optical engineering
VOL. 28 · NO. 8 | August 1989
CONTENTS
IN THIS ISSUE

Journal Articles
Bahram Javidi, Joseph Horner
Opt. Eng. 28(8), 288837 (1 August 1989) https://doi.org/10.1117/12.7977043
TOPICS: Signal processing, Image processing, Image deconvolution, Image restoration, Nonlinear optics, Deconvolution, Nonlinear filtering, Filtering (signal processing), Nonlinear dynamics, Optical filters
Mike Kranzdorf, B. Jack Bigner, Lin Zhang, Kristina Johnson
Opt. Eng. 28(8), 288844 (1 August 1989) https://doi.org/10.1117/12.7977044
TOPICS: Content addressable memory, Pattern recognition, Image restoration, Classification systems, Image classification, Feature extraction, Neural networks, Optoelectronics, Matrices, Hardware testing
Kenneth Fielding, Steven Rogers, Matthew Kabrisky, James Mills
Opt. Eng. 28(8), 288849 (1 August 1989) https://doi.org/10.1117/12.7977045
TOPICS: Holography, Content addressable memory, Holograms, Fourier transforms, Phase conjugation, Mirrors, Computer generated holography, Multiplexing, Ferroelectric materials, Diffraction
E. Igel, M. Kristiansen
Opt. Eng. 28(8), 288854 (1 August 1989) https://doi.org/10.1117/12.7977046
TOPICS: Sensors, Optical design, Image sensors, Relays, Lenses, Optical calibration
Joseph Geary
Opt. Eng. 28(8), 288859 (1 August 1989) https://doi.org/10.1117/12.7977047
TOPICS: Mirrors, High power lasers, Laser applications
Eric Fossum
Opt. Eng. 28(8), 288865 (1 August 1989) https://doi.org/10.1117/12.7977048
TOPICS: Image processing, Analog electronics, Imaging systems, Solid state electronics, Charge-coupled devices, Detector arrays, Infrared imaging, Infrared radiation, Staring arrays
X. Maldague, M. Dufour
Opt. Eng. 28(8), 288872 (1 August 1989) https://doi.org/10.1117/12.7977050
TOPICS: Robot vision, Sensors, Pyrometry, Inspection, Imaging systems, Active vision, Objectives, Charge-coupled devices, CCD image sensors, Beam splitters
Steven Rogers, Carl Tong, Matthew Kabrisky, James Mills
Opt. Eng. 28(8), 288881 (1 August 1989) https://doi.org/10.1117/12.7977051
TOPICS: Image segmentation, LIDAR, Image fusion, Infrared imaging, Infrared radiation, Image processing, Image filtering, Forward looking infrared
G. Poropat
Opt. Eng. 28(8), 288887 (1 August 1989) https://doi.org/10.1117/12.7977052
TOPICS: Detector arrays, Cadmium, Mercury, Sensors, Staring arrays, Mercury cadmium telluride, Photodetectors, Infrared detectors, Infrared radiation
I. Moring, T. Heikkinen, R. Myllyla, A. Kilpela
Opt. Eng. 28(8), 288897 (1 August 1989) https://doi.org/10.1117/12.7977053
TOPICS: Laser range finders, Scanners, 3D acquisition, 3D image processing, 3D scanning, Image acquisition, Data acquisition, 3D vision, Computing systems, Pulsed laser operation
A. Senthil Kumar, R. Vasu
Opt. Eng. 28(8), 288903 (1 August 1989) https://doi.org/10.1117/12.7977054
TOPICS: Image resolution, Imaging arrays
C. Sun
Opt. Eng. 28(8), 288909 (1 August 1989) https://doi.org/10.1117/12.7977055
TOPICS: Photodiodes, Optical computing, Optical arrays, Semiconductors, Spatial light modulators, Photodetectors, Optical signal processing, Optical interconnects, Very large scale integration, Artificial neural networks
Michael Feldman, Clark Guest
Opt. Eng. 28(8), 288915 (1 August 1989) https://doi.org/10.1117/12.7977056
TOPICS: Holograms, Optical interconnects, Lithography, Integrated circuits, Optical design, Electronic circuits, Computer generated holography, Computer programming, Laser sources, Sensors
Chandra Vikram, T. McDevitt
Opt. Eng. 28(8), 288922 (1 August 1989) https://doi.org/10.1117/12.7977057
TOPICS: Doppler effect, Spectrum analysis, Vibrometry, Photodetectors, Heterodyning
J. Huntley, J. Field
Opt. Eng. 28(8), 288926 (1 August 1989) https://doi.org/10.1117/12.7977058
TOPICS: Moire patterns, Photography, Stress analysis, High speed photography, Cameras, Fringe analysis, Fourier transforms, Solids, Particles
William Primak
Opt. Eng. 28(8), 288934 (1 August 1989) https://doi.org/10.1117/12.7977059
TOPICS: Error analysis, Optical engineering
Jack Gaskill
Opt. Eng. 28(8), 288935 (1 August 1989) https://doi.org/10.1117/12.7977042
TOPICS: Optical engineering
Paul Yoder
Opt. Eng. 28(8), 288936 (1 August 1989) https://doi.org/10.1117/12.7977060
TOPICS: Inspection, Process control
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