optical engineering
VOL. 25 · NO. 4 | April 1986
CONTENTS
IN THIS ISSUE

Journal Articles
Jack Gaskill
Opt. Eng. 25(4), 250470 (1 April 1986) https://doi.org/10.1117/12.7973852
TOPICS: Optical engineering
Edwin Weston, Virginia Ormiston, Robert Kingston, George Celler, John Melngailis, S. Goldberg
Opt. Eng. 25(4), 250471 (1 April 1986) https://doi.org/10.1117/12.7973869
TOPICS: Astronomy, Fiber optic communications, Information and communication technologies, Laser processing, Semiconductor lasers, Semiconductors, Optical lithography, Materials processing, Light
Yogesh Mehrotra, Dinesh Agrawal, Vladimir Stubican
Opt. Eng. 25(4), 254513 (1 April 1986) https://doi.org/10.1117/12.7973853
TOPICS: Precision optics, Ceramics, Optical components, Temperature metrology, Glasses, Mirrors, Surface finishing, Thermography, Silica, Solids
Claude Klein, Bernard diBenedetto, James Pappis
Opt. Eng. 25(4), 254519 (1 April 1986) https://doi.org/10.1117/12.7973854
TOPICS: Forward looking infrared, Zinc, Signal to noise ratio, Absorption, Signal processing, Solids, Target detection, Signal detection, Signal attenuation, Interference (communication)
H. Zeman, E. Hughes, J. Otis, A. Thompson, J. Walton
Opt. Eng. 25(4), 254532 (1 April 1986) https://doi.org/10.1117/12.7973855
TOPICS: Sensors, X-rays, X-ray detectors, Synchrotrons, Synchrotron radiation, Lead, Fluctuations and noise, Beam shaping, Collimation, Compton scattering
W. Dennis, W. Blau, D. Bradley
Opt. Eng. 25(4), 254538 (1 April 1986) https://doi.org/10.1117/12.7973856
TOPICS: Phase conjugation, Polymers, Four wave mixing, Picosecond phenomena, Reflectivity, Refractive index
William Eichhorn, Thomas Magner
Opt. Eng. 25(4), 254541 (1 April 1986) https://doi.org/10.1117/12.7973857
TOPICS: Polarizers, Far infrared, Spectrophotometry
Leonard Howell, Hans Kennel
Opt. Eng. 25(4), 254545 (1 April 1986) https://doi.org/10.1117/12.7973858
TOPICS: Particles, Photons, Hubble Space Telescope, Sensors, Luminescence, Stochastic processes, 3D modeling, Space telescopes, Photomultipliers, Cerenkov radiation imaging
James Wedding, Young Kim
Opt. Eng. 25(4), 254556 (1 April 1986) https://doi.org/10.1117/12.7973859
TOPICS: Particles, Atmospheric particles, Remote sensing, Laser development, Aerosol science, Calibration
Federico Bumbaca, Francois Blais, Marc Rioux
Opt. Eng. 25(4), 254561 (1 April 1986) https://doi.org/10.1117/12.7973860
TOPICS: Sensors, 3D image processing
V. Vanderbilt, L. Grant
Opt. Eng. 25(4), 254566 (1 April 1986) https://doi.org/10.1117/12.7973861
TOPICS: Polarization, Photometry, Reflectivity, In vivo imaging, Quality systems, Data acquisition, Chemical reactions
Jeffrey Davis, Kenneth Jones, Roger Lilly
Opt. Eng. 25(4), 254572 (1 April 1986) https://doi.org/10.1117/12.7973862
TOPICS: Binary data, Convolution, Computing systems
Leonid Kazovsky
Opt. Eng. 25(4), 254575 (1 April 1986) https://doi.org/10.1117/12.7973863
TOPICS: Receivers, Analytical research, Phase shift keying, Heterodyning, Rubidium, Modulation, Homodyne detection, Amplitude shift keying, Frequency shift keying, Transmitters
Robert Reedy, Frederick Schumacher
Opt. Eng. 25(4), 254580 (1 April 1986) https://doi.org/10.1117/12.7973864
TOPICS: Fiber optic components, Optical filters, Optical switching, Attenuators, Connectors, Signal attenuation, Switching, Diagnostics
Jack Cederquist, S. Robinson, D. Kryskowski, J. Fienup, C. Wackerman
Opt. Eng. 25(4), 254586 (1 April 1986) https://doi.org/10.1117/12.7973865
TOPICS: Wavefront sensors, Error analysis, Wavefronts, Adaptive optics, Estimation theory, Algorithms, Shearing interferometers, Computer simulations, Atmospheric sensing
W. Lehn
Opt. Eng. 25(4), 254593 (1 April 1986) https://doi.org/10.1117/12.7973866
TOPICS: Camera shutters, Cameras, Mirrors, Lenses, Light, Imaging systems
D. DeWitt
Opt. Eng. 25(4), 254596 (1 April 1986) https://doi.org/10.1117/12.7973867
TOPICS: Temperature metrology, Optical testing, Opacity, Sensors, Black bodies, Atmospheric physics, Physics
K. Nassau, M. Lines
Opt. Eng. 25(4), 254602 (1 April 1986) https://doi.org/10.1117/12.7973868
TOPICS: Optical fibers, Scattering, Glasses, Silica, Data analysis
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