optical engineering
VOL. 28 · NO. 3 | March 1989
CONTENTS
IN THIS ISSUE

Journal Articles
Eric Bradley, Paul Yu, Alan Johnston
Opt. Eng. 28(3), 283201 (1 March 1989) https://doi.org/10.1117/12.7976935
TOPICS: Very large scale integration, Optical interconnects, Laser stabilization, Semiconductor lasers, Holography, Laser damage threshold, Computer networks, Optical networks, Computer generated holography, Computing systems
Joseph Geary
Opt. Eng. 28(3), 283212 (1 March 1989) https://doi.org/10.1117/12.7976936
TOPICS: Fiber optics tests, Optical testing, Data analysis, Fiber optics, Optical fibers
Josenh Geary
Opt. Eng. 28(3), 283217 (1 March 1989) https://doi.org/10.1117/12.7976937
TOPICS: Interferometry, X-ray optics, Data analysis
Elli Kohen, Cahide Kohen, Joseph Hirschberg, Marek Fried, Jeffrey Prince
Opt. Eng. 28(3), 283222 (1 March 1989) https://doi.org/10.1117/12.7976938
TOPICS: Luminescence, Microscopy, Chemistry, Genetics, Mode conditioning cables, Parallel computing, Liver, Statistical methods, Statistical analysis, Resistance
Nicolaos Tzannes, Michael Tzannes, John Bodenschatz
Opt. Eng. 28(3), 283232 (1 March 1989) https://doi.org/10.1117/12.7976939
TOPICS: Reconstruction algorithms, Image compression
Kenneth Voss
Opt. Eng. 28(3), 283241 (1 March 1989) https://doi.org/10.1117/12.7976940
TOPICS: Cameras, Imaging systems, Optical properties, Electro optics, Lenses, Optical filters, Absorption
J. Retzler, P. Zielle, P. Susan, K. Edwards
Opt. Eng. 28(3), 283248 (1 March 1989) https://doi.org/10.1117/12.7976941
TOPICS: Optical discs, Radiation effects, Ionizing radiation, Gamma radiation, Electrons, Magneto-optics, Silicon, Optoelectronics, Particles
Albert Brunsting, Andrew Dosmann, Gerald Shaffer
Opt. Eng. 28(3), 283255 (1 March 1989) https://doi.org/10.1117/12.7976942
TOPICS: Reflectivity, Chemical analysis, Biomedical optics, Radio optics, Statistical analysis, Radiometry, Medical diagnostics, Temporal resolution
E. Simova, V. Sainov
Opt. Eng. 28(3), 283261 (1 March 1989) https://doi.org/10.1117/12.7976943
TOPICS: Holographic interferometry, Holography, Nondestructive evaluation, Deflectometry, Moire patterns, Defect detection, Reliability
Bahram Javidi
Opt. Eng. 28(3), 283267 (1 March 1989) https://doi.org/10.1117/12.7976944
TOPICS: Optical correlators, Image filtering, Phase only filters, Binary data, Joint transforms
Steven Wein, William Wolfe
Opt. Eng. 28(3), 283273 (1 March 1989) https://doi.org/10.1117/12.7976945
TOPICS: Diffraction, Scatter measurement, Point spread functions, Gaussian beams, Monochromatic aberrations, Bidirectional reflectance transmission function, Americium, Numerical analysis
S. Albin, A. Cropper, L Watkins, Charles Bvvik, A. Buoncristiani
Opt. Eng. 28(3), 283281 (1 March 1989) https://doi.org/10.1117/12.7976946
TOPICS: Diamond, Laser damage threshold, Silicon films, Silicon, Semiconductor lasers, Resistance, Optical components, Laser optics, Laser systems engineering, Laser induced damage
David Braun, Kent Leyde
Opt. Eng. 28(3), 283286 (1 March 1989) https://doi.org/10.1117/12.7976947
TOPICS: Modulation, Optical testing, Americium, Photodetectors, Microscopes, Visual analytics, Visualization, Error analysis
Li Song, Pierre Galarneau, Roger Lessard
Opt. Eng. 28(3), 283290 (1 March 1989) https://doi.org/10.1117/12.7976948
TOPICS: Thin films, Optical recording, Laser crystals, Astatine, Crystals, Transmittance, Selenium, Diffraction, Holography, Diffraction gratings
Jack Gaskill
Opt. Eng. 28(3), 283297 (1 March 1989) https://doi.org/10.1117/12.7976934
Paul Yoder
Opt. Eng. 28(3), 283298 (1 March 1989) https://doi.org/10.1117/12.7976949
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