Subsurface flaw detection in reflective materials by thermal-transfer imaging

Xavier P. Maldague; Jean-Claude Krapez; Paolo G. Cielo

doi:10.1117/12.55760

1 January 1991 Subsurface flaw detection in reflective materials by thermal transfer imaging

Xavier P. Maldague, Jean-Claude Krapez, Paolo G. Cielo

Author Affiliations +

Optical Engineering, Vol. 30, Issue 1, (January 1991). https://doi.org/10.1117/12.55760

Abstract

A thermal imaging apparatus is described for the nondestructive detection of subsurface defects in materials that would not usually lend themselves to thermal imaging because of their low emissivity and high susceptibility to background reflection noise. This is accomplished by transferring the thermal image produced by surface temperature perturbation of the workpiece material to a high emissivity material with which it is continuously brought in contact. The transferred thermal image may be observed by a suitable infrared device, resulting in a high radiance image with minimum reflectivity or variable emissivity noise. Numerical simulations, as well as experimental results, are presented.

Citation Download Citation

Xavier P. Maldague, Jean-Claude Krapez, and Paolo G. Cielo "Subsurface flaw detection in reflective materials by thermal transfer imaging," Optical Engineering 30(1), (1 January 1991). https://doi.org/10.1117/12.55760

Published: 1 January 1991

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available