optical engineering
VOL. 24 · NO. 5 | August 1985
CONTENTS
IN THIS ISSUE

Journal Articles
Lloyd Huff
Opt. Eng. 24(5), 245723 (1 August 1985) doi:10.1117/12.7973565
TOPICS: Holography, Holograms, Diffraction, Metrology
David Casasent
Opt. Eng. 24(5), 245724 (1 August 1985) doi:10.1117/12.7973566
TOPICS: Computer generated holography, Pattern recognition, Holographic optical elements, Holography
R. Fusek, L. Lin, K. Harding, S. Gustafson
Opt. Eng. 24(5), 245731 (1 August 1985) doi:10.1117/12.7973567
TOPICS: Holography, Defect detection, Optical signal processing, Photomasks, Integrated optics, Integrated circuits, Prototyping, Inspection
V. Deason, L. Reynolds, M. McIlwain
Opt. Eng. 24(5), 245735 (1 August 1985) doi:10.1117/12.7973568
TOPICS: Plasma, Interferometry, Gases, Holography, Refractive index, Gas lasers, Laser Doppler velocimetry, Photographic analysis, Particles, Holographic interferometry
P. Haridas, E. Hafen, I. Pless, J. Harton, S. Dixit, D. Goloskie, S. Benton
Opt. Eng. 24(5), 245741 (1 August 1985) doi:10.1117/12.7973569
TOPICS: Particles, Holography, Sensors, Photography, Spatial resolution, Glasses, Spectroscopy, Leptons, Holograms
B. Tozer, R. Glenville, A. Gordon, M. Little, J. Webster, D. Wright
Opt. Eng. 24(5), 245746 (1 August 1985) doi:10.1117/12.7973570
TOPICS: Inspection, Holography, 3D image processing, Holograms, Environmental sensing, 3D image reconstruction, Data storage, Image resolution, Visualization, Data acquisition
Paul Plotkowski, Yau Hung, Joseph Hovanesian, Grant Gerhart
Opt. Eng. 24(5), 245754 (1 August 1985) doi:10.1117/12.7973571
TOPICS: Holography, Fringe analysis, Modulation, Data processing, Data acquisition, Holographic interferometry
G. Reynolds, D. Servaes, L. Ramos-Izquierdo, J. DeVelis, D. Peirce, P. Hilton, R. Mayville
Opt. Eng. 24(5), 245757 (1 August 1985) doi:10.1117/12.7973572
TOPICS: Holography, Holographic interferometry, Interferometry, Defect detection, Metals
Jose Margarinos, Daniel Coleman
Opt. Eng. 24(5), 245769 (1 August 1985) doi:10.1117/12.7973573
TOPICS: Holography, Mirrors, Holograms, Spherical lenses, Volume holography, Dispersion, Optics manufacturing, Optical simulations, Manufacturing, Linear filtering
S. Duncan, J. McQuoid, D. McCartney
Opt. Eng. 24(5), 245781 (1 August 1985) doi:10.1117/12.7973574
TOPICS: Optical filters, Holography, Manufacturing, Linear filtering, Tunable filters, Optical fibers
Richard Kim, Steven Case, Harold Schock
Opt. Eng. 24(5), 245786 (1 August 1985) doi:10.1117/12.7973575
TOPICS: Laser Doppler velocimetry, Holography, Aberration correction, Diffraction, Holographic optical elements, Sapphire, Optical fabrication, Combustion, Custom fabrication, Birefringence
Gary Swanson, Wilfrid Veldkamp
Opt. Eng. 24(5), 245791 (1 August 1985) doi:10.1117/12.7973576
TOPICS: Binary data, Diffraction gratings, Lenses, Astatine, Diffraction, Telescopes, Lens design, Lithography, Electromagnetism, Electromagnetic theory
James Cowan
Opt. Eng. 24(5), 245796 (1 August 1985) doi:10.1117/12.7973577
TOPICS: Microlens, Holography, Photoresist materials, Mirrors, Solar concentrators, 3D image processing, Imaging devices
Steven Arnold
Opt. Eng. 24(5), 245803 (1 August 1985) doi:10.1117/12.7973578
TOPICS: Computer generated holography, Holograms, Optical fabrication, Electron beams, Lithography, Holographic interferometry, Computing systems, Binary data, Aspheric lenses, Optical testing
R. Ingwall, H. Fielding
Opt. Eng. 24(5), 245808 (1 August 1985) doi:10.1117/12.7973579
TOPICS: Holograms, Holography, Solids, Diffraction, Oxygen, Refractive index, Modulation, Photopolymerization, Image processing, Resistance
F. Yu, G. Gerhart
Opt. Eng. 24(5), 245812 (1 August 1985) doi:10.1117/12.7973580
TOPICS: Holography, Computer programming, Speckle
Ryszard Pryputniewicz
Opt. Eng. 24(5), 245820 (1 August 1985) doi:10.1117/12.7973581
TOPICS: Holographic interferometry, Optical engineering
A. Stimpfling, P. Smigielski
Opt. Eng. 24(5), 245821 (1 August 1985) doi:10.1117/12.7973582
TOPICS: Holographic interferometry, Motion measurement, Holography, Nondestructive evaluation, Defect detection
R. Dandliker, R. Thalmann
Opt. Eng. 24(5), 245824 (1 August 1985) doi:10.1117/12.7973583
TOPICS: Holographic interferometry, Heterodyning, Video processing
Ryszard Pryputniewicz
Opt. Eng. 24(5), 245832 (1 August 1985) doi:10.1117/12.7973584
TOPICS: Pulsed laser operation, Holograms, Bone, Holography, Laser interferometry, Holographic interferometry, Interferometry, Biomedical optics, 3D image reconstruction, In vitro testing
J. Trolinger
Opt. Eng. 24(5), 245840 (1 August 1985) doi:10.1117/12.7973585
TOPICS: Holographic interferometry, Holography, Holograms, Detector arrays
Ryszard Pryputniewicz
Opt. Eng. 24(5), 245843 (1 August 1985) doi:10.1117/12.7973586
TOPICS: Holograms, Holography, Vibrometry, Beam shaping, 3D image reconstruction, Modulation, Bessel functions, Differential equations, Finite element methods
Ryszard Pryputniewicz
Opt. Eng. 24(5), 245849 (1 August 1985) doi:10.1117/12.7973587
TOPICS: Heterodyning, Holograms, Holography applications, Holographic interferometry, Interferometry, Lead, Finite element methods, Computer simulations
A. Milton, F. Barone, M. Kruer
Opt. Eng. 24(5), 245855 (1 August 1985) doi:10.1117/12.7973588
TOPICS: Sensors, Infrared radiation, Staring arrays, Infrared sensors, Infrared imaging, Detection and tracking algorithms, Algorithm development, Infrared detectors, Nonlinear response, Temperature metrology
K. Carder, R. Steward, P. Payne
Opt. Eng. 24(5), 245863 (1 August 1985) doi:10.1117/12.7973589
TOPICS: Solid state physics, Radiometry, Algorithm development, In situ metrology, Signal attenuation, Remote sensing, Reflectivity, Device simulation, Absorption, Backscatter
Patrick Meyrueis, Pierre Pfeiffer
Opt. Eng. 24(5), 245869 (1 August 1985) doi:10.1117/12.7973590
TOPICS: Fiber optic networks, Switching, Fiber optics, Stars
R. Munis, S. Marshall
Opt. Eng. 24(5), 245872 (1 August 1985) doi:10.1117/12.7973591
TOPICS: Refractive index, Data modeling, Absorption, Thermography, System on a chip, Transmittance
J. Tome, F. Yu, Grant Gerhart
Opt. Eng. 24(5), 245879 (1 August 1985) doi:10.1117/12.7973592
TOPICS: Multiplexing, Deflectometry, Interferometry, Fringe analysis, Moire patterns
David Schmieder, Burton Wolfe
Opt. Eng. 24(5), 245882 (1 August 1985) doi:10.1117/12.7973593
TOPICS: Performance modeling, Cameras, Televisions, Sensor performance, Imaging systems, Systems modeling
T. Bifano, T. Dow
Opt. Eng. 24(5), 245888 (1 August 1985) doi:10.1117/12.7973594
TOPICS: Spindles, Feedback control, Control systems, Crystals
Lih-Shyang Chan, Gabor Herman, Haiu-Mei Hung, Haim Levkowitz, Sushma Trivedi, Jayaram Udupa
Opt. Eng. 24(5), 245893 (1 August 1985) doi:10.1117/12.7973595
TOPICS: 3D displays
G. Laub, G. Lenz, E. Reinhardt
Opt. Eng. 24(5), 245901 (1 August 1985) doi:10.1117/12.7973596
TOPICS: 3D image processing, Imaging systems, Superposition, Optical testing, Error analysis, Computer simulations, Reconstruction algorithms, Optical microscopy
T. Efthimiopoulos
Opt. Eng. 24(5), 245906 (1 August 1985) doi:10.1117/12.7973597
TOPICS: Dye lasers, Excimers, Modulation, Rhodamine
A. Goutzoulis, B. Vijaya Kumar
Opt. Eng. 24(5), 245908 (1 August 1985) doi:10.1117/12.7973598
TOPICS: Sensors, Acousto-optics, Spectrum analysis
Joseph Geary
Opt. Eng. 24(5), 245913 (1 August 1985) doi:10.1117/12.7973599
TOPICS: Infrared photography, Infrared radiation, Photography
P. Jacquot, P. Rastogi, L. Pflug
Opt. Eng. 24(5), 245918 (1 August 1985) doi:10.1117/12.7973600
TOPICS: Holographic interferometry, Resistance, Bone, Diagnostics
Jack Gaskill
Opt. Eng. 24(5), 245925 (1 August 1985) doi:10.1117/12.7973564
TOPICS: Solids
Jack Gaskill
Opt. Eng. 24(5), 245926 (1 August 1985) doi:10.1117/12.7973601
TOPICS: Solids
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