Optical Engineering
VOL. 20 · NO. 3 | June 1981

Journal Articles
Opt. Eng. 20(3), 203084 (1 June 1981)https://doi.org/10.1117/12.7972750
TOPICS: Coherence (optics), Optical components, Optical instrument design
Opt. Eng. 20(3), 203329 (1 June 1981)https://doi.org/10.1117/12.7972718
TOPICS: Data storage, Digital recording, Optical recording
Opt. Eng. 20(3), 203330 (1 June 1981)https://doi.org/10.1117/12.7972719
TOPICS: Laser applications, Image acquisition, Optical discs, Silver, Optical coatings, Precision optics
Opt. Eng. 20(3), 203335 (1 June 1981)https://doi.org/10.1117/12.7972720
TOPICS: Image sensors, Sensors, Image processing, Remote sensing, Remote sensing system design, Image resolution, Airborne reconnaissance
Opt. Eng. 20(3), 203344 (1 June 1981)https://doi.org/10.1117/12.7972721
TOPICS: Image resolution, Optical resolution, Image quality, Data centers, Satellite imaging, Satellites, Optical sensors, Laser systems engineering
Opt. Eng. 20(3), 203351 (1 June 1981)https://doi.org/10.1117/12.7972722
TOPICS: Image processing, Image resolution, Laser applications, Reconnaissance, Laser systems engineering
Opt. Eng. 20(3), 203358 (1 June 1981)https://doi.org/10.1117/12.7972723
TOPICS: Image processing, Laser systems engineering, Digital imaging, Systems modeling, Image resolution, Data modeling, Image enhancement, Digital recording, Image acquisition, Digital image processing
Opt. Eng. 20(3), 203365 (1 June 1981)https://doi.org/10.1117/12.7972724
TOPICS: Digital recording, Image quality, Holography, Visualization, Image processing, Manufacturing, Image resolution, Particles, Diffraction, Holograms
Opt. Eng. 20(3), 203373 (1 June 1981)https://doi.org/10.1117/12.7972725
TOPICS: Tellurium, Digital recording, Optical properties, Oxides, Refraction, Ellipsometry, Transmittance, Reflectivity, Multilayers
Opt. Eng. 20(3), 203377 (1 June 1981)https://doi.org/10.1117/12.7972726
TOPICS: Vanadium, Semiconductors, Thin films, Spatial resolution, Diffusion, Signal to noise ratio, Data storage
Opt. Eng. 20(3), 203379 (1 June 1981)https://doi.org/10.1117/12.7972727
TOPICS: Optical recording, Laser ablation, Image processing, Reflection, Glasses
Opt. Eng. 20(3), 203382 (1 June 1981)https://doi.org/10.1117/12.7972728
TOPICS: Optical recording, High power diode lasers
Opt. Eng. 20(3), 203387 (1 June 1981)https://doi.org/10.1117/12.7972729
TOPICS: Data storage, Telecommunications, Data communications, Magnetism, Laser optics, Holography, Optical discs, Holographic data storage systems, Ranging
Opt. Eng. 20(3), 203394 (1 June 1981)https://doi.org/10.1117/12.7972730
TOPICS: Data storage, Optical discs, Signal to noise ratio
Opt. Eng. 20(3), 203399 (1 June 1981)https://doi.org/10.1117/12.7972731
TOPICS: Data archive systems, Data storage, Integrated optics, Optical storage, System integration, Satellites, Error control coding, Computer programming, Digital recording, Fiber optics
Opt. Eng. 20(3), 203404 (1 June 1981)https://doi.org/10.1117/12.7972732
TOPICS: Electro optics, Crystals, Holograms, Holography, Data storage, Binary data, Fourier transforms, Volume holography, Lithium niobate, Diffraction
Opt. Eng. 20(3), 203412 (1 June 1981)https://doi.org/10.1117/12.7972733
TOPICS: Mirrors, Lenses, Interferometry, Optical components, Cylindrical lenses
Opt. Eng. 20(3), 203417 (1 June 1981)https://doi.org/10.1117/12.7972734
TOPICS: Transform theory, Televisions, Video, Modulation, Spatial frequencies, Multidimensional signal processing, Fourier transforms
Opt. Eng. 20(3), 203421 (1 June 1981)https://doi.org/10.1117/12.7972735
TOPICS: Computer programming, Optical signal processing
Opt. Eng. 20(3), 203424 (1 June 1981)https://doi.org/10.1117/12.7972736
TOPICS: Cameras, Image registration
Opt. Eng. 20(3), 203437 (1 June 1981)https://doi.org/10.1117/12.7972737
TOPICS: Optical testing, Mirrors, Power meters
Opt. Eng. 20(3), 203440 (1 June 1981)https://doi.org/10.1117/12.7972738
TOPICS: Semiconductor lasers, Liquid phase epitaxy, Reliability
Opt. Eng. 20(3), 203446 (1 June 1981)https://doi.org/10.1117/12.7972739
TOPICS: Sensors, Data modeling, Computer simulations, Light sources
Opt. Eng. 20(3), 203450 (1 June 1981)https://doi.org/10.1117/12.7972740
TOPICS: Zoom lenses, Infrared imaging, Infrared radiation, Mirrors, Beam shaping, Image sensors, Optical diagnostics, Diagnostic tests, Optical testing, Optical sensors
Opt. Eng. 20(3), 203460 (1 June 1981)https://doi.org/10.1117/12.7972741
TOPICS: Pattern recognition, 3D image processing, Image processing, Cameras, Calibration
Opt. Eng. 20(3), 203464 (1 June 1981)https://doi.org/10.1117/12.7972742
TOPICS: Carbon dioxide lasers, Cameras, Carbon dioxide, Laser energy, Signal to noise ratio, Spatial resolution, Data acquisition, Data processing
Opt. Eng. 20(3), 203469 (1 June 1981)https://doi.org/10.1117/12.7972743
TOPICS: pyroelectric detectors, Measurement devices, Laser development, Laser welding, Sensors
Opt. Eng. 20(3), 203472 (1 June 1981)https://doi.org/10.1117/12.7972744
TOPICS: Speckle, Interference (communication), Optical filters, Image filtering, Linear filtering, Image restoration
Opt. Eng. 20(3), 203481 (1 June 1981)https://doi.org/10.1117/12.7972745
TOPICS: Interferometers, Interferometry, Birefringence, Ellipsometry, Calibration
Opt. Eng. 20(3), 203486 (1 June 1981)https://doi.org/10.1117/12.7972746
TOPICS: Computed tomography, Tomography, X-rays, Plasma, Diagnostics, X-ray computed tomography, Sensors, Magnetism, Scanners, Data processing
Opt. Eng. 20(3), 203493 (1 June 1981)https://doi.org/10.1117/12.7972717
TOPICS: Optical engineering
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