Optical Engineering
VOL. 25 · NO. 8 | August 1986
CONTENTS
IN THIS ISSUE

Articles (1)
Journal Articles
Opt. Eng. 25(8), 258150 (1 August 1986) https://doi.org/10.1117/12.7973927
TOPICS: Optical engineering
Opt. Eng. 25(8), 258151 (1 August 1986) https://doi.org/10.1117/12.7973942
TOPICS: Optical scanning systems, Data storage, Integrated optics, Optoelectronics, Microwave radiation
Opt. Eng. 25(8), 258897 (1 August 1986) https://doi.org/10.1117/12.7973928
TOPICS: X-ray optics, Multilayers, X-rays, Thin films
Opt. Eng. 25(8), 258898 (1 August 1986) https://doi.org/10.1117/12.7973929
TOPICS: X-ray optics, Solids, Constructive interference, Scattering, Diffraction, Chemical species, Crystals
Opt. Eng. 25(8), 258916 (1 August 1986) https://doi.org/10.1117/12.7973930
TOPICS: X-rays, Multilayers, Computing systems, Reflection, Spectroscopy, Camera shutters
Opt. Eng. 25(8), 258922 (1 August 1986) https://doi.org/10.1117/12.7973931
TOPICS: Reflectors, Multilayers, X-rays, X-ray optics, Monochromators, Spectrometers, Light emitting diodes, Spectroscopes, Chemical analysis, Scanning electron microscopy
Opt. Eng. 25(8), 258933 (1 August 1986) https://doi.org/10.1117/12.7973932
TOPICS: Reflectivity, Multilayers, X-rays, Transmittance, Refractive index, Confocal microscopy, Spectral resolution, Absorption, Profiling
Opt. Eng. 25(8), 258937 (1 August 1986) https://doi.org/10.1117/12.7973933
TOPICS: X-rays, X-ray characterization, Reflectivity, Spectroscopy, Systems modeling, Interfaces, Spectrographs, Lead
Opt. Eng. 25(8), 258948 (1 August 1986) https://doi.org/10.1117/12.7973934
TOPICS: Multilayers, Electron microscopy, Thin films, Transmission electron microscopy, Crystals, Crystallography
Opt. Eng. 25(8), 258954 (1 August 1986) https://doi.org/10.1117/12.7973935
TOPICS: Multilayers, Coating, X-rays, Mirrors, Reflectivity, Scattering
Articles
Opt. Eng. 25(8), 258964 (1 August 1986) https://doi.org/10.1117/12.7973936
Journal Articles
Opt. Eng. 25(8), 258970 (1 August 1986) https://doi.org/10.1117/12.7973937
TOPICS: Mirrors, X-ray telescopes, X-ray optics, X-ray detectors, X-rays, Sensors, Optical instrument design, Space telescopes, Thin films, Diffraction
Opt. Eng. 25(8), 258979 (1 August 1986) https://doi.org/10.1117/12.7973938
TOPICS: Image compression, Image quality, Image processing
Opt. Eng. 25(8), 258984 (1 August 1986) https://doi.org/10.1117/12.7973939
TOPICS: Fiber optics, Optical fibers, Directional couplers, Gyroscopes, Lenses, Beam splitters, Sapphire, Polarization, Polishing, Surface finishing
Opt. Eng. 25(8), 258990 (1 August 1986) https://doi.org/10.1117/12.7973940
TOPICS: Wave propagation, Atmospheric propagation, Optical pumping, Laser beam propagation, Receivers, Reflectors, Sensors, Meteorology, Atmospheric modeling
Opt. Eng. 25(8), 258995 (1 August 1986) https://doi.org/10.1117/12.7973941
TOPICS: Forward looking infrared, Signal to noise ratio, Signal processing, Image segmentation, Image processing, Detection and tracking algorithms, Filtering (signal processing), Algorithm development, Digital filtering, Image analysis
Back to Top