optical engineering
VOL. 26 · NO. 8 | August 1987
CONTENTS
IN THIS ISSUE

Journal Articles
James Janesick
Opt. Eng. 26(8), 268685 (1 August 1987) https://doi.org/10.1117/12.7974137
TOPICS: Charge-coupled devices, Magnetic semiconductors, Semiconductors, Magnetism, Signal processing, Image processing, Optical imaging
Taher Daud, James Janesick, Kenneth Evans, Tom Elliott
Opt. Eng. 26(8), 268686 (1 August 1987) https://doi.org/10.1117/12.7974138
TOPICS: Charge-coupled devices, Scanning electron microscopy, Electron beams, Quantum efficiency, Imaging systems, Electron microscopes, Analytical research
James Janesick, Tom Elliott, Stewart Collins, Morley Blouke, Jack Freeman
Opt. Eng. 26(8), 268692 (1 August 1987) https://doi.org/10.1117/12.7974139
TOPICS: Charge-coupled devices, Imaging spectroscopy, Spectroscopes
Patrick Epperson, Jonathan Sweedler, M. Bonner Denton, Gary Sims, Thomas McCurnin, Richard Aikens
Opt. Eng. 26(8), 268715 (1 August 1987) https://doi.org/10.1117/12.7974140
TOPICS: Charge-coupled devices, Electro optics, Quantum efficiency, Field effect transistors, CCD image sensors, Electrons, Image sensors, Sensors, Optical sensors
Gordon Hopkinson, R. Cockshott, D. Purll, M. Skipper, B. Taylor
Opt. Eng. 26(8), 268725 (1 August 1987) https://doi.org/10.1117/12.7974141
TOPICS: Charge-coupled devices, Stars, Reliability, X-ray astronomy, Satellites, Interference (communication), Electrons
Patrick Waddell, Carol Christian
Opt. Eng. 26(8), 268734 (1 August 1987) https://doi.org/10.1117/12.7974142
TOPICS: CCD cameras, Astronomy, Charge-coupled devices, Telescopes, Astronomical imaging, Imaging spectroscopy, Spectroscopes, Astronomical telescopes, Glasses, Antireflective coatings
Karl-Heinz Marien, Eckhart Pitz
Opt. Eng. 26(8), 268742 (1 August 1987) https://doi.org/10.1117/12.7974143
TOPICS: Quantum efficiency, Charge-coupled devices, Ultraviolet radiation, Calibration, Tungsten, Lamps, Interference filters, Monochromators
George Yates, Leland Sprouse, Donald Myers, Bojan Turko
Opt. Eng. 26(8), 268747 (1 August 1987) https://doi.org/10.1117/12.7974145
TOPICS: Charge-coupled devices, Electro optics, Electro optical modeling, Instrument modeling, Visible radiation, Picosecond phenomena, Video, Signal to noise ratio, Spectral resolution
M. Bautz, G. Berman, J. Doty, G. Ricker
Opt. Eng. 26(8), 268757 (1 August 1987) https://doi.org/10.1117/12.7974146
TOPICS: Charge-coupled devices, Performance modeling, Sensors, X-ray detectors, CCD image sensors, X-ray imaging, Particles, Quantum efficiency, Instrument modeling, Data modeling
Gordon Hopkinson
Opt. Eng. 26(8), 268766 (1 August 1987) https://doi.org/10.1117/12.7974147
TOPICS: Diffusion, Charge-coupled devices, CCD cameras, X-ray optics, Image analysis, Silicon, Image resolution, Spatial resolution, X-ray imaging, X-rays
David Lumb, Eric Chowanietz, Alan Walls
Opt. Eng. 26(8), 268773 (1 August 1987) https://doi.org/10.1117/12.7974148
TOPICS: Charge-coupled devices, X-rays, Diffusion, Measurement devices, Manufacturing, X-ray imaging, Spectrometers, Semiconducting wafers, X-ray astronomy, Astronomical spectroscopy
James Gunn, Michael Carr, G. Edward Danielson, Ernest Lorenz, Richard Lucinio, Victor Nenow, J. Devere Smith, James Westphal, Donald Schneider, Barbara Zimmerman
Opt. Eng. 26(8), 268779 (1 August 1987) https://doi.org/10.1117/12.7974149
TOPICS: Telescopes, Cameras, Charge-coupled devices, Multichannel imaging systems, Quantum efficiency, Imaging systems, Imaging spectroscopy, Spectroscopy, Astronomy, Observatories
I. Naday, M. Strauss, I. Sherman, M. Kramer, E. Westbrook
Opt. Eng. 26(8), 268788 (1 August 1987) https://doi.org/10.1117/12.7974150
TOPICS: Sensors, Synchrotrons, Proteins, Charge-coupled devices, X-ray detectors, X-rays, Crystallography, Diffraction, CCD image sensors, Crystals
L. Robinson, R. Stover, J. Osborne, J. Miller, S. Vogt, S. Allen
Opt. Eng. 26(8), 268795 (1 August 1987) https://doi.org/10.1117/12.7974151
TOPICS: Charge-coupled devices, Data acquisition, Observatories, Electronics, Operating systems, Computing systems
D. Content, M. Perry, D. Wroblewski, H. Moos
Opt. Eng. 26(8), 268806 (1 August 1987) https://doi.org/10.1117/12.7974152
TOPICS: Spectroscopy, Extreme ultraviolet, Cameras, Charge-coupled devices, CCD cameras, Electronics, Plasma diagnostics, Plasma, Diagnostics, Image resolution
Joseph Geary, Lawrence Parker
Opt. Eng. 26(8), 268813 (1 August 1987) https://doi.org/10.1117/12.7974153
TOPICS: Optical testing, Interferometers, Optical fibers
P. Ramamoorthy, S. Antony
Opt. Eng. 26(8), 268821 (1 August 1987) https://doi.org/10.1117/12.7974154
TOPICS: Symbolic substitution, Binary data, Analog electronics, Computing systems, Optical computing
Satoshi Suzuki, Makoto Kosugi, Toshio Hoshino
Opt. Eng. 26(8), 268826 (1 August 1987) https://doi.org/10.1117/12.7974155
Paul Yoder
Opt. Eng. 26(8), 268827 (1 August 1987) https://doi.org/10.1117/12.7974156
TOPICS: Active optics, Electromagnetism, Laser applications
Back to Top