Guest Editorial Optical Polarimetry

R. M. A. Azzam; David L. Coffeen

doi:10.1117/12.7972653

1 February 1981 Guest Editorial Optical Polarimetry

R. M. A. Azzam, David L. Coffeen

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Optical Engineering, Vol. 20, Issue 1, 200101 (February 1981). https://doi.org/10.1117/12.7972653

Abstract

Optical polarimetry is a term we have recently adopted to denote any type of optical measurement where light polarization plays a key role, and where polarization itself is a carrier of information. It also refers to measurement of the state of polarization light which is emitted from various sources, over a wide range of wavelengths, or which is scattered by different objects. The sources may range from minute atomic samples to entire galaxies; and the objects may range from atoms, molecules, or micro-scopic particles to whole planets. Evidently this is a field of vast scope that would require several special issues to be represented adequately. Ellipsometry, a branch of optical polarimetry which deals with surface and thin-film characterization by polarized-light reflection, is alone the subject of a series of international conferences with proceedings published as special volumes of Surface Science.1 I n astronomy the measurement of polarization of light, both emitted and scattered, is finding broad application for deducing the microstructure of particles and the macrostructure of atmospheres.2 Other subspecialties of optical polarimetry have similarly expanded.

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R. M. A. Azzam and David L. Coffeen "Guest Editorial Optical Polarimetry," Optical Engineering 20(1), 200101 (1 February 1981). https://doi.org/10.1117/12.7972653

Published: 1 February 1981

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KEYWORDS

Polarimetry

Polarization

Atmospheric optics

Astronomical imaging

Atmospheric particles

Chemical species

Galactic astronomy

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