optical engineering
VOL. 24 · NO. 3 | June 1985

Journal Articles
Theodore Vorburger
Opt. Eng. 24(3), 243371 (1 June 1985) https://doi.org/10.1117/12.7973491
TOPICS: Metrology, Education and training, Dimensional metrology, Surface finishing, Patents
W. Estler
Opt. Eng. 24(3), 243372 (1 June 1985) https://doi.org/10.1117/12.7973492
TOPICS: Calibration, Metrology, Motion measurement, Motion estimation, Error analysis, Algorithms, Distortion
Jean Bennett
Opt. Eng. 24(3), 243380 (1 June 1985) https://doi.org/10.1117/12.7973493
TOPICS: Surface finishing, Integrated optics, Profilometers, Heterodyning, Scattering, Polishing, Zerodur
E. Church, T. Vorburger, J. Wyant
Opt. Eng. 24(3), 243388 (1 June 1985) https://doi.org/10.1117/12.7973494
TOPICS: Precision optics, Surface finishing, Optical testing, Microscopy, Data analysis
E. Church, P. Takacs
Opt. Eng. 24(3), 243396 (1 June 1985) https://doi.org/10.1117/12.7973495
TOPICS: Surface finishing, Precision optics, Visual optics, Visualization, Microscopy, Profiling, Statistical analysis
John Stover, Fredrick Cady, Edward Sklar
Opt. Eng. 24(3), 243404 (1 June 1985) https://doi.org/10.1117/12.7973496
TOPICS: Data processing, Scatter measurement, Process control, Reflectivity, Sensors, Americium, Beam controllers, Control systems, Optical testing, Scattering
Rainer Brodmann, Oskar Gerstorfer, Gerd Thurn
Opt. Eng. 24(3), 243408 (1 June 1985) https://doi.org/10.1117/12.7973497
TOPICS: Light scattering, Micromachining, Radium, Tolerancing, Distance measurement
K. Stout, C. Obray, J. Jungles
Opt. Eng. 24(3), 243414 (1 June 1985) https://doi.org/10.1117/12.7973498
TOPICS: Surface finishing, Radium, Manufacturing, Transducers, Calibration
John Detrio, Susan Miner
Opt. Eng. 24(3), 243419 (1 June 1985) https://doi.org/10.1117/12.7973499
TOPICS: Integrated optics, Scatter measurement, Standards development, Surface roughness, Mirrors, Scattering
R.-J. Ahlers
Opt. Eng. 24(3), 243423 (1 June 1985) https://doi.org/10.1117/12.7973500
TOPICS: Sensors, Surface roughness, Radium, Americium, Prototyping
James Trolinger
Opt. Eng. 24(3), 243428 (1 June 1985) https://doi.org/10.1117/12.7973501
TOPICS: Holography, Holograms, Diagnostics, Data storage
Friedhelm Becker, Yung Yu
Opt. Eng. 24(3), 243429 (1 June 1985) https://doi.org/10.1117/12.7973502
TOPICS: Computing systems, Visualization, Image segmentation
H. Tan, D. Modarress
Opt. Eng. 24(3), 243435 (1 June 1985) https://doi.org/10.1117/12.7973503
TOPICS: Reconstruction algorithms, Tomography, Interferometry, Iterative methods
A. Havener, L. Obergefell
Opt. Eng. 24(3), 243441 (1 June 1985) https://doi.org/10.1117/12.7973504
TOPICS: Interferometry, Visualization, Computer graphics, Fringe analysis, Numerical analysis
James Craig, C. Allen
Opt. Eng. 24(3), 243446 (1 June 1985) https://doi.org/10.1117/12.7973505
TOPICS: Aerodynamics, Optical instrument design, Phase measurement, Laser beam propagation, Temporal resolution, Q switched lasers, Nd:YAG lasers, Holography, Cameras, Americium
W. Bachalo, M. Houser
Opt. Eng. 24(3), 243455 (1 June 1985) https://doi.org/10.1117/12.7973506
TOPICS: Optical interferometry, Fourier transforms, Fluid dynamics, Holographic interferometry, Interferometry, Visualization, Doppler effect, Point diffraction interferometers, Holography
H. Caulfield
Opt. Eng. 24(3), 243462 (1 June 1985) https://doi.org/10.1117/12.7973507
TOPICS: Particles, Holograms, Spherical lenses
Gary Bertollini, Larry Oberdier, Yong Lee
Opt. Eng. 24(3), 243464 (1 June 1985) https://doi.org/10.1117/12.7973508
TOPICS: Image processing, Video, Diffraction, Analytical research, Video processing, Pulsed laser operation, Image acquisition, Feature extraction, Image restoration
Cecil Hess, James Trolinger
Opt. Eng. 24(3), 243470 (1 June 1985) https://doi.org/10.1117/12.7973509
TOPICS: Holograms, Particles, Holography, Fourier transforms, Far-field diffraction, Absorption, Error analysis, Pulsed laser operation
G. Reynolds, M. Short, M. Whiffen
Opt. Eng. 24(3), 243475 (1 June 1985) https://doi.org/10.1117/12.7973510
TOPICS: Fringe analysis, Digital image processing, Image processing, Velocity measurements, Particle image velocimetry, Data processing, Photography, Parallel processing
R. Wuerker, D. Hill
Opt. Eng. 24(3), 243480 (1 June 1985) https://doi.org/10.1117/12.7973511
TOPICS: Holography, Microscopy, Microscopes, Q switched lasers, Ruby lasers, Fiber optic illuminators
R. Yoder
Opt. Eng. 24(3), 243485 (1 June 1985) https://doi.org/10.1117/12.7973512
TOPICS: Optics manufacturing, Mirrors, Optical alignment, Diamond machining, Wavefront aberrations
M. Murty
Opt. Eng. 24(3), 243497 (1 June 1985) https://doi.org/10.1117/12.7973513
TOPICS: Mirrors, Optical components
Jacques Angenieux, Andre Masson, Yvon Rouchouse
Opt. Eng. 24(3), 243499 (1 June 1985) https://doi.org/10.1117/12.7973514
TOPICS: Manufacturing, Aspheric lenses, Infrared imaging, Infrared radiation, Spherical lenses, Optical spheres
Mohan Trivedi, Charles Harlow
Opt. Eng. 24(3), 243502 (1 June 1985) https://doi.org/10.1117/12.7973515
TOPICS: Image resolution, Image understanding, System identification, Reflectivity
Allan Mord, Neil Endsley, Eric Ramberg, Harold Reitsema
Opt. Eng. 24(3), 243507 (1 June 1985) https://doi.org/10.1117/12.7973516
TOPICS: Imaging systems, Modulation transfer functions, Image processing, Remote sensing, Sensing systems, Optical alignment, Tolerancing, Space operations, Data processing
Philipp Klein, Paul Nordquist, Arnold Singer
Opt. Eng. 24(3), 243516 (1 June 1985) https://doi.org/10.1117/12.7973517
TOPICS: Zirconium, Optical fibers, Iron, Cobalt, Nickel, Copper, Glasses, Metals, Absorption
S. Ball
Opt. Eng. 24(3), 243518 (1 June 1985) https://doi.org/10.1117/12.7973518
TOPICS: Refractive index, Phase contrast, Optical microscopes, Nondestructive evaluation, Optical fibers, Heterodyning, Precision optics, Multimode fibers, Index matching antireflective coatings, Liquids
A. Bruce, C. Moynihan, S. Loehr, S. Opalka, R. Mossadegh, N. Perazzo, N. Bansal, R. Doremus, M. Drexhage
Opt. Eng. 24(3), 243522 (1 June 1985) https://doi.org/10.1117/12.7973519
TOPICS: Glasses, Metals, Optical components, Material purity, Transparency, Crystals
Patrick Del Rio, Robert Kruger
Opt. Eng. 24(3), 243527 (1 June 1985) https://doi.org/10.1117/12.7973520
TOPICS: Tomography, Digital x-ray imaging, X-ray imaging, X-rays, Image intensifiers, Imaging systems, Electronic design automation, Computer programming
Harold Klein
Opt. Eng. 24(3), 243529 (1 June 1985) https://doi.org/10.1117/12.7973521
TOPICS: Infrared backgrounds
Y. Fainman, S. Lee
Opt. Eng. 24(3), 243535 (1 June 1985) https://doi.org/10.1117/12.7973522
TOPICS: Mirrors, Optical signal processing, Spherical lenses, Confocal microscopy, Fabry–Perot interferometers, Imaging systems, Data processing
Joseph Pierluissi, Gung-Shyong Peng
Opt. Eng. 24(3), 243541 (1 June 1985) https://doi.org/10.1117/12.7973523
TOPICS: Gases, Absorption, Carbon monoxide, Carbon dioxide, NOx, Transmittance
R. Spencer, G. Bergen, C. Fleetwood, H. Herzig, L. Miner, S. Rice, E. Smigocki, B. Woodgate, J. Zaniewski
Opt. Eng. 24(3), 243548 (1 June 1985) https://doi.org/10.1117/12.7973524
TOPICS: Ultraviolet radiation, Polarimetry, Mirrors, Optical components, Beam splitters, Spectroscopy, Light scattering, Americium, Objectives, Laser scattering
H. Caulfield
Opt. Eng. 24(3), 243555 (1 June 1985) https://doi.org/10.1117/12.7973490
TOPICS: Optical engineering
Chris Georgopoulos
Opt. Eng. 24(3), 243556 (1 June 1985) https://doi.org/10.1117/12.7973525
TOPICS: Infrared imaging, Light sources
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