optical engineering
VOL. 23 · NO. 5 | October 1984

Journal Articles
David Casasent
Opt. Eng. 23(5), 235483 (1 October 1984) doi:10.1117/12.7973325
TOPICS: Robot vision, Robotics
O. Mitchell, Timothy Grogan
Opt. Eng. 23(5), 235484 (1 October 1984) doi:10.1117/12.7973326
TOPICS: Machine vision, Computer vision technology, Inspection
David Casasent, Vinod Sharma
Opt. Eng. 23(5), 235492 (1 October 1984) doi:10.1117/12.7973327
TOPICS: Robot vision, Pattern recognition, Fourier transforms
Gene Gindi, Arthur Gmitro
Opt. Eng. 23(5), 235499 (1 October 1984) doi:10.1117/12.7973328
TOPICS: Radon transform, Feature extraction, Space operations, Optical pattern recognition, Pattern recognition, Radon, Hough transforms, Edge detection, Video, Fourier optics
K. Melchior, M. Rueff, E. Schmidberaer
Opt. Eng. 23(5), 235507 (1 October 1984) doi:10.1117/12.7973329
TOPICS: Sensors
P. Saraga, C. Newcomb, P. Lloyd, D. Humphreys, D. Burnett
Opt. Eng. 23(5), 235512 (1 October 1984) doi:10.1117/12.7973330
TOPICS: Robots, Cameras, Visualization, Televisions, Neck, Imaging systems, Machine vision, Computer vision technology, Image processing, Calibration
G. Begin, J. Boillot, C. Michel
Opt. Eng. 23(5), 235518 (1 October 1984) doi:10.1117/12.7973331
TOPICS: Infrared radiation, 3D vision, Prototyping, Robotics
Rajarshi Ray, Joseph Wilder
Opt. Eng. 23(5), 235523 (1 October 1984) doi:10.1117/12.7973332
TOPICS: Robotics, Visualization, Sensing systems, Sensors, Control systems, Image enhancement, Nonlinear filtering, Algorithm development, Spherical lenses, Reflectivity
Homer Chen, Narendra Ahuja, Thomas Huang
Opt. Eng. 23(5), 235531 (1 October 1984) doi:10.1117/12.7973333
H. Nishihara
Opt. Eng. 23(5), 235536 (1 October 1984) doi:10.1117/12.7973334
TOPICS: Real time imaging, Visualization, Robotics, Tolerancing, Reliability, System on a chip, Prisms, Imaging systems, Sensors
Michael Fuhrman, Takeo Kanade
Opt. Eng. 23(5), 235546 (1 October 1984) doi:10.1117/12.7973335
TOPICS: Sensors, Distance measurement, Optical fiber cables, Analog electronics, Optical sensors, PIN photodiodes, 3D acquisition, Light sources, Position sensors, Prototyping
Norman Chigier, Gerald Stewart
Opt. Eng. 23(5), 235554 (1 October 1984) doi:10.1117/12.7973336
TOPICS: Particles, Liquids, Combustion, Particle sizing, Solids, Atmospheric particles, Chemical analysis, Aerospace engineering, Optical engineering, Spherical lenses
Julian Tishkoff
Opt. Eng. 23(5), 235557 (1 October 1984) doi:10.1117/12.7973337
TOPICS: Standards development, Calibration, Particles, Data processing, Electro-optical engineering
B. Weiss, P. Derov, D. DeBiase, H. Simmons
Opt. Eng. 23(5), 235561 (1 October 1984) doi:10.1117/12.7973338
TOPICS: Particle sizing, Optical imaging, Imaging systems, Liquids, Control systems, Data analysis, Data acquisition, Gas lasers, Diagnostics, Hardware testing
P. Malyak, B. Thompson
Opt. Eng. 23(5), 235567 (1 October 1984) doi:10.1117/12.7973339
TOPICS: Particles, Velocity measurements, Holography, Fourier transforms, Holograms, Diffraction, Cameras
A. Stanton, H. Caulfield, G. Stewarrt
Opt. Eng. 23(5), 235577 (1 October 1984) doi:10.1117/12.7973340
TOPICS: Particles, Holograms, Holography, Image analysis, Data analysis, Diagnostics, Combustion, Liquids, Spherical lenses, Image enhancement
W. Bachalo, M. Houser
Opt. Eng. 23(5), 235583 (1 October 1984) doi:10.1117/12.7973341
TOPICS: Laser scattering, Light scattering, Spherical lenses, Particles, Fringe analysis, Optical spheres, Analytical research, Beam analyzers, Geometrical optics, Optical testing
D. Holve, K. Annen
Opt. Eng. 23(5), 235591 (1 October 1984) doi:10.1117/12.7973342
TOPICS: Particles, Deconvolution, Velocimetry, Backscatter, In situ metrology, Optical diagnostics, Research facilities, Particle sizing, Combustion, Error analysis
Cecil Hess, Victor Espinosa
Opt. Eng. 23(5), 235604 (1 October 1984) doi:10.1117/12.7973343
TOPICS: Light scattering, Particles, Polarization
E. Hirleman, V. Oechsle, N. Chigier
Opt. Eng. 23(5), 235610 (1 October 1984) doi:10.1117/12.7973344
TOPICS: Diffraction, Particles, Reticles, Calibration, Statistical analysis, Sensors, Particle sizing, Opacity, Glasses, Scattering
B. Ewan, J. Swithenbank, C. Sorusbay
Opt. Eng. 23(5), 235620 (1 October 1984) doi:10.1117/12.7973345
TOPICS: Holography, Holograms
Lee Dodge
Opt. Eng. 23(5), 235626 (1 October 1984) doi:10.1117/12.7973346
TOPICS: Calibration, Particles, Sensors, Multiple scattering, Scattering media
G. Gouesbet, M. Ledoux
Opt. Eng. 23(5), 235631 (1 October 1984) doi:10.1117/12.7973347
TOPICS: Velocimetry, Laser systems engineering, Holography, Spectroscopy
L. Mauldin, W. Chu
Opt. Eng. 23(5), 235641 (1 October 1984) doi:10.1117/12.7973348
TOPICS: Atmospheric modeling, Contamination, Instrument modeling, Aerosols, Optical components, Satellites, Refraction, Americium, Thin film coatings, Thin films
G. Molesini, G. Pedrini, F. Quercioli
Opt. Eng. 23(5), 235646 (1 October 1984) doi:10.1117/12.7973349
TOPICS: Interferometers, Astatine, Interferometry, Wavefronts, Beam splitters, Diffraction gratings, Calibration
F. Huck, R. Davis, C. Fales, R. Aherron, R. Arduini, R. Samms
Opt. Eng. 23(5), 235650 (1 October 1984) doi:10.1117/12.7973350
TOPICS: Data processing, Detection and tracking algorithms, Remote sensing, Sensors, Data modeling, Performance modeling, Stochastic processes, Sensor performance, Landsat, Earth observing sensors
R. Bartlett, D. Kania, w. Trela, E. Kaline, P. Lee, E. Spiller
Opt. Eng. 23(5), 235667 (1 October 1984) doi:10.1117/12.7973351
TOPICS: Dispersion, Reflectivity
M. Acharekar
Opt. Eng. 23(5), 235669 (1 October 1984) doi:10.1117/12.7973352
TOPICS: Reflectors, Polarization, Astatine, Jones matrices, Phase shifts, Laser resonators
John Saghri, Andrew Tescher
Opt. Eng. 23(5), 235675 (1 October 1984) doi:10.1117/12.7973353
TOPICS: Image enhancement, Image processing, High dynamic range imaging
L. Aukerman, F. Vernon, Y. Song
Opt. Eng. 23(5), 235678 (1 October 1984) doi:10.1117/12.7973354
TOPICS: Photodiodes, Radiation effects, Silicon, Avalanche photodetectors, Photodetectors, Avalanche photodiodes, Sensors, Environmental sensing
K. Linden, R Reeder
Opt. Eng. 23(5), 235685 (1 October 1984) doi:10.1117/12.7973355
TOPICS: Semiconductor lasers, High power lasers, Infrared radiation, Continuous wave operation, External quantum efficiency, Crystals, Laser crystals, Semiconducting wafers
H. Caulfield
Opt. Eng. 23(5), 235687 (1 October 1984) doi:10.1117/12.7973324
TOPICS: Optical engineering, Continuous wave operation, Laser induced damage, Optical components
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