Optical Engineering
VOL. 26 · NO. 8 | August 1987
CONTENTS
IN THIS ISSUE

Journal Articles
Opt. Eng. 26(8), 268685 (1 August 1987) https://doi.org/10.1117/12.7974137
TOPICS: Charge-coupled devices, Magnetic semiconductors, Semiconductors, Magnetism, Signal processing, Image processing, Optical imaging
Opt. Eng. 26(8), 268686 (1 August 1987) https://doi.org/10.1117/12.7974138
TOPICS: Charge-coupled devices, Scanning electron microscopy, Electron beams, Quantum efficiency, Imaging systems, Electron microscopes, Analytical research
Opt. Eng. 26(8), 268692 (1 August 1987) https://doi.org/10.1117/12.7974139
TOPICS: Charge-coupled devices, Imaging spectroscopy, Spectroscopes
Opt. Eng. 26(8), 268715 (1 August 1987) https://doi.org/10.1117/12.7974140
TOPICS: Charge-coupled devices, Electro optics, Quantum efficiency, Field effect transistors, CCD image sensors, Electrons, Image sensors, Sensors, Optical sensors
Opt. Eng. 26(8), 268725 (1 August 1987) https://doi.org/10.1117/12.7974141
TOPICS: Charge-coupled devices, Stars, Reliability, X-ray astronomy, Satellites, Interference (communication), Electrons
Opt. Eng. 26(8), 268734 (1 August 1987) https://doi.org/10.1117/12.7974142
TOPICS: CCD cameras, Astronomy, Charge-coupled devices, Telescopes, Astronomical imaging, Imaging spectroscopy, Spectroscopes, Astronomical telescopes, Glasses, Antireflective coatings
Opt. Eng. 26(8), 268742 (1 August 1987) https://doi.org/10.1117/12.7974143
TOPICS: Quantum efficiency, Charge-coupled devices, Ultraviolet radiation, Calibration, Tungsten, Lamps, Interference filters, Monochromators
Opt. Eng. 26(8), 268747 (1 August 1987) https://doi.org/10.1117/12.7974145
TOPICS: Charge-coupled devices, Electro optics, Electro optical modeling, Instrument modeling, Visible radiation, Picosecond phenomena, Video, Signal to noise ratio, Spectral resolution
Opt. Eng. 26(8), 268757 (1 August 1987) https://doi.org/10.1117/12.7974146
TOPICS: Charge-coupled devices, Performance modeling, Sensors, X-ray detectors, CCD image sensors, X-ray imaging, Particles, Quantum efficiency, Instrument modeling, Data modeling
Opt. Eng. 26(8), 268766 (1 August 1987) https://doi.org/10.1117/12.7974147
TOPICS: Diffusion, Charge-coupled devices, CCD cameras, X-ray optics, Image analysis, Silicon, Image resolution, Spatial resolution, X-ray imaging, X-rays
Opt. Eng. 26(8), 268773 (1 August 1987) https://doi.org/10.1117/12.7974148
TOPICS: Charge-coupled devices, X-rays, Diffusion, Measurement devices, Manufacturing, X-ray imaging, Spectrometers, Semiconducting wafers, X-ray astronomy, Astronomical spectroscopy
Opt. Eng. 26(8), 268779 (1 August 1987) https://doi.org/10.1117/12.7974149
TOPICS: Telescopes, Cameras, Charge-coupled devices, Multichannel imaging systems, Quantum efficiency, Imaging systems, Imaging spectroscopy, Spectroscopy, Astronomy, Observatories
Opt. Eng. 26(8), 268788 (1 August 1987) https://doi.org/10.1117/12.7974150
TOPICS: Sensors, Synchrotrons, Proteins, Charge-coupled devices, X-ray detectors, X-rays, Crystallography, Diffraction, CCD image sensors, Crystals
Opt. Eng. 26(8), 268795 (1 August 1987) https://doi.org/10.1117/12.7974151
TOPICS: Charge-coupled devices, Data acquisition, Observatories, Electronics, Operating systems, Computing systems
Opt. Eng. 26(8), 268806 (1 August 1987) https://doi.org/10.1117/12.7974152
TOPICS: Spectroscopy, Extreme ultraviolet, Cameras, Charge-coupled devices, CCD cameras, Electronics, Plasma diagnostics, Plasma, Diagnostics, Image resolution
Opt. Eng. 26(8), 268813 (1 August 1987) https://doi.org/10.1117/12.7974153
TOPICS: Optical testing, Interferometers, Optical fibers
Opt. Eng. 26(8), 268821 (1 August 1987) https://doi.org/10.1117/12.7974154
TOPICS: Symbolic substitution, Binary data, Analog electronics, Computing systems, Optical computing
Opt. Eng. 26(8), 268827 (1 August 1987) https://doi.org/10.1117/12.7974156
TOPICS: Active optics, Electromagnetism, Laser applications
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