optical engineering
VOL. 23 · NO. 4 | August 1984
CONTENTS
IN THIS ISSUE

Journal Articles
H. Caulfield
Opt. Eng. 23(4), 234098 (1 August 1984) https://doi.org/10.1117/12.7973296
Harold Edgerton
Opt. Eng. 23(4), 234100 (1 August 1984) https://doi.org/10.1117/12.7973322
TOPICS: Photography
Tom Bruegge
Opt. Eng. 23(4), 234106 (1 August 1984) https://doi.org/10.1117/12.7973323
James Wyant
Opt. Eng. 23(4), 234349 (1 August 1984) https://doi.org/10.1117/12.7973297
TOPICS: Optics manufacturing, Metrology, Interferometers, Interferometry, Optical testing
J. Greivenkamp
Opt. Eng. 23(4), 234350 (1 August 1984) https://doi.org/10.1117/12.7973298
TOPICS: Heterodyning, Interferometry, Algorithm development, Interferometers
J. Seligson, C. Callari, J. Greivenkamp, J. Ward
Opt. Eng. 23(4), 234353 (1 August 1984) https://doi.org/10.1117/12.7973299
TOPICS: Heterodyning, Interferometers, Phase measurement, Phase shift keying, Wavefronts, Lenses, Phase modulation
Toyohiko Yatagai, Toshio Kanou
Opt. Eng. 23(4), 234357 (1 August 1984) https://doi.org/10.1117/12.7973300
TOPICS: Shearing interferometers, Wavefront aberrations, Interferometers, Mirrors, Fringe analysis, Data analysis, Image sensors, Sensors, Visualization, Wavefronts
R. Smythe, R. Moore
Opt. Eng. 23(4), 234361 (1 August 1984) https://doi.org/10.1117/12.7973301
TOPICS: Phase interferometry, Interferometry, Time metrology, Wavefronts, Interferometers, Optical components
C Huang
Opt. Eng. 23(4), 234365 (1 August 1984) https://doi.org/10.1117/12.7973302
TOPICS: Heterodyning, Profilometers, Mirrors, X-rays, Surface roughness, Precision optics, Phase measurement, Reflectivity, X-ray optics
Keith Prettviohns
Opt. Eng. 23(4), 234371 (1 August 1984) https://doi.org/10.1117/12.7973303
TOPICS: Phase measurement, Interferometry, Charge-coupled devices, Image acquisition, Solid state electronics, Detector arrays, Imaging devices, Imaging systems
Bernard Fritz
Opt. Eng. 23(4), 234379 (1 August 1984) https://doi.org/10.1117/12.7973304
TOPICS: Calibration, Optical calibration, Zernike polynomials, Interferometry, Zerodur
Paul Glenn
Opt. Eng. 23(4), 234384 (1 August 1984) https://doi.org/10.1117/12.7973305
TOPICS: Wavefronts, X-ray optics, EUV optics, X-rays, Extreme ultraviolet, Metrology
K. Womack
Opt. Eng. 23(4), 234391 (1 August 1984) https://doi.org/10.1117/12.7973306
TOPICS: Phase measurement, Interferometry, Analog electronics, Electro optics, Crystals, Fringe analysis, Phase interferometry
K. Womack
Opt. Eng. 23(4), 234396 (1 August 1984) https://doi.org/10.1117/12.7973307
TOPICS: Raster graphics, Wavefronts
Toyohiko Yatagai, Shigeru Inaba, Hideki Nakano, Masane Suzuki
Opt. Eng. 23(4), 234401 (1 August 1984) https://doi.org/10.1117/12.7973308
TOPICS: Semiconducting wafers, Integrated circuits, Wafer testing, Fizeau interferometers, Silicon, Digital image processing, Image processing
John Stover, Steven Serati, Calvin Gillespie
Opt. Eng. 23(4), 234406 (1 August 1984) https://doi.org/10.1117/12.7973309
TOPICS: Surface finishing, Light scattering, Data storage, Polishing, Chromium, Polarization, Spatial frequencies, System integration
Eric Barkan, Jerome Swartz
Opt. Eng. 23(4), 234413 (1 August 1984) https://doi.org/10.1117/12.7973310
TOPICS: Laser scanners, Optical scanning systems, Optical filters, Printing, Modulation, Tolerancing, Analog electronics, Laser development, 3D scanning, Linear filtering
R. Bruzzese, C. d'Ambrosio, B. Lancellotti, G. Sacerdoti
Opt. Eng. 23(4), 234421 (1 August 1984) https://doi.org/10.1117/12.7973311
C. Huang, J. Hodor
Opt. Eng. 23(4), 234426 (1 August 1984) https://doi.org/10.1117/12.7973312
TOPICS: Americium, Reticles, Spherical lenses
J. Vortman, A. Bar-Lev
Opt. Eng. 23(4), 234431 (1 August 1984) https://doi.org/10.1117/12.7973313
TOPICS: Thermography, Imaging systems, Electronics, Signal to noise ratio, Interference (communication), Thermal modeling, Systems modeling
R. Wlezien, D. Miu, V. Kibens
Opt. Eng. 23(4), 234436 (1 August 1984) https://doi.org/10.1117/12.7973314
TOPICS: Doppler effect, Americium
G. Niklasson, H. Craighead
Opt. Eng. 23(4), 234443 (1 August 1984) https://doi.org/10.1117/12.7973315
TOPICS: Laser damage threshold, Optical storage, Optical properties, Germanium, Silicon, Laser processing
S. Tam
Opt. Eng. 23(4), 234448 (1 August 1984) https://doi.org/10.1117/12.7973316
TOPICS: Target acquisition, Ranging, Aspheric lenses
E. Jakeman
Opt. Eng. 23(4), 234453 (1 August 1984) https://doi.org/10.1117/12.7973317
TOPICS: Speckle, Light scattering, Statistical analysis, Scattering, Data modeling
A. Katzir, S. Simhony, J. Salzman, A. Schoenberg, E. Kapon
Opt. Eng. 23(4), 234462 (1 August 1984) https://doi.org/10.1117/12.7973318
TOPICS: Optical fibers, Infrared radiation, Heterodyning, Silver, Signal detection, Americium, Carbon dioxide lasers, Continuous wavelet transforms, Infrared detectors, Sensors
H. Takahashi, I. Sugimoto, T. Sato, S. Yoshida
Opt. Eng. 23(4), 234465 (1 August 1984) https://doi.org/10.1117/12.7973319
TOPICS: Glasses, Optical fibers, Americium, Deposition processes, Silicon, Cladding
S. Allen, A. Trigubo, Y. Liu
Opt. Eng. 23(4), 234470 (1 August 1984) https://doi.org/10.1117/12.7973320
TOPICS: Pulsed laser deposition, Chemical lasers, Chemical vapor deposition, Continuous wave operation, Reflectivity, Thin films, Laser sources, Laser optics
E. Danielewicz, N. Luhmann, W. Peebles
Opt. Eng. 23(4), 234475 (1 August 1984) https://doi.org/10.1117/12.7973321
TOPICS: Magnetism, Plasmas, Laser interferometry, Laser scattering, Laser applications, Temporal resolution, Vacuum ultraviolet, Plasma diagnostics, Thomson scattering, Luminescence
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