optical engineering
VOL. 21 · NO. 5 | October 1982
CONTENTS
IN THIS ISSUE

Journal Articles
Theo Kooij, Jacques Ludman, P. Stilwell
Opt. Eng. 21(5), 215803 (1 October 1982) https://doi.org/10.1117/12.7972985
TOPICS: Optical signal processing, Defense and security, Signal processing, Doppler effect, Acoustics
Harold Szu
Opt. Eng. 21(5), 215804 (1 October 1982) https://doi.org/10.1117/12.7972986
TOPICS: Acoustics, Optical signal processing, Convolution, Surveillance, Doppler effect, Sensors
David Casasent, Mark Carlotto
Opt. Eng. 21(5), 215814 (1 October 1982) https://doi.org/10.1117/12.7972987
TOPICS: Phased array optics, Radar, Adaptive optics, Array processing, Phased arrays, Antennas, Optical components, Multiplexing, Computing systems, Detection and tracking algorithms
Demetri Psaltis, Kelvin Wagner
Opt. Eng. 21(5), 215822 (1 October 1982) https://doi.org/10.1117/12.7972988
TOPICS: Synthetic aperture radar, Image processing, Acousto-optics, Transducers, CCD cameras, Sensor performance, CCD image sensors, Sensors
Robert Gonsalves
Opt. Eng. 21(5), 215829 (1 October 1982) https://doi.org/10.1117/12.7972989
TOPICS: Phase retrieval, Control systems, Image quality, Adaptive optics, Image restoration, Control systems design, Wavefront sensors, Fourier transforms, Staring arrays, Optical alignment
Jacques Ludman, H. Caulfield, P. Stilwell
Opt. Eng. 21(5), 215833 (1 October 1982) https://doi.org/10.1117/12.7972990
J. Daly, R. Hastings, J. Schmidt
Opt. Eng. 21(5), 215837 (1 October 1982) https://doi.org/10.1117/12.7972991
TOPICS: Laser spectroscopy, Pulsed laser operation, Photodetectors, Molecular lasers, Nitrogen lasers, Ultraviolet radiation, UV optics, Dye lasers, Luminescence
Donald Troxel, William Schreiber, Nancy Burzinski, Mark Matson
Opt. Eng. 21(5), 215841 (1 October 1982) https://doi.org/10.1117/12.7972992
TOPICS: Image quality, Analog electronics, Digital electronics, Televisions, Digital electronic circuits, Photography, Image processing, Hardcopies
C. Fairall, K. Davidson, G. Schacher
Opt. Eng. 21(5), 215847 (1 October 1982) https://doi.org/10.1117/12.7972993
TOPICS: Atmospheric modeling, Ocean optics, Aerosols, Optical properties, Meteorology, Coastal modeling, Atmospheric optics, Atmospheric particles, Humidity, Sensors
Allen Gorin
Opt. Eng. 21(5), 215858 (1 October 1982) https://doi.org/10.1117/12.7972994
TOPICS: Image quality, Synthetic aperture radar, Signal processing, Radar, Image acquisition, Signal to noise ratio, Imaging systems, Classification systems, Quality measurement, Fourier transforms
John Schott, Elizabeth Wilkinson
Opt. Eng. 21(5), 215864 (1 October 1982) https://doi.org/10.1117/12.7972995
TOPICS: Temperature metrology, Thermography, Reflectivity
Alan Desrochers
Opt. Eng. 21(5), 215868 (1 October 1982) https://doi.org/10.1117/12.7972996
TOPICS: Mirrors, Zoom lenses, Infrared imaging, Infrared radiation, Computer simulations
Paul Mazaika
Opt. Eng. 21(5), 215872 (1 October 1982) https://doi.org/10.1117/12.7972997
TOPICS: Sensors, Data modeling, Statistical analysis, Visible radiation
D. Nyyssonen
Opt. Eng. 21(5), 215882 (1 October 1982) https://doi.org/10.1117/12.7972998
TOPICS: Semiconducting wafers, Calibration, Wafer-level optics, Optical calibration, Edge detection, Opacity, Photomasks, Optical testing, Reflectivity, Coherence (optics)
S. Taborsky, W. Lam, R. Sterner, G. Skarda
Opt. Eng. 21(5), 215888 (1 October 1982) https://doi.org/10.1117/12.7972999
TOPICS: Radiotherapy, Digital imaging, Diodes, Image quality, Imaging systems, X-ray imaging, Signal to noise ratio, Image transmission, Standards development, Sensors
Hasko Paradies
Opt. Eng. 21(5), 215894 (1 October 1982) https://doi.org/10.1117/12.7973000
TOPICS: Scattering, X-rays, Particles, Americium, Laser scattering, Synchrotron radiation, Synchrotrons, Natural surfaces
T. Yatagai, M. Idesawa, Y. Yamaashi, M. Suzuki
Opt. Eng. 21(5), 215901 (1 October 1982) https://doi.org/10.1117/12.7973001
TOPICS: Fringe analysis, Moire patterns, Interferometry, Software development, Photographic analysis, Photography, Diagnostics, Cameras, Wafer testing, Silicon
C. Sung, W. Friday, L. Dickerson
Opt. Eng. 21(5), 215907 (1 October 1982) https://doi.org/10.1117/12.7973002
TOPICS: Diffraction, Mirrors
R. McFarlane, G. Blom, A. Chan, S. Chandra, E. Frankfort, G. Kenney, D. Lou, J. Nadan, J. Hafner
Opt. Eng. 21(5), 215913 (1 October 1982) https://doi.org/10.1117/12.7973003
TOPICS: Astatine, Optical discs, Optical recording, Tellurium, Thin films
Gabor Herman, David Kramer, Paul Lauterbur, Andrew Rudin, Jay Schneider
Opt. Eng. 21(5), 215923 (1 October 1982) https://doi.org/10.1117/12.7973004
TOPICS: 3D displays, Magnetism, Software development, Imaging systems, 3D image processing, Natural surfaces, Magnetic resonance imaging, Visualization, Brain, Heart
Ari Friberg
Opt. Eng. 21(5), 215927 (1 October 1982) https://doi.org/10.1117/12.7973005
TOPICS: Radiometry, Light sources, Light
Ray Kostuk
Opt. Eng. 21(5), 215937 (1 October 1982) https://doi.org/10.1117/12.7973006
TOPICS: Opacity, Fluorescent materials, Device simulation, Calibration
E. Dereniak, R. Bredthauer, E. Hicks, J. Vicars, R. Florence
Opt. Eng. 21(5), 215942 (1 October 1982) https://doi.org/10.1117/12.7973007
TOPICS: Charge-coupled devices, Control systems, Imaging systems, Imaging arrays, Positron emission tomography, Human-machine interfaces
B. Capone, R. Taylor, W. Kosonocky
Opt. Eng. 21(5), 215945 (1 October 1982) https://doi.org/10.1117/12.7973008
TOPICS: Thermography, Infrared imaging, Infrared radiation, Charge-coupled devices, Staring arrays, Physics, Sensors, Platinum, Integrated circuits, Silicon
E. Saloman, S. Ebner, L. Hughey
Opt. Eng. 21(5), 215951 (1 October 1982) https://doi.org/10.1117/12.7973009
TOPICS: Synchrotron radiation, Vacuum ultraviolet, Standards development, X-rays, Calibration, Extreme ultraviolet, Radiometry, Astatine, Spectrometers, Fusion energy
H. Caulfield
Opt. Eng. 21(5), 215957 (1 October 1982) https://doi.org/10.1117/12.7972984
TOPICS: Optical engineering
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