Optical Engineering
VOL. 21 · NO. 5 | October 1982

Journal Articles
Opt. Eng. 21(5), 215803 (1 October 1982)https://doi.org/10.1117/12.7972985
TOPICS: Optical signal processing, Defense and security, Signal processing, Doppler effect, Acoustics
Opt. Eng. 21(5), 215804 (1 October 1982)https://doi.org/10.1117/12.7972986
TOPICS: Acoustics, Optical signal processing, Convolution, Surveillance, Doppler effect, Sensors
Opt. Eng. 21(5), 215814 (1 October 1982)https://doi.org/10.1117/12.7972987
TOPICS: Phased array optics, Radar, Adaptive optics, Array processing, Phased arrays, Antennas, Optical components, Multiplexing, Computing systems, Detection and tracking algorithms
Opt. Eng. 21(5), 215822 (1 October 1982)https://doi.org/10.1117/12.7972988
TOPICS: Synthetic aperture radar, Image processing, Acousto-optics, Transducers, CCD cameras, Sensor performance, CCD image sensors, Sensors
Opt. Eng. 21(5), 215829 (1 October 1982)https://doi.org/10.1117/12.7972989
TOPICS: Phase retrieval, Control systems, Image quality, Adaptive optics, Image restoration, Control systems design, Wavefront sensors, Fourier transforms, Staring arrays, Optical alignment
Opt. Eng. 21(5), 215837 (1 October 1982)https://doi.org/10.1117/12.7972991
TOPICS: Laser spectroscopy, Pulsed laser operation, Photodetectors, Molecular lasers, Nitrogen lasers, Ultraviolet radiation, UV optics, Dye lasers, Luminescence
Opt. Eng. 21(5), 215841 (1 October 1982)https://doi.org/10.1117/12.7972992
TOPICS: Image quality, Analog electronics, Digital electronics, Televisions, Digital electronic circuits, Photography, Image processing
Opt. Eng. 21(5), 215847 (1 October 1982)https://doi.org/10.1117/12.7972993
TOPICS: Atmospheric modeling, Ocean optics, Aerosols, Optical properties, Meteorology, Coastal modeling, Atmospheric optics, Atmospheric particles, Humidity, Sensors
Opt. Eng. 21(5), 215858 (1 October 1982)https://doi.org/10.1117/12.7972994
TOPICS: Image quality, Synthetic aperture radar, Signal processing, Radar, Image acquisition, Signal to noise ratio, Imaging systems, Classification systems, Quality measurement, Fourier transforms
Opt. Eng. 21(5), 215864 (1 October 1982)https://doi.org/10.1117/12.7972995
TOPICS: Temperature metrology, Thermography, Reflectivity
Opt. Eng. 21(5), 215868 (1 October 1982)https://doi.org/10.1117/12.7972996
TOPICS: Mirrors, Zoom lenses, Infrared imaging, Infrared radiation, Computer simulations
Opt. Eng. 21(5), 215872 (1 October 1982)https://doi.org/10.1117/12.7972997
TOPICS: Sensors, Data modeling, Statistical analysis, Visible radiation
Opt. Eng. 21(5), 215882 (1 October 1982)https://doi.org/10.1117/12.7972998
TOPICS: Semiconducting wafers, Calibration, Wafer-level optics, Optical calibration, Edge detection, Opacity, Photomasks, Optical testing, Reflectivity, Coherence (optics)
Opt. Eng. 21(5), 215888 (1 October 1982)https://doi.org/10.1117/12.7972999
TOPICS: Radiotherapy, Digital imaging, Diodes, Image quality, Imaging systems, X-ray imaging, Signal to noise ratio, Image transmission, Standards development, Sensors
Opt. Eng. 21(5), 215894 (1 October 1982)https://doi.org/10.1117/12.7973000
TOPICS: Scattering, X-rays, Particles, Americium, Laser scattering, Synchrotron radiation, Synchrotrons, Natural surfaces
Opt. Eng. 21(5), 215901 (1 October 1982)https://doi.org/10.1117/12.7973001
TOPICS: Fringe analysis, Moire patterns, Interferometry, Software development, Photographic analysis, Photography, Diagnostics, Cameras, Wafer testing, Silicon
Opt. Eng. 21(5), 215907 (1 October 1982)https://doi.org/10.1117/12.7973002
TOPICS: Diffraction, Mirrors
Opt. Eng. 21(5), 215913 (1 October 1982)https://doi.org/10.1117/12.7973003
TOPICS: Astatine, Optical discs, Optical recording, Tellurium, Thin films
Opt. Eng. 21(5), 215923 (1 October 1982)https://doi.org/10.1117/12.7973004
TOPICS: 3D displays, Magnetism, Software development, Imaging systems, 3D image processing, Natural surfaces, Magnetic resonance imaging, Visualization, Brain, Heart
Opt. Eng. 21(5), 215927 (1 October 1982)https://doi.org/10.1117/12.7973005
TOPICS: Radiometry, Light sources, Light
Opt. Eng. 21(5), 215937 (1 October 1982)https://doi.org/10.1117/12.7973006
TOPICS: Opacity, Fluorescent materials, Device simulation, Calibration
Opt. Eng. 21(5), 215942 (1 October 1982)https://doi.org/10.1117/12.7973007
TOPICS: Charge-coupled devices, Control systems, Imaging systems, Imaging arrays, Positron emission tomography, Human-machine interfaces
Opt. Eng. 21(5), 215945 (1 October 1982)https://doi.org/10.1117/12.7973008
TOPICS: Thermography, Infrared imaging, Infrared radiation, Charge-coupled devices, Staring arrays, Physics, Sensors, Platinum, Integrated circuits, Silicon
Opt. Eng. 21(5), 215951 (1 October 1982)https://doi.org/10.1117/12.7973009
TOPICS: Synchrotron radiation, Vacuum ultraviolet, Standards development, X-rays, Calibration, Extreme ultraviolet, Radiometry, Astatine, Spectrometers, Fusion energy
Opt. Eng. 21(5), 215957 (1 October 1982)https://doi.org/10.1117/12.7972984
TOPICS: Optical engineering
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