optical engineering
VOL. 30 · NO. 8 | August 1991
CONTENTS
IN THIS ISSUE

Articles (24)
Articles (2)
Articles
Brian Thompson
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55905
TOPICS: Data processing, Neural networks, Electrical engineering, Optical engineering, Process control, Analytical research, Electro optics, Distortion invariant pattern recognition, Systems modeling, Applied research
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55906
TOPICS: Multilayers, X-ray optics, X-rays, Extreme ultraviolet, Mirrors, X-ray telescopes, Spatial resolution, Microscopes, Coronagraphy, Telescopes
Pierre Boher, Philippe Houdy, Louis Hennet, Jean-Pierre Delaboudiniere, Mikhael Kuehne, P. Muller, Zhigang Li, David Smith
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55920
TOPICS: Silicon, Multilayers, X-rays, Reflectivity, Oxygen, Nitrogen, Interfaces, Ellipsometry, Reflection, Absorption
Masaaki Sudoh, Ryouhei Yokoyama, Mitsuo Sumiya, Masaki Yamamoto, Mihiro Yanagihara, Takeshi Namioka
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55908
TOPICS: Reflectivity, X-rays, Temperature metrology, Multilayers, X-ray diffraction, Silicon, Molybdenum, Photomicroscopy, Radiation effects, Transmission electron microscopy
Troy Barbee, John Weed, Richard Hoover, Maxwell Allen, Joakim Lindblom, Ray O'Neal, Charles Kankelborg, Craig DeForest, Elizabeth Paris, Arthur B. Walker, Thomas Willis, Efim Gluskin, Piero Pianetta, Phillip Baker
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55917
Patrick Kearney, Jon Slaughter, Charles Falco
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55910
TOPICS: Mirrors, Reflectivity, X-rays, Multilayers, X-ray optics, Interfaces, Superlattices, Calcium, Palladium, Optical components
Chantal Khan Malek, F. Ladan, Jean-Rene Rivoira
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55909
TOPICS: Zone plates, Mirrors, X-rays, Etching, Reflectivity, Molybdenum, Microlens, X-ray optics, Lenses, Lithography
Richard Hoover, David Shealy, B. Brinkley, Phillip Baker, Troy Barbee, Arthur Walker
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55924
TOPICS: Microscopes, X-rays, Multilayers, X-ray imaging, X-ray optics, Mirrors, X-ray telescopes, Spatial resolution, Telescopes, Carbon
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55913
TOPICS: Microscopes, Mirrors, Spherical lenses, Monochromatic aberrations, X-rays, Head, Image resolution, Modulation transfer functions, X-ray imaging, X-ray optics
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55914
TOPICS: Free electron lasers, Extreme ultraviolet, Mirrors, Projection lithography, Reflectivity, Photomasks, Lithography, Semiconducting wafers, Projection systems, Reflection
Eberhard Spiller, R. McCorkle, Janusz Wilczynski, Leon Golub, George Nystrom, Peter Takacs, Charles Welch
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55915
TOPICS: Mirrors, Telescopes, Scattering, X-ray telescopes, Reflectivity, Spatial frequencies, Rockets, X-rays, Light scattering, Coating
Richard Hoover, Arthur Walker, Craig DeForest, Maxwell Allen, Joakim Lindblom
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55916
TOPICS: Extreme ultraviolet, Photography, Spectroscopy, X-rays, X-ray telescopes, Spatial resolution, Sun, Sensors, Solar telescopes, Space telescopes
Craig DeForest, Charles Kankelborg, Maxwell Allen, Elizabeth Paris, Thomas Willis, Joakim Lindblom, Ray O'Neal, Arthur Walker, Troy Barbee, Richard Hoover, Troy Barbee III
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55911
TOPICS: Telescopes, Solar processes, Multilayers, Iron, Plasma, Extreme ultraviolet, Diagnostics, Reflectivity, Solar telescopes, Mirrors
Joakim Lindblom, Ray O'Neal, Arthur Walker, Forbes Powell, Troy Barbee, Richard Hoover, Stephen Powell
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55912
TOPICS: Optical filters, Carbon, Visible radiation, Extreme ultraviolet, Aluminum, Telescopes, Ultraviolet radiation, Multilayers, Beryllium, Absorption
J. Gethyn Timothy, Thomas Berger, Jeffrey Morgan, Arthur Walker, Surendra Jain, Ajay Saxena, Jagadish Bhattacharyya, Martin Huber, Giuseppe Tondello, Giampiero Naletto
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55921
TOPICS: Extreme ultraviolet, Spectroscopy, Sensors, Diffraction gratings, Imaging systems, Infrared spectroscopy, Rockets, Coronagraphy, Calibration, Space telescopes
Melville Ulmer, Rudy Haidle, Robert Altkorn, P. Georgopoulos, Brian Rodricks, Peter Takacs
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55918
TOPICS: Mirrors, X-rays, Gold, X-ray optics, Optical testing, Coating, Nickel, Optical fabrication, Grazing incidence, X-ray astronomy
Dennis Mills
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55907
TOPICS: Polarization, Crystals, X-rays, Synchrotron radiation, Polarimetry, Diffraction, Polarization analysis, Absorption, Compton scattering, Reflectivity
Silvano Fineschi, Richard Hoover, Juan Fontenla, Arthur Walker
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55922
TOPICS: Polarization, Magnetism, Coronagraphy, Polarimetry, Solar processes, Extreme ultraviolet, Scattering, Zeeman effect, Electrons, Chemical species
Richard Hoover, Silvano Fineschi, Juan Fontenla, Arthur Walker
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55923
TOPICS: Coronagraphy, Telescopes, Polarization, Mirrors, Extreme ultraviolet, Magnetism, Polarimetry, Solar processes, Cameras, Photography
George Fraser, John Lees, James Pearson
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55919
TOPICS: X-rays, Quantum efficiency, Polarimetry, Polarization, Phase shifts, Data modeling, Cesium, Crystals, Ultraviolet radiation, Absorption
Hal Kraus
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55900
TOPICS: Fourier transforms, Diffraction, Chemical elements, Far-field diffraction, Phase shifts, Optical components, Mirrors, Telescopes, Imaging systems, Erbium
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55899
TOPICS: 3D modeling, Convection, Interfaces, Laser processing, Liquids, Motion models, Information operations, Solids, Diffusion, Metals
Yassin Hassan, Thomas Blanchat
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55901
TOPICS: Particles, Cameras, Image analysis, Velocity measurements, Pulsed laser operation, Laser velocimetry, Visualization, Imaging systems, Photography, Light scattering
Opt. Eng. 30(8), (1 August 1991) doi:10.1117/12.55902
TOPICS: Transmittance, Refraction, Distortion, Nonlinear optics, Optical limiting, Absorption, Picosecond phenomena, Gaussian beams, Laser beam propagation, Refractive index
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