optical engineering
VOL. 25 · NO. 8 | August 1986
CONTENTS
IN THIS ISSUE

Articles (1)
Journal Articles
Jack Gaskill
Opt. Eng. 25(8), 258150 (1 August 1986) doi:10.1117/12.7973927
TOPICS: Optical engineering
Bruce Radl, J. Donnelly, Arthur Oliner
Opt. Eng. 25(8), 258151 (1 August 1986) doi:10.1117/12.7973942
TOPICS: Optical scanning systems, Data storage, Integrated optics, Optoelectronics, Microwave radiation
Gerald Marshall
Opt. Eng. 25(8), 258897 (1 August 1986) doi:10.1117/12.7973928
TOPICS: X-ray optics, Multilayers, X-rays, Thin films
Troy Barbee, Jr.
Opt. Eng. 25(8), 258898 (1 August 1986) doi:10.1117/12.7973929
TOPICS: X-ray optics, Solids, Constructive interference, Scattering, Diffraction, Chemical species, Crystals
M. Bruijn, P. Chakraborty, H. van Essen, J. Verhoeven, M. van der Wiel
Opt. Eng. 25(8), 258916 (1 August 1986) doi:10.1117/12.7973930
TOPICS: X-rays, Multilayers, Computing systems, Reflection, Spectroscopy, Camera shutters
Gerald Marshall
Opt. Eng. 25(8), 258922 (1 August 1986) doi:10.1117/12.7973931
TOPICS: Reflectors, Multilayers, X-rays, X-ray optics, Monochromators, Spectrometers, Light emitting diodes, Spectroscopes, Chemical analysis, Scanning electron microscopy
Dwight Berreman
Opt. Eng. 25(8), 258933 (1 August 1986) doi:10.1117/12.7973932
TOPICS: Reflectivity, Multilayers, X-rays, Transmittance, Refractive index, Confocal microscopy, Spectral resolution, Absorption, Profiling
B. Henke, J. Uejio, H. Yamada, R. Tackaberry
Opt. Eng. 25(8), 258937 (1 August 1986) doi:10.1117/12.7973933
TOPICS: X-rays, X-ray characterization, Reflectivity, Spectroscopy, Systems modeling, Interfaces, Spectrographs, Lead
Yves Lepetre, Ivan Schuller, Georges Rasigni, Rene Rivoira, Roger Philip, Pierre Dhez
Opt. Eng. 25(8), 258948 (1 August 1986) doi:10.1117/12.7973934
TOPICS: Multilayers, Electron microscopy, Thin films, Transmission electron microscopy, Crystals, Crystallography
Eberhard Spiller, Alan Rosenbluth
Opt. Eng. 25(8), 258954 (1 August 1986) doi:10.1117/12.7973935
TOPICS: Multilayers, Coating, X-rays, Mirrors, Reflectivity, Scattering
Articles
J. Nicolosi, J. Groven, D. Merlo, R. Jenkins
Opt. Eng. 25(8), 258964 (1 August 1986) doi:10.1117/12.7973936
Journal Articles
Richard Hoover, David Shealy, Shao-Hua Chao
Opt. Eng. 25(8), 258970 (1 August 1986) doi:10.1117/12.7973937
TOPICS: Mirrors, X-ray telescopes, X-ray optics, X-ray detectors, X-rays, Sensors, Optical instrument design, Space telescopes, Thin films, Diffraction
Andrew Tescher, John Saghri
Opt. Eng. 25(8), 258979 (1 August 1986) doi:10.1117/12.7973938
TOPICS: Image compression, Image quality, Image processing
Shigefumi Masuda, Terumi Chikama, Hiroshi Onaka
Opt. Eng. 25(8), 258984 (1 August 1986) doi:10.1117/12.7973939
TOPICS: Fiber optics, Optical fibers, Directional couplers, Gyroscopes, Lenses, Beam splitters, Sapphire, Polarization, Polishing, Surface finishing
J. Sitterle, R. Manning, Paul Claspy, F. Merat
Opt. Eng. 25(8), 258990 (1 August 1986) doi:10.1117/12.7973940
TOPICS: Wave propagation, Atmospheric propagation, Optical pumping, Laser beam propagation, Receivers, Reflectors, Sensors, Meteorology, Atmospheric modeling
Robin Strickland, M. Gerber
Opt. Eng. 25(8), 258995 (1 August 1986) doi:10.1117/12.7973941
TOPICS: Forward looking infrared, Signal to noise ratio, Signal processing, Image segmentation, Image processing, Detection and tracking algorithms, Filtering (signal processing), Algorithm development, Digital filtering, Image analysis
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