New Absolute Reflectometer

K. AI-Marzouk; M. Jacobson; R. Parks; M. Rodgers

doi:10.1117/12.7973017

1 December 1982 New Absolute Reflectometer

K. AI-Marzouk, M. Jacobson, R. Parks, M. Rodgers

Author Affiliations +

Optical Engineering, Vol. 21, Issue 6, 216976 (December 1982). https://doi.org/10.1117/12.7973017

Abstract

An instrument has been developed for measuring absolute reflectance at near normal incidence in the infrared region of the spectrum. The basic design of the instrument is similar to the Bennett absolute reflectometer except for some differences in implementation. The major sources of systematic errors have been reduced or eliminated. The alignment procedure is described.

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K. AI-Marzouk, M. Jacobson, R. Parks, and M. Rodgers "New Absolute Reflectometer," Optical Engineering 21(6), 216976 (1 December 1982). https://doi.org/10.1117/12.7973017

Published: 1 December 1982

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