1 August 1984 Guest Editorial: Precision Surface Metrology
Author Affiliations +
Abstract
During the past two decades there have been many changes in precision surface metrology. The introduction of the laser and the large computer during the 1960s and 1970s produced many changes in testing capabilities and requirements. Several commercial interferometers became available in the 1970s, enabling people who were not necessarily experts in interferometry to use interferometers to produce better optics. Since both buyers and sellers could test optics, the quality of the optics manufactured and sold improved greatly. If a person ordered 1/10 wave optics, he would probably get 1/10 wave or better optics; if he got optics of lower quality, he would know it, and he could prove it and return it.
James C. Wyant, "Guest Editorial: Precision Surface Metrology," Optical Engineering 23(4), 234349 (1 August 1984). https://doi.org/10.1117/12.7973297 . Submission:
JOURNAL ARTICLE
1 PAGES


SHARE
RELATED CONTENT

Laser diode technologies for in-process metrology
Proceedings of SPIE (November 01 1990)
In-process metrology for large astronomical mirrors
Proceedings of SPIE (November 01 1990)
A stitching method to test the segments of a large...
Proceedings of SPIE (September 01 2009)
Stylus profilometry of large optics
Proceedings of SPIE (November 01 1990)

Back to Top