optical engineering
VOL. 21 · NO. 6 | December 1982
CONTENTS
IN THIS ISSUE

Journal Articles
Thomas Wilkerson, Geary Schwemmer
Opt. Eng. 21(6), 206022 (1 December 1982) doi:10.1117/12.7973026
TOPICS: LIDAR, Humidity, Temperature metrology, Absorption, Optical testing, Dye lasers, Environmental sensing, Laser spectroscopy, Spectroscopy, Tunable lasers
H. Caulfield
Opt. Eng. 21(6), 211083 (1 December 1982) doi:10.1117/12.7973011
TOPICS: Holography
S. Zafran, K. Kaufman, M. Silver
Opt. Eng. 21(6), 216002 (1 December 1982) doi:10.1117/12.7973023
TOPICS: Ions, Etching, Polishing, Surface finishing, Laser processing, Mirrors, Laser energy, Argon, Vacuum equipment, Electronics
F. Georges, P. Meyrueis
Opt. Eng. 21(6), 216009 (1 December 1982) doi:10.1117/12.7973024
TOPICS: Digital imaging, Scanners, Photography, Image processing, Landsat, Earth observing sensors
Y. Katzir, I. Glaser, A., Friesem, B. Sharon
Opt. Eng. 21(6), 216016 (1 December 1982) doi:10.1117/12.7973025
TOPICS: Holography, Nondestructive evaluation, Computing systems, Photodiodes
Robert Holman, Paul Cressman
Opt. Eng. 21(6), 216025 (1 December 1982) doi:10.1117/12.7973027
TOPICS: Waveguides, Optical damage, Resistance, Lithium niobate, Ion exchange, Titanium
C. Wang
Opt. Eng. 21(6), 216033 (1 December 1982) doi:10.1117/12.7973028
TOPICS: Digital filtering, Target detection, Detection and tracking algorithms, Forward looking infrared, Algorithm development, Optical filters, Image filtering, Image processing
G. Montgomery
Opt. Eng. 21(6), 216039 (1 December 1982) doi:10.1117/12.7973029
TOPICS: Antireflective coatings, Coating, Reflectivity, Reflection, Multilayers, Dielectrics, Glasses
Mark Skeldon
Opt. Eng. 21(6), 216046 (1 December 1982) doi:10.1117/12.7973030
TOPICS: Resistance, Pulsed laser operation, Thermal analysis, Semiconductor lasers, Laser welding, Receivers, Optical filters, Digital filtering
Robert Jones, Norman Geril
Opt. Eng. 21(6), 216051 (1 December 1982) doi:10.1117/12.7973031
TOPICS: Polishing, Mirrors, X-rays, Grazing incidence, Surface finishing, Process control, Specular reflections, Fabrication, Control systems
M. Acharekar, M. Kaplan
Opt. Eng. 21(6), 216057 (1 December 1982) doi:10.1117/12.7973032
TOPICS: Ultraviolet radiation, Cerium, Krypton, Silica, Luminescence, Oxidation
G. Molesini, D. Bertani, M. Cetica
Opt. Eng. 21(6), 216061 (1 December 1982) doi:10.1117/12.7973033
TOPICS: Interference filters, Microscopy, Calibration
A. Ghodgaonkar, R. Tiwari, K. Ramani
Opt. Eng. 21(6), 216064 (1 December 1982) doi:10.1117/12.7973034
TOPICS: Prisms
D. Botaz, D. Channin, M. Ettenberg
Opt. Eng. 21(6), 216066 (1 December 1982) doi:10.1117/12.7973035
TOPICS: High power lasers, Semiconductor lasers, Continuous wave operation, Optical resonators, Laser optics, Signal to noise ratio, Optical fibers
Teruhito Mishima, Kwan Kao
Opt. Eng. 21(6), 216074 (1 December 1982) doi:10.1117/12.7973036
TOPICS: Semiconductors, Thin films, Spatial resolution, Solids, Fringe analysis, Ellipsometry, Interferometry, Oxides, Nondestructive evaluation
Vincent Bly
Opt. Eng. 21(6), 216079 (1 December 1982) doi:10.1117/12.7973037
TOPICS: Infrared imaging, Infrared radiation, Visible radiation, Transducers, Modulation transfer functions, Image resolution, Resolution enhancement technologies
Jerrold Shapiro
Opt. Eng. 21(6), 216084 (1 December 1982) doi:10.1117/12.7973038
TOPICS: Biology, Medicine, Laser applications, Carbon, Chemical species, Laser spectroscopy, Spectroscopy, Electro-optical engineering
Thomas Ferguson
Opt. Eng. 21(6), 216957 (1 December 1982) doi:10.1117/12.7973012
TOPICS: Optical components, Metrology, Surface properties, Laser development, Optical fabrication equipment, Fabrication, Polishing, Coating, Laser resonators, Laser energy
T. Ferguson, L. Gutheinz, J. Mayo, J. German, W. Lowrey, M. Konopnicki
Opt. Eng. 21(6), 216959 (1 December 1982) doi:10.1117/12.7973013
TOPICS: Metrology, Nomenclature, Optical components, Resonators, Polishing, Coating, Weapons
J. Guha, R. Yoder
Opt. Eng. 21(6), 216963 (1 December 1982) doi:10.1117/12.7973014
TOPICS: Metrology, Diamond turning, Interferometry, Collimation, Resonators, Axicons
J. German, T. Ferguson, W. Latham
Opt. Eng. 21(6), 216968 (1 December 1982) doi:10.1117/12.7973015
TOPICS: Ellipsometry, Optical fabrication equipment, Reflection, Metals, Optical components, Coating
Thomas Leonard, John Loomis, Kevin Hardina, Marion Scott
Opt. Eng. 21(6), 216971 (1 December 1982) doi:10.1117/12.7973016
TOPICS: Infrared radiation, Thin films, Polarizers, Data modeling, Laser energy, Statistical analysis, Optical coatings, Americium, Instrument modeling, Mueller matrices
K. AI-Marzouk, M. Jacobson, R. Parks, M. Rodgers
Opt. Eng. 21(6), 216976 (1 December 1982) doi:10.1117/12.7973017
TOPICS: Reflectometry, Reflectivity, Infrared radiation, Alignment procedures
Munson Kwok, John Herbelin, Robert Ueunten
Opt. Eng. 21(6), 216979 (1 December 1982) doi:10.1117/12.7973018
TOPICS: Phase shifts, Reflectivity, Astatine, Mid-IR, Spherical lenses, Spatial resolution
Janet Fender, James Harvey
Opt. Eng. 21(6), 216983 (1 December 1982) doi:10.1117/12.7973019
TOPICS: Scattering, Optical components, Tolerancing, Surface finishing, Laser scattering, Laser energy, Laser systems engineering, Fabrication, Reflectivity, Bidirectional reflectance transmission function
John Stover
Opt. Eng. 21(6), 216987 (1 December 1982) doi:10.1117/12.7973020
TOPICS: Light scattering, Surface roughness, Spatial frequencies, Diffraction, Sensors, Scatter measurement, Specular reflections
Allen Gauler
Opt. Eng. 21(6), 216991 (1 December 1982) doi:10.1117/12.7973021
TOPICS: Microscopes, Profiling, Optical components
J. Stoneking, J. Casstevens, D. Stillman
Opt. Eng. 21(6), 216998 (1 December 1982) doi:10.1117/12.7973022
TOPICS: Optical components, Mirrors, Finite element methods
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