optical engineering
VOL. 27 · NO. 8 | August 1988
CONTENTS
IN THIS ISSUE

Journal Articles
Jack Gaskill
Opt. Eng. 27(8), 278152 (1 August 1988) https://doi.org/10.1117/12.7976728
TOPICS: Optical engineering
Charles Morgan, Yves Chabal
Opt. Eng. 27(8), 278153 (1 August 1988) https://doi.org/10.1117/12.7976745
TOPICS: Signal analysis, Semiconductors
F. Chiang
Opt. Eng. 27(8), 278595 (1 August 1988) https://doi.org/10.1117/12.7976729
TOPICS: Mechanics, Solids
Ares Rosakis, Alan Zehnder, Ramaratnam Narasimhan
Opt. Eng. 27(8), 278596 (1 August 1988) https://doi.org/10.1117/12.7976730
TOPICS: Reflection, Mechanics, 3D modeling, Interferometry, 3D metrology, Optical testing, Time metrology, High speed photography, Photography, High speed cameras
Kevin Dickerson, Kyung-S. Kim
Opt. Eng. 27(8), 278611 (1 August 1988) https://doi.org/10.1117/12.7976731
C. Smith
Opt. Eng. 27(8), 278619 (1 August 1988) https://doi.org/10.1117/12.7976732
TOPICS: Photoelasticity
F. Chiang, T. Hareesh, B. Liu, S. Li
Opt. Eng. 27(8), 278625 (1 August 1988) https://doi.org/10.1117/12.7976733
TOPICS: Optical analysis
M. Tuttle, R. Klein
Opt. Eng. 27(8), 278630 (1 August 1988) https://doi.org/10.1117/12.7976734
TOPICS: Deflectometry, Photography, Composites, Moire patterns, Fringe analysis
Wei-Chung Wang, Chun-Yuan Chen, Wen-Hwa Chen
Opt. Eng. 27(8), 278636 (1 August 1988) https://doi.org/10.1117/12.7976735
TOPICS: Photoelastic analysis, Photoelasticity, Finite element methods
M. Arroyo, T. Yonte, M. Quintanilla, J. Saviron
Opt. Eng. 27(8), 278641 (1 August 1988) https://doi.org/10.1117/12.7976736
TOPICS: Particle image velocimetry, Velocity measurements, Photography, Argon ion lasers, Digital image processing, Image processing, Digital filtering, Spatial filters, Laser applications, Ruby lasers
Yoshiharu Morimoto, Yasuyuki Seguchi, Toshihiko Higashi
Opt. Eng. 27(8), 278650 (1 August 1988) https://doi.org/10.1117/12.7976737
TOPICS: Moire patterns, Fringe analysis, Fourier transforms, Digital image processing
K. Arunkumar, James Trolinger
Opt. Eng. 27(8), 278657 (1 August 1988) https://doi.org/10.1117/12.7976738
TOPICS: Ruby, Resonators, Laser resonators, Oscillators, Rod lasers
Robert Marshalek, Gerhard Koepf
Opt. Eng. 27(8), 278663 (1 August 1988) https://doi.org/10.1117/12.7976739
TOPICS: Semiconductor lasers, Nd:YAG lasers, Networks, Semiconductors, Modulation, Telecommunications, Satellites, Carbon dioxide lasers, Gas lasers, Solid state lasers
Jim Lee
Opt. Eng. 27(8), 278677 (1 August 1988) https://doi.org/10.1117/12.7976740
TOPICS: Bragg cells, Phase measurement, Diffraction, Fringe analysis
J. Fincke, C. Jeffery, R. Spjut
Opt. Eng. 27(8), 278684 (1 August 1988) https://doi.org/10.1117/12.7976741
TOPICS: Particles, Astatine, Temperature metrology, Nd:YAG lasers, Tungsten, Continuous wave operation, Spectroscopy, Sensors, Diodes, Calibration
Robert Sherrier, Steven Suddarth, G. Johnson
Opt. Eng. 27(8), 278691 (1 August 1988) https://doi.org/10.1117/12.7976742
TOPICS: Chest, Tomography, Image intensifiers, Radiography, Laser scanners, Chest imaging, Tissues, Image processing
Alfred DeFonzo
Opt. Eng. 27(8), 278696 (1 August 1988) https://doi.org/10.1117/12.7976743
TOPICS: Semiconductor lasers, Femtosecond phenomena, Ultrafast phenomena, Modulation
F. Hopkins, J. Boyd
Opt. Eng. 27(8), 278701 (1 August 1988) https://doi.org/10.1117/12.7976744
TOPICS: Charge-coupled devices, Imaging systems, Mathematical modeling, Photodiodes, Silicon, Data modeling
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