Optical Engineering
VOL. 26 · NO. 2 | February 1987
CONTENTS
IN THIS ISSUE

Journal Articles
Solomon Musikant
Opt. Eng. 26(2), 260287 (1 February 1987) doi:10.1117/12.7974031
TOPICS: Optical engineering, Optical components
Paul Klocek, Mark Roth, R. Rock
Opt. Eng. 26(2), 260288 (1 February 1987) doi:10.1117/12.7974032
TOPICS: Optical fibers, Thermography, Chalcogenide glass, Glasses, Infrared imaging, Imaging systems, Laser development, Infrared sensors, Carbon dioxide lasers
Norbert Neuroth
Opt. Eng. 26(2), 260296 (1 February 1987) doi:10.1117/12.7974033
TOPICS: Laser glasses, Glasses, Laser development, Luminescence, Laser applications, Laser damage threshold, High power lasers
Hiroyuki Nasu, John Mackenzie
Opt. Eng. 26(2), 262102 (1 February 1987) doi:10.1117/12.7974034
TOPICS: Glasses, Refractive index, Composites, Polarization, Polarizability, Optical semiconductors, Organic semiconductors, Semiconductor materials, Semiconductors, Nonlinear optics
Stephen Kowel, Liangxiu Ye, Yixiang Zhang, L. Michael Hayden
Opt. Eng. 26(2), 262107 (1 February 1987) doi:10.1117/12.7974035
TOPICS: Polymer thin films, Polymers, Molecules, Thin films, Nonlinear optics, Lithium niobate, Second-harmonic generation, Modulation, Optical switching, Multilayers
R. Feigelson, R. Route
Opt. Eng. 26(2), 262113 (1 February 1987) doi:10.1117/12.7974036
TOPICS: Crystals, Nonlinear crystals, Silver thiogallate, Chalcopyrites, Infrared radiation, Silver selenogallate, Crystal optics, Scattering, Heat treatments, Transparency
Shin-Tson Wu
Opt. Eng. 26(2), 262120 (1 February 1987) doi:10.1117/12.7974037
TOPICS: Infrared radiation, Liquid crystals, Electro optics, Birefringence
J. Patel
Opt. Eng. 26(2), 262129 (1 February 1987) doi:10.1117/12.7974038
TOPICS: Ferroelectric LCDs, Liquid crystals, Electro optics
Robert Holman, Lynda Althouse Johnson, Doyle Skinner
Opt. Eng. 26(2), 262134 (1 February 1987) doi:10.1117/12.7974039
TOPICS: Electro optics, Ferroelectric materials, Crystals, Modulators, Electrodes, Potassium, Lithium niobate, Dielectrics, Optical components, Semiconductors
William Adler
Opt. Eng. 26(2), 262143 (1 February 1987) doi:10.1117/12.7974040
TOPICS: Infrared radiation, Data modeling, Statistical analysis, Data analysis, Missiles, Thermal modeling, Aerodynamics
Frank Moore
Opt. Eng. 26(2), 262152 (1 February 1987) doi:10.1117/12.7974041
TOPICS: Fiber optics, Optical inspection, Image processing, Inspection, Video processing, Video, Digital signal processing, Signal processing, Visualization, Head
James Janesick, Tom Elliott, Stewart Collins, Taher Daud, Dave Campbell, Gordon Garmire
Opt. Eng. 26(2), 262156 (1 February 1987) doi:10.1117/12.7974042
TOPICS: Charge-coupled devices, X-rays, Quantum efficiency, Performance modeling, Device simulation, Spatial resolution, Astrophysics
Lars Benckert, Mikael Jonsson, Nils-Erik Molin
Opt. Eng. 26(2), 262167 (1 February 1987) doi:10.1117/12.7974043
TOPICS: Photography, Speckle
Victor Martin, Ronald Sega, Richard Durham
Opt. Eng. 26(2), 262170 (1 February 1987) doi:10.1117/12.7974044
TOPICS: Microwave radiation, Fiber optics, Antennas, Measurement devices, Dielectrics, Fiber optics tests, Fiber optics sensors
I. Yamada, T. Takagi, P. Younger, J. Blake
Opt. Eng. 26(2), 262174 (1 February 1987) doi:10.1117/12.7974045
TOPICS: Ion beams, Metals, Chemical species, Interfaces
Jack Gaskill
Opt. Eng. 26(2), 262181 (1 February 1987) doi:10.1117/12.7974030
TOPICS: Optical engineering
Joseph Horner
Opt. Eng. 26(2), 262182 (1 February 1987) doi:10.1117/12.7974046
TOPICS: Holography, Phase conjugation, Four wave mixing
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