optical engineering
VOL. 20 · NO. 4 | August 1981

Journal Articles
Gerald Stewart, Kent Casleton
Opt. Eng. 20(4), 204493 (1 August 1981) doi:10.1117/12.7972753
TOPICS: Combustion, Chemical reactions, Ions, Molecules, Condensed matter, Particles, Metals
Robert Hall, Alan Eckbreth
Opt. Eng. 20(4), 204494 (1 August 1981) doi:10.1117/12.7972754
TOPICS: Raman spectroscopy, Combustion, Signal processing, Laser beam diagnostics, Molecules, Signal generators, Temperature metrology, Liquids, Thermometry
K. Schofield, M. Steinberg
Opt. Eng. 20(4), 204501 (1 August 1981) doi:10.1117/12.7972755
TOPICS: Luminescence, Molecular lasers, Combustion, Fluorescence spectroscopy, Chemical lasers, Ionization, Modes of laser operation, Chemical species, Molecules, Molecular spectroscopy
David Crosley
Opt. Eng. 20(4), 204511 (1 August 1981) doi:10.1117/12.7972756
TOPICS: Laser induced fluorescence, Chemistry, Energy transfer, Luminescence, Molecules, Molecular energy transfer, Combustion
Peter Hastie, John Hastie
Opt. Eng. 20(4), 204522 (1 August 1981) doi:10.1117/12.7972757
TOPICS: Spectroscopy, Ionization, Combustion, Absorption, Molecules, Dye lasers, Laser irradiation, Luminescence, Tunable lasers, Calibration
Donald Holve, Daniel Tichenor, Donald Hardesty, James Wang
Opt. Eng. 20(4), 204529 (1 August 1981) doi:10.1117/12.7972758
TOPICS: Particles, Singular optics, Temperature metrology, Environmental sensing
Joel Silver
Opt. Eng. 20(4), 204540 (1 August 1981) doi:10.1117/12.7972759
TOPICS: Combustion, Nitrous oxide, NOx, Chemical reactions, Channel projecting optics, Computer simulations, Instrument modeling, Computing systems
James Gole
Opt. Eng. 20(4), 204546 (1 August 1981) doi:10.1117/12.7972760
TOPICS: Chemistry, Molecules, Corrosion, Metals, Oxides, Molecular spectroscopy, Visible radiation, Infrared spectroscopy, Infrared radiation, Microwave radiation
P. Guilfoyle, D. Hecht, D. Steinmetz
Opt. Eng. 20(4), 204556 (1 August 1981) doi:10.1117/12.7972761
TOPICS: Spectrum analysis, Acousto-optics, Joint transforms, Optical correlators, Diffraction, Visibility
Giovanni Crosta
Opt. Eng. 20(4), 204562 (1 August 1981) doi:10.1117/12.7972762
TOPICS: Optics manufacturing, Radio optics, Radiography, Transmittance, Moire patterns, Optical inspection, Modulation, Manufacturing
I. Glaser
Opt. Eng. 20(4), 204568 (1 August 1981) doi:10.1117/12.7972763
TOPICS: Image processing
William Chan
Opt. Eng. 20(4), 204574 (1 August 1981) doi:10.1117/12.7972764
Ross Pepper, David Smith, Robert Cole
Opt. Eng. 20(4), 204579 (1 August 1981) doi:10.1117/12.7972765
TOPICS: Visibility, Analytical research, Visual analytics, Visualization, Pollution control
Kwok-Cheong Tam, Victor Perez-Mendez
Opt. Eng. 20(4), 204586 (1 August 1981) doi:10.1117/12.7972766
TOPICS: Fourier transforms, Radon transform, Distortion
Stephen Rudin, Daniel Bednarek
Opt. Eng. 20(4), 204590 (1 August 1981) doi:10.1117/12.7972767
TOPICS: Tomography, Receptors, X-ray imaging, X-rays, X-ray sources, Radiography
Martin Bastiaans
Opt. Eng. 20(4), 204594 (1 August 1981) doi:10.1117/12.7972768
TOPICS: Modulation, Fourier transforms, Time-frequency analysis
Alfred Leipertz, Martin Fiebig
Opt. Eng. 20(4), 204599 (1 August 1981) doi:10.1117/12.7972769
TOPICS: Pulsed laser operation, Raman spectroscopy, Laser beam diagnostics, Temporal resolution, Pollution detection, Gases, Temperature metrology
M. Murty
Opt. Eng. 20(4), 204605 (1 August 1981) doi:10.1117/12.7972770
Siegfried Craubner
Opt. Eng. 20(4), 204608 (1 August 1981) doi:10.1117/12.7972771
TOPICS: Reticles, Missiles, Image processing, Data conversion, Convolution, Control systems
B. Hunt, Sergio Cabrera
Opt. Eng. 20(4), 204616 (1 August 1981) doi:10.1117/12.7972772
TOPICS: Image compression, Image processing, Adaptive optics, Computing systems, Optical signal processing, Image restoration, Image enhancement, Digital image processing
Peter Silverglate
Opt. Eng. 20(4), 204621 (1 August 1981) doi:10.1117/12.7972773
TOPICS: Satellites, Interferometers, Heterodyning, Data corrections, Laser systems engineering, Spatial frequencies, Spatial resolution, Calibration
D. Durie
Opt. Eng. 20(4), 204625 (1 August 1981) doi:10.1117/12.7972774
TOPICS: Optical benches, Chemical lasers, Mirrors, Mirror mounts
Raymond Reinisch, Michel Neviere
Opt. Eng. 20(4), 204629 (1 August 1981) doi:10.1117/12.7972775
TOPICS: Polaritons, Raman spectroscopy, Surface roughness, Raman scattering, Electromagnetism
Robert Owen
Opt. Eng. 20(4), 204634 (1 August 1981) doi:10.1117/12.7972776
TOPICS: Optical testing, Environmental sensing, Schlieren techniques, Cobalt, Crystals, Hardware testing, Spatial filters
I. Cindrich, A. Tai, J. Fienup, C. Aleksoff
Opt. Eng. 20(4), 204639 (1 August 1981) doi:10.1117/12.7972777
TOPICS: Optical computing, Optical design, Computing systems, Analog electronics, Optical components
S. Briggs
Opt. Eng. 20(4), 204651 (1 August 1981) doi:10.1117/12.7972778
TOPICS: CRTs, Image quality, Visualization, Reconnaissance, Digital imaging, Modulation, Spatial frequencies
C. Hurwitz
Opt. Eng. 20(4), 204658 (1 August 1981) doi:10.1117/12.7972779
TOPICS: Sensors, Receivers, Photodetectors, Optical amplifiers, Avalanche photodiodes, Avalanche photodetectors, Germanium
H. Schau
Opt. Eng. 20(4), 204664 (1 August 1981) doi:10.1117/12.7972780
TOPICS: Image processing
H. Caulfield
Opt. Eng. 20(4), 204665 (1 August 1981) doi:10.1117/12.7972752
TOPICS: Optical engineering, Software
George Reynolds, John DeVelis
Opt. Eng. 20(4), 204671 (1 August 1981) doi:10.1117/12.7972786
TOPICS: Coherence (optics), Optical components, Optical instrument design
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