optical engineering
VOL. 24 · NO. 6 | December 1985
CONTENTS
IN THIS ISSUE

Journal Articles
Mark Johnson
Opt. Eng. 24(6), (1 December 1985) doi:10.1117/12.7973608
TOPICS: Sensors, Fiber optics sensors, Metrology, Interferometry, Interferometers, Modulators, Reflectometry, Optical fibers, Receivers, Multimode fibers
L. Currie
Opt. Eng. 24(6), 241004 (1 December 1985) doi:10.1117/12.7973617
TOPICS: Pattern recognition, Data modeling, Numerical modeling, Spectroscopy, Matrices, Aerosols, Data processing
Ben Jansen
Opt. Eng. 24(6), 241009 (1 December 1985) doi:10.1117/12.7973618
TOPICS: Rule based systems, Electroencephalography, Brain, Pattern recognition
David Laude, Carolyn Johlman, Charles Wilkins
Opt. Eng. 24(6), 241011 (1 December 1985) doi:10.1117/12.7973619
TOPICS: Infrared spectroscopy, Spectroscopy, Chemical analysis, FT-IR spectroscopy, Infrared radiation, Mass spectrometry, Chromatography, Structural analysis, Fourier transforms, Silica
Sanjib Ghosh
Opt. Eng. 24(6), 241014 (1 December 1985) doi:10.1117/12.7973620
TOPICS: Motion measurement, Imaging systems, Cameras, Precision measurement, 3D image processing, Computing systems, Photogrammetry
David Tweed
Opt. Eng. 24(6), 241018 (1 December 1985) doi:10.1117/12.7973621
TOPICS: Scanners, Clocks, Electro optics, Optical resolution, Analog electronics, Distortion
Z. Fuzessy, P. Wesolowski
Opt. Eng. 24(6), 241023 (1 December 1985) doi:10.1117/12.7973622
TOPICS: Holography, Environmental sensing, Holographic interferometers, 3D modeling
Victor Tom, Mark Carlotto, Daniel Scholten
Opt. Eng. 24(6), 241026 (1 December 1985) doi:10.1117/12.7973623
TOPICS: Infrared imaging, Thermography, Image resolution, Image enhancement, Earth observing sensors, Infrared radiation, Image analysis, Visible radiation, Data analysis, Landsat
D. Lai, V. Verfaille, J. Potenza
Opt. Eng. 24(6), 241030 (1 December 1985) doi:10.1117/12.7973624
TOPICS: Digital filtering, Image filtering, Pattern recognition, Gaussian filters
H. Bartelt, N. Streibl
Opt. Eng. 24(6), 241038 (1 December 1985) doi:10.1117/12.7973625
TOPICS: 3D displays, 3D image processing, Holography, Volume holography, Data processing, Medical imaging, Image processing, Computer aided design, Design for manufacturability, Manufacturing
Herbert Schneckenburger
Opt. Eng. 24(6), 241042 (1 December 1985) doi:10.1117/12.7973626
TOPICS: Biomedical optics, Laser systems engineering, Laser induced fluorescence, Signal detection, Environmental sensing, Tumors, Biological research, Bacteria, Biogases
Peter Werlberger
Opt. Eng. 24(6), 241045 (1 December 1985) doi:10.1117/12.7973627
TOPICS: Combustion, Endoscopes, Photography, High speed photography, Head, Silica, Image transmission, Cameras, Relays, Imaging systems
J. Barry, G. Mecherle
Opt. Eng. 24(6), 241049 (1 December 1985) doi:10.1117/12.7973628
TOPICS: Telecommunications, Satellite communications, Satellites, Free space optical communications, Antennas
Kurt Ding
Opt. Eng. 24(6), 241055 (1 December 1985) doi:10.1117/12.7973629
TOPICS: Thermography, Temperature metrology, Infrared radiation, Cooling systems, Infrared imaging, Imaging systems
K. Ahler, D. Alexander
Opt. Eng. 24(6), 241060 (1 December 1985) doi:10.1117/12.7973630
TOPICS: Particles, Digital image processing, Laser development, Laser processing, Image processing, Calibration, Diffraction, Cameras, Electro optics, Reticles
J. Timothy
Opt. Eng. 24(6), 241066 (1 December 1985) doi:10.1117/12.7973631
TOPICS: Sensors, Detector arrays, Sensor performance, Ultraviolet radiation, Charge-coupled devices, Microchannel plates
Bernard Bendow, Howard Rest, Osama El-Bayoumi
Opt. Eng. 24(6), 241072 (1 December 1985) doi:10.1117/12.7973632
TOPICS: Infrared imaging, Infrared radiation, Crystals, Vitreous
Gordon Hunter, Charly Allemand, Thomas Eagar
Opt. Eng. 24(6), 241081 (1 December 1985) doi:10.1117/12.7973633
TOPICS: Temperature metrology, Pyrometry, Error analysis, Computer simulations, Platinum
R. van Renesse, J. Burgmeijer
Opt. Eng. 24(6), 241086 (1 December 1985) doi:10.1117/12.7973634
TOPICS: Holography, Holograms, Microscopes, Fringe analysis
Robert Lewis
Opt. Eng. 24(6), 241093 (1 December 1985) doi:10.1117/12.7973635
TOPICS: Refractive index, Glasses, Polishing, Gradient-index optics
H. Feiglson, W. Kway, R. Route
Opt. Eng. 24(6), 241102 (1 December 1985) doi:10.1117/12.7973637
TOPICS: Crystals, Laser crystals, Fiber lasers, Laser applications, Sapphire, Sapphire lasers
David Adler
Opt. Eng. 24(6), 241109 (1 December 1985) doi:10.1117/12.7973638
Paul Klocek, Marshall Sparks
Opt. Eng. 24(6), 246098 (1 December 1985) doi:10.1117/12.7973636
TOPICS: Infrared radiation, Optical fibers, Absorption, Nonlinear dynamics
Jack Gaskill
Opt. Eng. 24(6), 246108 (1 December 1985) doi:10.1117/12.7973602
TOPICS: Second-harmonic generation
R. Woodin
Opt. Eng. 24(6), 246111 (1 December 1985) doi:10.1117/12.7973639
TOPICS: Laser applications, Chemical lasers, Laser processing, Laser spectroscopy, Spectroscopy, Diagnostics
Timothy Strand, Donald Sweeney
Opt. Eng. 24(6), 246925 (1 December 1985) doi:10.1117/12.7973603
TOPICS: Three dimensional sensing, 3D surface sensing, Inspection, Scientific research, Active remote sensing, Active optics
H. Wickramasinghe
Opt. Eng. 24(6), 246926 (1 December 1985) doi:10.1117/12.7973604
TOPICS: Heterodyning, Phase measurement
R. Thalmann, R. Dandliker
Opt. Eng. 24(6), 246930 (1 December 1985) doi:10.1117/12.7973605
TOPICS: Holography, Phase measurement, Heterodyning, Phase shifting, 3D metrology, Spherical lenses, Fringe analysis
F. Chiang, D. Li
Opt. Eng. 24(6), 246936 (1 December 1985) doi:10.1117/12.7973606
TOPICS: Speckle pattern, Speckle, Laser processing, Laser interferometry, Visibility, Interferometry, Electron transport, Photography
O. Kafri, I. Glatt
Opt. Eng. 24(6), 246944 (1 December 1985) doi:10.1117/12.7973607
TOPICS: Deflectometry, Optical testing, Diagnostics, Microscopy, Modulation transfer functions, Laser beam diagnostics, Optical components, Visual optics, Visualization, Turbulence
Jeffrey Jalkio, Richard Kim, Steven Case
Opt. Eng. 24(6), 246966 (1 December 1985) doi:10.1117/12.7973609
TOPICS: Inspection, 3D vision, Prototyping, Structured light
G. Bickel, G. Hausler, M. Maul
Opt. Eng. 24(6), 246975 (1 December 1985) doi:10.1117/12.7973610
TOPICS: Sensing systems, Three dimensional sensing, 3D surface sensing
G. Hausler, M. Maul
Opt. Eng. 24(6), 246978 (1 December 1985) doi:10.1117/12.7973611
TOPICS: Scanners, 3D scanning, Three dimensional sensing, 3D surface sensing
Donald Frankel, O. Sindoni
Opt. Eng. 24(6), 246981 (1 December 1985) doi:10.1117/12.7973612
TOPICS: Pattern recognition, Medical diagnostics, Medical devices, Statistical analysis, Process control
Lynn Hoffland, Ronald Piffath, James Bouck
Opt. Eng. 24(6), 246982 (1 December 1985) doi:10.1117/12.7973613
TOPICS: Raman spectroscopy, Refractive index, Mid-IR
Joseph Roehl
Opt. Eng. 24(6), 246985 (1 December 1985) doi:10.1117/12.7973614
TOPICS: Ions, Spectroscopy, Chemical detection, Signal processing, Interfaces, Electronic filtering, Linear filtering
John Gruninger
Opt. Eng. 24(6), 246991 (1 December 1985) doi:10.1117/12.7973615
TOPICS: Matrices, FT-IR spectroscopy, Feature selection, Pattern recognition
D. Frankel, M. Camac, H. Caulfield, C. Gozewski, C. Kolb
Opt. Eng. 24(6), 246996 (1 December 1985) doi:10.1117/12.7973616
TOPICS: Optical correlators, Absorption, Spatial filters, Environmental sensing
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