optical engineering
VOL. 27 · NO. 5 | May 1988
CONTENTS
IN THIS ISSUE

Journal Articles
Jack Gaskill
Opt. Eng. 27(5), 270590 (1 May 1988) doi:10.1117/12.7976681
TOPICS: Optical engineering
Paul Yoder, David MacAdam
Opt. Eng. 27(5), 270591 (1 May 1988) doi:10.1117/12.7976696
TOPICS: Optical engineering
Bahram Javidi
Opt. Eng. 27(5), 275353 (1 May 1988) doi:10.1117/12.7976682
TOPICS: Optical signal processing, Optical engineering
Yunlong Sheng, Claude Lejeune, Henri Arsenault
Opt. Eng. 27(5), 275354 (1 May 1988) doi:10.1117/12.7976683
TOPICS: Image segmentation, Pattern recognition
R. Cormack, K. Johnson, Lin Zhang, W. Cathey
Opt. Eng. 27(5), 275358 (1 May 1988) doi:10.1117/12.7976684
TOPICS: Glasses, Optical inspection, Optics manufacturing, Optical filters, Digital filtering, Inspection, Manufacturing, Particles, Prototyping, Optoelectronics
David Clark, David Casasent
Opt. Eng. 27(5), 275365 (1 May 1988) doi:10.1117/12.7976685
TOPICS: Inspection, Fourier transforms
T. Hsu, Uzi Efron, W. Wu, J. Schulman, I. D'Haenens, Yia-Chung Chang
Opt. Eng. 27(5), 275372 (1 May 1988) doi:10.1117/12.7976686
TOPICS: Quantum wells, Optical signal processing, Modulators, Absorption, Refractive index, Phase shifts, Electro optics, Modulation, Waveguides, Optically addressed spatial light modulators
Arthur Chiou, Pochi Yeh, Monte Khoshnevisan
Opt. Eng. 27(5), 275385 (1 May 1988) doi:10.1117/12.7976687
TOPICS: Image filtering, Image processing, Optical filters, Phase conjugation, Energy coupling, Holographic interferometry, Holograms, Nonlinear filtering, Defect detection
Tien-Hsin Chao, Hua-Kuang Liu
Opt. Eng. 27(5), 275393 (1 May 1988) doi:10.1117/12.7976688
TOPICS: Image enhancement, Large screens, Spatial light modulators, Liquid crystals, Televisions, Modulation, Projection systems
Francis Yu, Chenhua Zhang, Suganda Jutamulia
Opt. Eng. 27(5), 275399 (1 May 1988) doi:10.1117/12.7976689
TOPICS: Holography, Content addressable memory, Symbolic substitution, Holography applications, Complex systems
Gerald Birth, Per-Gunnar Fyhn, Joseph Frank
Opt. Eng. 27(5), 275403 (1 May 1988) doi:10.1117/12.7976690
TOPICS: Light scattering, Scattering, Diffuse reflectance spectroscopy, Diffusion, Absorption, Particles
P. Ramamoorthy, S. Antony, Timothy Grogan
Opt. Eng. 27(5), 275409 (1 May 1988) doi:10.1117/12.7976691
TOPICS: Digital filtering, Optical filters, Solid state lighting, Binary data, Image filtering, Electronic filtering, Signal processing, Image processing, Symbolic substitution, Logic
Ted Lin, H. Lin, Bryan Chin
Opt. Eng. 27(5), 275413 (1 May 1988) doi:10.1117/12.7976692
TOPICS: Contamination, Tungsten, Contamination control, Infrared detection, Artificial intelligence, Robotics, Reliability, Process control
Berlyn Brixner, Morris Klein
Opt. Eng. 27(5), 275420 (1 May 1988) doi:10.1117/12.7976693
Yun Chung, T. Shay
Opt. Eng. 27(5), 275424 (1 May 1988) doi:10.1117/12.7976694
TOPICS: Semiconductor lasers, Fabry–Perot interferometry, Laser stabilization, Laser systems engineering, Modulation
Burton Figler
Opt. Eng. 27(5), 275428 (1 May 1988) doi:10.1117/12.7976695
TOPICS: Optical inspection, Inspection, Custom fabrication
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