning systems, Optical testing, Fabry–Perot interferometers, Fabry–Perot interferometry, Calibration, Helium neon lasers
Mark Gerchman, George Hunter
Opt. Eng. 19(6), 196843 (1 December 1980) https://doi.org/10.1117/12.7972621
TOPICS: Photography, Error analysis
Steven Gustafson
Opt. Eng. 19(6), 196849 (1 December 1980) https://doi.org/10.1117/12.7972622
TOPICS: Holographic interferometry, Holography, Rectangular pulse, Interferometry
James Trolinger
Opt. Eng. 19(6), 196853 (1 December 1980) https://doi.org/10.1117/12.7972623
TOPICS: Particles, Optical testing, Particle sizing
E. Hirleman
Opt. Eng. 19(6), 196854 (1 December 1980) https://doi.org/10.1117/12.7972624
TOPICS: Particles, Diagnostics, Integrated optics, Particle diagnostics, Photography, Holography
E. Muly, H. Frock
Opt. Eng. 19(6), 196861 (1 December 1980) https://doi.org/10.1117/12.7972625
TOPICS: Particles, Light scattering, Optical testing, Scatter measurement, Crystals, Process control, Minerals, Cements, Abrasives, Glasses
A. Lieberman
Opt. Eng. 19(6), 196870 (1 December 1980) https://doi.org/10.1117/12.7972626
TOPICS: Particles, Scattering, Latex, Calibration
M. Houser
Opt. Eng. 19(6), 196873 (1 December 1980) https://doi.org/10.1117/12.7972627
TOPICS: Particles, Diagnostics, Holography, Interferometry, Laser scattering, Light scattering, Holography applications, Combustion
J. Monjes, K. Manes, W. O'Neal, F. Rienecker
Opt. Eng. 19(6), 196878 (1 December 1980) https://doi.org/10.1117/12.7972628
TOPICS: Reticles, Image fusion, Zoom lenses, Cameras, Relays, Sensors, Lenses, Helium neon lasers, Fiber optic illuminators, Laser welding
William Waite
Opt. Eng. 19(6), 196883 (1 December 1980) https://doi.org/10.1117/12.7972629
TOPICS: Electro optical systems, Complex systems, Electro-optic testing, Electro optics, Missiles
Thomas Jamieson
Opt. Eng. 19(6), 196888 (1 December 1980) https://doi.org/10.1117/12.7972630
TOPICS: Thermography, Telescopes, Monochromatic aberrations, Control systems, Optical instrument design, Chromatic aberrations, Radiometry, Spherical lenses, Aspheric lenses
Dain Glad, James Lorenzo, Christopher Parry, James Merriam, R. Bentley, Robert Weber
Opt. Eng. 19(6), 196894 (1 December 1980) https://doi.org/10.1117/12.7972631
TOPICS: Sensors, Modulation, Lead, Active sensors, Fabrication, Data centers
M. Gottlieb, G. Roland
Opt. Eng. 19(6), 196901 (1 December 1980) https://doi.org/10.1117/12.7972632
TOPICS: Acousto-optics, Infrared radiation, Infrared materials, Crystals, Laser scanners, 3D scanning, LIDAR, Surveillance, Satellites, Tunable filters
Colin Forno
Opt. Eng. 19(6), 196908 (1 December 1980) https://doi.org/10.1117/12.7972633
TOPICS: Moire patterns, Photography, Humidity, Cameras
Dietrich Korsch, S. Hay
Opt. Eng. 19(6), 196911 (1 December 1980) https://doi.org/10.1117/12.7972634
TOPICS: Beam splitters
M. Murty, N. Das, R. Shukla
Opt. Eng. 19(6), 196915 (1 December 1980) https://doi.org/10.1117/12.7972635
TOPICS: Combined lens-mirror systems, Spherical lenses, Visualization, Eye
Joseph Geary
Opt. Eng. 19(6), 196918 (1 December 1980) https://doi.org/10.1117/12.7972636
TOPICS: Monochromatic aberrations, Mirrors
R. Kleehammer, A. Kleider
Opt. Eng. 19(6), 196921 (1 December 1980) https://doi.org/10.1117/12.7972637
TOPICS: Sensors, Electro optics, Pattern recognition, Detection and tracking algorithms, Electro optical systems, Systems modeling, Electro optical modeling, Transmitters, Receivers
Martin Altschuler, Tao Chang, Aloysius Chu
Opt. Eng. 19(6), 196926 (1 December 1980) https://doi.org/10.1117/12.7972638
TOPICS: X-rays, Reconstruction algorithms, X-ray sources, Detector arrays
Arthur Olch, L. Graham, J. Uszler, F. Holly
Opt. Eng. 19(6), 196932 (1 December 1980) https://doi.org/10.1117/12.7972639
TOPICS: Cameras, Scintillation, Floods, Device simulation
Erica Rounds, George Sutty
Opt. Eng. 19(6), 196936 (1 December 1980) https://doi.org/10.1117/12.7972640
TOPICS: Image segmentation, Forward looking infrared
I. Meingailis
Opt. Eng. 19(6), 196941 (1 December 1980) https://doi.org/10.1117/12.7972641
TOPICS: Sensors, Optical signal processing, Waveguides, Semiconductor lasers, Pulsed laser operation, Laser sources, Diodes, Photodiodes, Modulation, Mode locking
R. Eng, J. Butler, K. Linden
Opt. Eng. 19(6), 196945 (1 December 1980) https://doi.org/10.1117/12.7972642
TOPICS: Spectroscopy, Laser spectroscopy, Tunable diode lasers, Semiconductor lasers, Calibration
Paul Ballard
Opt. Eng. 19(6), 196961 (1 December 1980) https://doi.org/10.1117/12.7972643
TOPICS: Beam splitters, Retroreflectors
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