optical engineering
VOL. 21 · NO. 3 | June 1982

Journal Articles
F. Chiang
Opt. Eng. 21(3), 213377 (1 June 1982) https://doi.org/10.1117/12.7972918
TOPICS: Experimental mechanics, Light sources, Optical engineering
F. Chiang, J. Adachi, R. Anastasi, J. Beatty
Opt. Eng. 21(3), 213379 (1 June 1982) https://doi.org/10.1117/12.7972919
TOPICS: Speckle, Solids, Mechanics, Composites, Aluminum, Nondestructive evaluation, Chemical species
Y. Hung
Opt. Eng. 21(3), 213391 (1 June 1982) https://doi.org/10.1117/12.7972920
TOPICS: Shearography, Nondestructive evaluation, Cameras, Photography, Image processing, Interferometry, Fringe analysis
T. Dudderar, P. Simpkins
Opt. Eng. 21(3), 213396 (1 June 1982) https://doi.org/10.1117/12.7972921
TOPICS: Light scattering, Speckle metrology, Laser sintering, Speckle, Metrology, Solids, Liquids
Catherine Wykes
Opt. Eng. 21(3), 213400 (1 June 1982) https://doi.org/10.1117/12.7972922
TOPICS: Speckle pattern, Interferometry, Time metrology, Interferometers
P. Boone
Opt. Eng. 21(3), 213407 (1 June 1982) https://doi.org/10.1117/12.7972923
TOPICS: Speckle, Photography, Civil engineering, Astronomy, Image processing
Pramod Rastogi, Pierre Jacquot
Opt. Eng. 21(3), 213411 (1 June 1982) https://doi.org/10.1117/12.7972924
TOPICS: Speckle metrology, Speckle, 3D metrology, 3D modeling, Holographic interferometry, Motion models, Photography, Speckle interferometry, Interferometry
W. Peters, W. Ranson
Opt. Eng. 21(3), 213427 (1 June 1982) https://doi.org/10.1117/12.7972925
TOPICS: Digital imaging, Stress analysis, Laser metrology, Speckle metrology, Laser scanners, 3D scanning, Speckle pattern
Toyohiko Yatagai, Suezou Nakadate, Masanori Idesawa, Hiroyoshi Saito
Opt. Eng. 21(3), 213432 (1 June 1982) https://doi.org/10.1117/12.7972926
TOPICS: Fringe analysis, Digital image processing, Computing systems, Interferometry, Optical inspection, Visualization, Inspection
Ichirou Yamaguchi
Opt. Eng. 21(3), 213436 (1 June 1982) https://doi.org/10.1117/12.7972927
TOPICS: Image sensors, Electro optics, Speckle pattern, Sensors, Metals, Resistance
F. Chiang, C. Kin
Opt. Eng. 21(3), 213441 (1 June 1982) https://doi.org/10.1117/12.7972928
TOPICS: Objectives, Speckle, Coating, Spatial frequencies, Laser scattering, Scattering, Wavelets, Glasses, Photosensitive materials, Opacity
Cesar Sciammarella
Opt. Eng. 21(3), 213447 (1 June 1982) https://doi.org/10.1117/12.7972929
TOPICS: Holography, Moire patterns, Holographic interferometry, Fringe analysis, Data processing
Daniel Post
Opt. Eng. 21(3), 213458 (1 June 1982) https://doi.org/10.1117/12.7972930
TOPICS: Deflectometry, Moire patterns, Optical filters
D. Holloway
Opt. Eng. 21(3), 213468 (1 June 1982) https://doi.org/10.1117/12.7972931
TOPICS: Holographic interferometry, Wave propagation interference, Explosives, Ruby lasers, Wave propagation, Holography
James MacBain, William Stange, Kevin Harding
Opt. Eng. 21(3), 213474 (1 June 1982) https://doi.org/10.1117/12.7972932
TOPICS: Moire patterns, Holographic interferometry, Holograms, Interferometry, Image analysis, Optical testing
A. Ennos, M. Virdee
Opt. Eng. 21(3), 213478 (1 June 1982) https://doi.org/10.1117/12.7972933
TOPICS: Holographic interferometry, Speckle, Photography, Laser interferometry, Holograms
William Sharpe
Opt. Eng. 21(3), 213483 (1 June 1982) https://doi.org/10.1117/12.7972934
TOPICS: Interferometry, Fringe analysis, Motion measurement, Temperature metrology, Environmental sensing
R. Sanford
Opt. Eng. 21(3), 213489 (1 June 1982) https://doi.org/10.1117/12.7972935
TOPICS: Holography, Photoelasticity, Visualization, Polarization, Fringe analysis, Systems modeling
R. Anderson, K. MacFeely
Opt. Eng. 21(3), 213496 (1 June 1982) https://doi.org/10.1117/12.7972936
TOPICS: Radar, Reflectivity, Astatine, Liquids, Absorption, Rayleigh scattering, Radiative transfer
Sanford Hinkal
Opt. Eng. 21(3), 213506 (1 June 1982) https://doi.org/10.1117/12.7972937
TOPICS: Magnetism, Magnetometers, Optical alignment, Satellites, Calibration, Magnetic sensors, Sensors, Optical components, Optical testing
Francesco Crescenzi, Antonello Cutolo, Paolo Gay, Salvatore Solimeno
Opt. Eng. 21(3), 213511 (1 June 1982) https://doi.org/10.1117/12.7972938
TOPICS: High power lasers
Irvin Deutsch, Herbert Malamud
Opt. Eng. 21(3), 213517 (1 June 1982) https://doi.org/10.1117/12.7972939
TOPICS: Cornea, Astatine, Light sources and illumination
F. Huck, R. Davis, S. Park, R. Aherron, R. Arduini
Opt. Eng. 21(3), 213519 (1 June 1982) https://doi.org/10.1117/12.7972940
TOPICS: Sensors, Computing systems, Computational modeling, Systems modeling, Atmospheric modeling, Stochastic processes, Remote sensing, Environmental monitoring, Environmental sensing, Earth's atmosphere
J. Cox
Opt. Eng. 21(3), 213528 (1 June 1982) https://doi.org/10.1117/12.7972941
TOPICS: Signal to noise ratio, Sensors, Pulse shaping, Interference (communication), Charge-coupled devices, CCD image sensors, Photodetectors, Signal detection
D. Heflinger, J. Kirk, R. Cordero, G. Evans
Opt. Eng. 21(3), 213537 (1 June 1982) https://doi.org/10.1117/12.7972942
TOPICS: Gallium arsenide, Holography, Photoresist materials, Photoresist developing, Laser development, Laboratory techniques, Fabrication, Argon ion lasers, Ion beams, Etching
J. Doty, B. Hildebrand
Opt. Eng. 21(3), 213542 (1 June 1982) https://doi.org/10.1117/12.7972943
TOPICS: Interferometry, Holographic interferometry, Holograms, Nondestructive evaluation, Holography, Fringe analysis
James Hoell, Charles Harward, Clayton Bair, Burnie Williams
Opt. Eng. 21(3), 213548 (1 June 1982) https://doi.org/10.1117/12.7972944
TOPICS: Ozone, Absorption, Tunable diode lasers, Geophysics
E. Knozinger, R. Wittenbeck, D. Leutloff
Opt. Eng. 21(3), 213553 (1 June 1982) https://doi.org/10.1117/12.7972945
TOPICS: Molecular spectroscopy, Molecules, Solids, Matrices, Far infrared, Fourier spectroscopy, Spectroscopy, Absorption, Phonons, Argon
James Leger, Jack Cederquist, Sing Lee
Opt. Eng. 21(3), 213557 (1 June 1982) https://doi.org/10.1117/12.7972946
TOPICS: Image processing, Astatine, Confocal microscopy, Laser scanners, Holography, Spatial filters, Image analysis, Video processing, Video, Electronics
Robert Tsai
Opt. Eng. 21(3), 213565 (1 June 1982) https://doi.org/10.1117/12.7972947
TOPICS: LCDs, Light valves, Liquid crystals, Optical design, Laser crystals, Laser development, Visualization, Data acquisition, Displays, Laser systems engineering
H Caulfield
Opt. Eng. 21(3), 213567 (1 June 1982) https://doi.org/10.1117/12.7972917
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