optical engineering
VOL. 20 · NO. 3 | June 1981
CONTENTS
IN THIS ISSUE

Journal Articles
George Reynolds, John DeVelis
Opt. Eng. 20(3), 203084 (1 June 1981) doi:10.1117/12.7972750
TOPICS: Coherence (optics), Optical components, Optical instrument design
Albert Jamberdino
Opt. Eng. 20(3), 203329 (1 June 1981) doi:10.1117/12.7972718
TOPICS: Data storage, Digital recording, Optical recording
R. Kenville
Opt. Eng. 20(3), 203330 (1 June 1981) doi:10.1117/12.7972719
TOPICS: Laser applications, Image acquisition, Optical discs, Silver, Optical coatings, Precision optics
Donald Herzog
Opt. Eng. 20(3), 203335 (1 June 1981) doi:10.1117/12.7972720
TOPICS: Image sensors, Sensors, Image processing, Remote sensing, Remote sensing system design, Image resolution, Airborne reconnaissance
Paul Pierson
Opt. Eng. 20(3), 203344 (1 June 1981) doi:10.1117/12.7972721
TOPICS: Image resolution, Optical resolution, Image quality, Data centers, Satellite imaging, Satellites, Optical sensors, Laser systems engineering
Stephen Corsover, Lawrence Dobbins
Opt. Eng. 20(3), 203351 (1 June 1981) doi:10.1117/12.7972722
TOPICS: Image processing, Image resolution, Laser applications, Reconnaissance, Laser systems engineering
Anthony Fanelli
Opt. Eng. 20(3), 203358 (1 June 1981) doi:10.1117/12.7972723
TOPICS: Image processing, Laser systems engineering, Digital imaging, Systems modeling, Image resolution, Data modeling, Image enhancement, Digital recording, Image acquisition, Digital image processing
S. Weaver, B. Binns, L. Ralston
Opt. Eng. 20(3), 203365 (1 June 1981) doi:10.1117/12.7972724
TOPICS: Digital recording, Image quality, Holography, Visualization, Image processing, Manufacturing, Image resolution, Particles, Diffraction, Holograms
Thomas Allen, Gary Ash
Opt. Eng. 20(3), 203373 (1 June 1981) doi:10.1117/12.7972725
TOPICS: Tellurium, Digital recording, Optical properties, Oxides, Refraction, Ellipsometry, Transmittance, Reflectivity, Multilayers
Dayton Eden
Opt. Eng. 20(3), 203377 (1 June 1981) doi:10.1117/12.7972726
TOPICS: Vanadium, Semiconductors, Thin films, Spatial resolution, Diffusion, Signal to noise ratio, Data storage
David Strand
Opt. Eng. 20(3), 203379 (1 June 1981) doi:10.1117/12.7972727
TOPICS: Optical recording, Laser ablation, Image processing, Reflection, Glasses
Robert Bartolini
Opt. Eng. 20(3), 203382 (1 June 1981) doi:10.1117/12.7972728
TOPICS: Optical recording, High power diode lasers
Albert Jamberdino
Opt. Eng. 20(3), 203387 (1 June 1981) doi:10.1117/12.7972729
TOPICS: Data storage, Telecommunications, Data communications, Magnetism, Laser optics, Holography, Optical discs, Holographic data storage systems, Ranging
G. Ammon
Opt. Eng. 20(3), 203394 (1 June 1981) doi:10.1117/12.7972730
TOPICS: Data storage, Optical discs, Signal to noise ratio
J. Watkins, N. Boudreaux, T. Otten
Opt. Eng. 20(3), 203399 (1 June 1981) doi:10.1117/12.7972731
TOPICS: Data archive systems, Data storage, Integrated optics, Optical storage, System integration, Satellites, Error control coding, Computer programming, Digital recording, Fiber optics
J. Weaver, T. Gaylord
Opt. Eng. 20(3), 203404 (1 June 1981) doi:10.1117/12.7972732
TOPICS: Electro optics, Crystals, Holograms, Holography, Data storage, Binary data, Fourier transforms, Volume holography, Lithium niobate, Diffraction
Alvin Schnurr, Allen Mann
Opt. Eng. 20(3), 203412 (1 June 1981) doi:10.1117/12.7972733
TOPICS: Mirrors, Lenses, Interferometry, Optical components, Cylindrical lenses
S. Orfanidis, T. Marshall
Opt. Eng. 20(3), 203417 (1 June 1981) doi:10.1117/12.7972734
TOPICS: Transform theory, Televisions, Video, Modulation, Spatial frequencies, Multidimensional signal processing, Fourier transforms
G. Indebetouw
Opt. Eng. 20(3), 203421 (1 June 1981) doi:10.1117/12.7972735
TOPICS: Computer programming, Optical signal processing
John Merchant
Opt. Eng. 20(3), 203424 (1 June 1981) doi:10.1117/12.7972736
TOPICS: Cameras, Image registration
Gerald Roosen, Christian Imbert
Opt. Eng. 20(3), 203437 (1 June 1981) doi:10.1117/12.7972737
TOPICS: Optical testing, Mirrors, Power meters
Gregory Olsen
Opt. Eng. 20(3), 203440 (1 June 1981) doi:10.1117/12.7972738
TOPICS: Semiconductor lasers, Liquid phase epitaxy, Reliability
Richard Mitchell
Opt. Eng. 20(3), 203446 (1 June 1981) doi:10.1117/12.7972739
TOPICS: Sensors, Data modeling, Computer simulations, Light sources
Walter Woehl
Opt. Eng. 20(3), 203450 (1 June 1981) doi:10.1117/12.7972740
TOPICS: Zoom lenses, Infrared imaging, Infrared radiation, Mirrors, Beam shaping, Image sensors, Optical diagnostics, Diagnostic tests, Optical testing, Optical sensors
Ernest Hall, J. Hwang, F. Sadjadi
Opt. Eng. 20(3), 203460 (1 June 1981) doi:10.1117/12.7972741
TOPICS: Pattern recognition, 3D image processing, Image processing, Cameras, Calibration
Steven Mersch, James Harris, Donald Mullen
Opt. Eng. 20(3), 203464 (1 June 1981) doi:10.1117/12.7972742
TOPICS: Carbon dioxide lasers, Cameras, Carbon dioxide, Laser energy, Signal to noise ratio, Spatial resolution, Data acquisition, Data processing
S. Stotlar, E. McLellan
Opt. Eng. 20(3), 203469 (1 June 1981) doi:10.1117/12.7972743
TOPICS: pyroelectric detectors, Measurement devices, Laser development, Laser welding, Sensors
Jae Lim, Hamid Nawab
Opt. Eng. 20(3), 203472 (1 June 1981) doi:10.1117/12.7972744
TOPICS: Speckle, Interference (communication), Optical filters, Image filtering, Linear filtering, Image restoration
William Primak
Opt. Eng. 20(3), 203481 (1 June 1981) doi:10.1117/12.7972745
TOPICS: Interferometers, Interferometry, Birefringence, Ellipsometry, Calibration
R. Chase, F. Seguin, M. Gerassimenko, R. Petrasso
Opt. Eng. 20(3), 203486 (1 June 1981) doi:10.1117/12.7972746
TOPICS: Computed tomography, Tomography, X-rays, Plasma, Diagnostics, X-ray computed tomography, Sensors, Magnetism, Scanners, Data processing
H . Caulfield
Opt. Eng. 20(3), 203493 (1 June 1981) doi:10.1117/12.7972717
TOPICS: Optical engineering
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