optical engineering
VOL. 21 · NO. 1 | February 1982
CONTENTS
IN THIS ISSUE

Journal Articles
Patrick Cheatham
Opt. Eng. 21(1), 210101 (1 February 1982) https://doi.org/10.1117/12.7972849
TOPICS: Image quality, Image processing, Modulation transfer functions, Digital image processing, Quality measurement, Optical design, Digital image correlation, Optical pattern recognition, Radar, Imaging systems
I. Overington
Opt. Eng. 21(1), 210102 (1 February 1982) https://doi.org/10.1117/12.7972850
TOPICS: Visualization, Mathematical modeling, Visual process modeling, Performance modeling, Image quality, Motion models, Neurophysiology, Electron microscopy, Image processing
H. Snyder, M. Maddox, D. Shedivy, J. Turpin, J. Burke, R. Strickland
Opt. Eng. 21(1), 210114 (1 February 1982) https://doi.org/10.1117/12.7972851
TOPICS: Databases, Image quality, Transparency, Americium
R. Arguello, H. Kessler, H. Seliner
Opt. Eng. 21(1), 210123 (1 February 1982) https://doi.org/10.1117/12.7972852
TOPICS: Image quality, Optical transfer functions, Anisotropy, Quality measurement, Image processing, Electro optics, Electro optical systems, Calibration, Image quality standards
Harold Edgerton
Opt. Eng. 21(1), 210130 (1 February 1982) https://doi.org/10.1117/12.7972853
TOPICS: Image resolution, Photography, Lamps, Light sources
H. Pollehn
Opt. Eng. 21(1), 210134 (1 February 1982) https://doi.org/10.1117/12.7972854
TOPICS: Image intensifiers, Signal to noise ratio, Interference (communication), Modulation transfer functions, Night vision
Philip Peters
Opt. Eng. 21(1), 210138 (1 February 1982) https://doi.org/10.1117/12.7972855
TOPICS: Image quality, Electro optical systems, Computer simulations, Electro optical modeling, Sensors, Electronics, Signal processing
B. Kumar, D. Casasent, H. Murakami
Opt. Eng. 21(1), 210143 (1 February 1982) https://doi.org/10.1117/12.7972856
TOPICS: Pattern recognition, Optical correlators, Image quality, Multispectral imaging, Stochastic processes, Image filtering, Optimal filtering, Detection and tracking algorithms
R. Mitchel, Stanley Marder
Opt. Eng. 21(1), 210148 (1 February 1982) https://doi.org/10.1117/12.7972857
TOPICS: Synthetic aperture radar, Image quality, Image processing, Radar, Scattering, Radar imaging, Quality measurement
Roy Potter
Opt. Eng. 21(1), 210156 (1 February 1982) https://doi.org/10.1117/12.7972858
TOPICS: Reflectance spectroscopy, Solids, Liquids, Aluminum, Optical properties, Reflectivity, Dielectrics, Thin film coatings
V. Karppinen
Opt. Eng. 21(1), 210160 (1 February 1982) https://doi.org/10.1117/12.7972859
TOPICS: Speckle, Photography, Fringe analysis, Distance measurement, Glasses
Martin Zombeck, Charles Wyman, Martin Weisskopf
Opt. Eng. 21(1), 210163 (1 February 1982) https://doi.org/10.1117/12.7972860
TOPICS: X-rays, Scattering, Astrophysics, Scatter measurement, Spatial resolution, Reflectors, X-ray technology, Image quality, Image resolution, X-ray telescopes
Sebastiano Monaco
Opt. Eng. 21(1), 210173 (1 February 1982) https://doi.org/10.1117/12.7972861
TOPICS: Monochromatic aberrations
I. Chang, D. Hecht
Opt. Eng. 21(1), 210176 (1 February 1982) https://doi.org/10.1117/12.7972862
TOPICS: Signal processing, Acousto-optics, Distortion, Bragg cells, Optical correlators
Kenneth Cashdollar, Martin Hertzberg
Opt. Eng. 21(1), 210182 (1 February 1982) https://doi.org/10.1117/12.7972863
TOPICS: Pyrometry, Infrared radiation, Atmospheric particles, Temperature metrology, Infrared sensors, Sensors, Infrared detectors, Near infrared, Silicon, Land mines
Robert Wong, Philip Hardaker, Margaret Lee
Opt. Eng. 21(1), 210187 (1 February 1982) https://doi.org/10.1117/12.7972864
TOPICS: Image processing, Video, Video processing, Analog electronics, Image enhancement, Radar
Etan Bourkoff
Opt. Eng. 21(1), 210191 (1 February 1982) https://doi.org/10.1117/12.7972865
TOPICS: Modulation, Semiconductor lasers
Yishay Netzer
Opt. Eng. 21(1), 210196 (1 February 1982) https://doi.org/10.1117/12.7972866
TOPICS: Optical components, Line of sight stabilization
Daniel Bednarek, Stephen Rudin, Roland Wong
Opt. Eng. 21(1), 211105 (1 February 1982) https://doi.org/10.1117/12.7972867
TOPICS: Radiography, Signal attenuation, X-rays, Composites
Tamar Peli, Jae Lim
Opt. Eng. 21(1), 211108 (1 February 1982) https://doi.org/10.1117/12.7972868
TOPICS: Image enhancement, Image filtering, Digital filtering, Algorithm development, Control systems, Linear filtering, Image processing, Clouds
Robert Lewis
Opt. Eng. 21(1), 211113 (1 February 1982) https://doi.org/10.1117/12.7972869
TOPICS: Inspection, Optical scanning, Scanners, Signal processing, Sensors, Signal detection, Light sources, Light, Electronics, Fiber optics
Bernard Bendow, Martin Drexhage
Opt. Eng. 21(1), 211118 (1 February 1982) https://doi.org/10.1117/12.7972870
TOPICS: Mid-IR, Infrared radiation, Fiber optics, Vitreous, Infrared materials, Tolerancing, Nuclear radiation, Laser therapeutics, Integrated optics, Glasses
Alan Oppenheim, Monson Hayes, Jae Lim
Opt. Eng. 21(1), 211122 (1 February 1982) https://doi.org/10.1117/12.7972871
TOPICS: Fourier transforms, Reconstruction algorithms, Algorithm development, Algorithms
Edward Browell
Opt. Eng. 21(1), 211128 (1 February 1982) https://doi.org/10.1117/12.7972872
TOPICS: LIDAR, Gases, Sulfur, Absorption, Troposphere, Ozone, Pollution, NOx
R. Fairchild, J. Fienup
Opt. Eng. 21(1), 211133 (1 February 1982) https://doi.org/10.1117/12.7972873
TOPICS: Holographic optical elements, Wavefronts, Aspheric lenses, Holography, Optical design, Computer generated holography, Fourier transforms
D Koch, G. Fazio, w. Traub, G. Rieke, T. Gautier, W. Hoffmann, F. Low, W. Poteet, E. Urban, L. Katz
Opt. Eng. 21(1), 211141 (1 February 1982) https://doi.org/10.1117/12.7972874
TOPICS: Space telescopes, Infrared telescopes, Telescopes, Helium, Sensors, Environmental sensing, Infrared radiation, Light, Sun, Photoresistors
Barbara Levitt, Leonard Levitt
Opt. Eng. 21(1), 211148 (1 February 1982) https://doi.org/10.1117/12.7972875
TOPICS: Electro optical modeling, Performance modeling, Electro optical systems, Liquids, Combustion, Vegetation, Polymers, Solids, Organic materials, Electro optical sensors
H. Caulfield
Opt. Eng. 21(1), 211155 (1 February 1982) https://doi.org/10.1117/12.7972848
TOPICS: Optical engineering
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