Optical Engineering
VOL. 21 · NO. 6 | December 1982

Journal Articles
Opt. Eng. 21(6), 206022 (1 December 1982)https://doi.org/10.1117/12.7973026
TOPICS: LIDAR, Humidity, Temperature metrology, Absorption, Optical testing, Dye lasers, Environmental sensing, Laser spectroscopy, Spectroscopy, Tunable lasers
Opt. Eng. 21(6), 211083 (1 December 1982)https://doi.org/10.1117/12.7973011
TOPICS: Holography
Opt. Eng. 21(6), 216002 (1 December 1982)https://doi.org/10.1117/12.7973023
TOPICS: Ions, Etching, Polishing, Surface finishing, Laser processing, Mirrors, Laser energy, Argon, Vacuum equipment, Electronics
Opt. Eng. 21(6), 216009 (1 December 1982)https://doi.org/10.1117/12.7973024
TOPICS: Digital imaging, Scanners, Photography, Image processing, Landsat, Earth observing sensors
Opt. Eng. 21(6), 216016 (1 December 1982)https://doi.org/10.1117/12.7973025
TOPICS: Holography, Nondestructive evaluation, Computing systems, Photodiodes
Opt. Eng. 21(6), 216025 (1 December 1982)https://doi.org/10.1117/12.7973027
TOPICS: Waveguides, Optical damage, Resistance, Lithium niobate, Ion exchange, Titanium
Opt. Eng. 21(6), 216033 (1 December 1982)https://doi.org/10.1117/12.7973028
TOPICS: Digital filtering, Target detection, Detection and tracking algorithms, Forward looking infrared, Algorithm development, Optical filters, Image filtering, Image processing
Opt. Eng. 21(6), 216039 (1 December 1982)https://doi.org/10.1117/12.7973029
TOPICS: Antireflective coatings, Coating, Reflectivity, Reflection, Multilayers, Dielectrics, Glasses
Opt. Eng. 21(6), 216046 (1 December 1982)https://doi.org/10.1117/12.7973030
TOPICS: Resistance, Pulsed laser operation, Thermal analysis, Semiconductor lasers, Laser welding, Receivers, Optical filters, Digital filtering
Opt. Eng. 21(6), 216051 (1 December 1982)https://doi.org/10.1117/12.7973031
TOPICS: Polishing, Mirrors, X-rays, Grazing incidence, Surface finishing, Process control, Specular reflections, Fabrication, Control systems
Opt. Eng. 21(6), 216057 (1 December 1982)https://doi.org/10.1117/12.7973032
TOPICS: Ultraviolet radiation, Cerium, Krypton, Silica, Luminescence, Oxidation
Opt. Eng. 21(6), 216061 (1 December 1982)https://doi.org/10.1117/12.7973033
TOPICS: Interference filters, Microscopy, Calibration
Opt. Eng. 21(6), 216064 (1 December 1982)https://doi.org/10.1117/12.7973034
TOPICS: Prisms
Opt. Eng. 21(6), 216066 (1 December 1982)https://doi.org/10.1117/12.7973035
TOPICS: High power lasers, Semiconductor lasers, Continuous wave operation, Optical resonators, Laser optics, Signal to noise ratio, Optical fibers
Opt. Eng. 21(6), 216074 (1 December 1982)https://doi.org/10.1117/12.7973036
TOPICS: Semiconductors, Thin films, Spatial resolution, Solids, Fringe analysis, Ellipsometry, Interferometry, Oxides, Nondestructive evaluation
Opt. Eng. 21(6), 216079 (1 December 1982)https://doi.org/10.1117/12.7973037
TOPICS: Infrared imaging, Infrared radiation, Visible radiation, Transducers, Modulation transfer functions, Image resolution, Resolution enhancement technologies
Opt. Eng. 21(6), 216084 (1 December 1982)https://doi.org/10.1117/12.7973038
TOPICS: Biology, Medicine, Laser applications, Carbon, Chemical species, Laser spectroscopy, Spectroscopy, Electro-optical engineering
Opt. Eng. 21(6), 216957 (1 December 1982)https://doi.org/10.1117/12.7973012
TOPICS: Optical components, Metrology, Surface properties, Laser development, Optical fabrication equipment, Fabrication, Polishing, Coating, Laser resonators, Laser energy
Opt. Eng. 21(6), 216959 (1 December 1982)https://doi.org/10.1117/12.7973013
TOPICS: Metrology, Nomenclature, Optical components, Resonators, Polishing, Coating, Weapons
Opt. Eng. 21(6), 216963 (1 December 1982)https://doi.org/10.1117/12.7973014
TOPICS: Metrology, Diamond turning, Interferometry, Collimation, Resonators, Axicons
Opt. Eng. 21(6), 216968 (1 December 1982)https://doi.org/10.1117/12.7973015
TOPICS: Ellipsometry, Optical fabrication equipment, Reflection, Metals, Optical components, Coating
Opt. Eng. 21(6), 216971 (1 December 1982)https://doi.org/10.1117/12.7973016
TOPICS: Infrared radiation, Thin films, Polarizers, Data modeling, Laser energy, Statistical analysis, Optical coatings, Americium, Instrument modeling, Mueller matrices
Opt. Eng. 21(6), 216976 (1 December 1982)https://doi.org/10.1117/12.7973017
TOPICS: Reflectometry, Reflectivity, Infrared radiation, Alignment procedures
Opt. Eng. 21(6), 216979 (1 December 1982)https://doi.org/10.1117/12.7973018
TOPICS: Phase shifts, Reflectivity, Astatine, Mid-IR, Spherical lenses, Spatial resolution
Opt. Eng. 21(6), 216983 (1 December 1982)https://doi.org/10.1117/12.7973019
TOPICS: Scattering, Optical components, Tolerancing, Surface finishing, Laser scattering, Laser energy, Laser systems engineering, Fabrication, Reflectivity, Bidirectional reflectance transmission function
Opt. Eng. 21(6), 216987 (1 December 1982)https://doi.org/10.1117/12.7973020
TOPICS: Light scattering, Surface roughness, Spatial frequencies, Diffraction, Sensors, Scatter measurement, Specular reflections
Opt. Eng. 21(6), 216991 (1 December 1982)https://doi.org/10.1117/12.7973021
TOPICS: Microscopes, Profiling, Optical components
Opt. Eng. 21(6), 216998 (1 December 1982)https://doi.org/10.1117/12.7973022
TOPICS: Optical components, Mirrors, Finite element methods
Back to Top