Optical Engineering
VOL. 23 · NO. 4 | August 1984
CONTENTS
IN THIS ISSUE

Journal Articles
Opt. Eng. 23(4), 234098 (1 August 1984) https://doi.org/10.1117/12.7973296
Opt. Eng. 23(4), 234100 (1 August 1984) https://doi.org/10.1117/12.7973322
TOPICS: Photography
Opt. Eng. 23(4), 234106 (1 August 1984) https://doi.org/10.1117/12.7973323
Opt. Eng. 23(4), 234349 (1 August 1984) https://doi.org/10.1117/12.7973297
TOPICS: Optics manufacturing, Metrology, Interferometers, Interferometry, Optical testing
Opt. Eng. 23(4), 234350 (1 August 1984) https://doi.org/10.1117/12.7973298
TOPICS: Heterodyning, Interferometry, Algorithm development, Interferometers
Opt. Eng. 23(4), 234353 (1 August 1984) https://doi.org/10.1117/12.7973299
TOPICS: Heterodyning, Interferometers, Phase measurement, Phase shift keying, Wavefronts, Lenses, Phase modulation
Opt. Eng. 23(4), 234357 (1 August 1984) https://doi.org/10.1117/12.7973300
TOPICS: Shearing interferometers, Wavefront aberrations, Interferometers, Mirrors, Fringe analysis, Data analysis, Image sensors, Sensors, Visualization, Wavefronts
Opt. Eng. 23(4), 234361 (1 August 1984) https://doi.org/10.1117/12.7973301
TOPICS: Phase interferometry, Interferometry, Time metrology, Wavefronts, Interferometers, Optical components
Opt. Eng. 23(4), 234365 (1 August 1984) https://doi.org/10.1117/12.7973302
TOPICS: Heterodyning, Profilometers, Mirrors, X-rays, Surface roughness, Precision optics, Phase measurement, Reflectivity, X-ray optics
Opt. Eng. 23(4), 234371 (1 August 1984) https://doi.org/10.1117/12.7973303
TOPICS: Phase measurement, Interferometry, Charge-coupled devices, Image acquisition, Solid state electronics, Detector arrays, Imaging devices, Imaging systems
Opt. Eng. 23(4), 234379 (1 August 1984) https://doi.org/10.1117/12.7973304
TOPICS: Calibration, Optical calibration, Zernike polynomials, Interferometry, Zerodur
Opt. Eng. 23(4), 234384 (1 August 1984) https://doi.org/10.1117/12.7973305
TOPICS: Wavefronts, X-ray optics, EUV optics, X-rays, Extreme ultraviolet, Metrology
Opt. Eng. 23(4), 234391 (1 August 1984) https://doi.org/10.1117/12.7973306
TOPICS: Phase measurement, Interferometry, Analog electronics, Electro optics, Crystals, Fringe analysis, Phase interferometry
Opt. Eng. 23(4), 234396 (1 August 1984) https://doi.org/10.1117/12.7973307
TOPICS: Raster graphics, Wavefronts
Opt. Eng. 23(4), 234401 (1 August 1984) https://doi.org/10.1117/12.7973308
TOPICS: Semiconducting wafers, Integrated circuits, Wafer testing, Fizeau interferometers, Silicon, Digital image processing, Image processing
Opt. Eng. 23(4), 234406 (1 August 1984) https://doi.org/10.1117/12.7973309
TOPICS: Surface finishing, Light scattering, Data storage, Polishing, Chromium, Polarization, Spatial frequencies, System integration
Opt. Eng. 23(4), 234413 (1 August 1984) https://doi.org/10.1117/12.7973310
TOPICS: Laser scanners, Optical scanning systems, Optical filters, Printing, Modulation, Tolerancing, Analog electronics, Laser development, 3D scanning, Linear filtering
Opt. Eng. 23(4), 234421 (1 August 1984) https://doi.org/10.1117/12.7973311
Opt. Eng. 23(4), 234426 (1 August 1984) https://doi.org/10.1117/12.7973312
TOPICS: Americium, Reticles, Spherical lenses
Opt. Eng. 23(4), 234431 (1 August 1984) https://doi.org/10.1117/12.7973313
TOPICS: Thermography, Imaging systems, Electronics, Signal to noise ratio, Interference (communication), Thermal modeling, Systems modeling
Opt. Eng. 23(4), 234436 (1 August 1984) https://doi.org/10.1117/12.7973314
TOPICS: Doppler effect, Americium
Opt. Eng. 23(4), 234443 (1 August 1984) https://doi.org/10.1117/12.7973315
TOPICS: Laser damage threshold, Optical storage, Optical properties, Germanium, Silicon, Laser processing
Opt. Eng. 23(4), 234448 (1 August 1984) https://doi.org/10.1117/12.7973316
TOPICS: Target acquisition, Ranging, Aspheric lenses
Opt. Eng. 23(4), 234453 (1 August 1984) https://doi.org/10.1117/12.7973317
TOPICS: Speckle, Light scattering, Statistical analysis, Scattering, Data modeling
Opt. Eng. 23(4), 234462 (1 August 1984) https://doi.org/10.1117/12.7973318
TOPICS: Optical fibers, Infrared radiation, Heterodyning, Silver, Signal detection, Americium, Carbon dioxide lasers, Continuous wavelet transforms, Infrared detectors, Sensors
Opt. Eng. 23(4), 234465 (1 August 1984) https://doi.org/10.1117/12.7973319
TOPICS: Glasses, Optical fibers, Americium, Deposition processes, Silicon, Cladding
Opt. Eng. 23(4), 234470 (1 August 1984) https://doi.org/10.1117/12.7973320
TOPICS: Pulsed laser deposition, Chemical lasers, Chemical vapor deposition, Continuous wave operation, Reflectivity, Thin films, Laser sources, Laser optics
Opt. Eng. 23(4), 234475 (1 August 1984) https://doi.org/10.1117/12.7973321
TOPICS: Magnetism, Plasmas, Laser interferometry, Laser scattering, Laser applications, Temporal resolution, Vacuum ultraviolet, Plasma diagnostics, Thomson scattering, Luminescence
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