optical engineering
VOL. 30 · NO. 11 | November 1991
CONTENTS
IN THIS ISSUE

Articles (25)
Articles (2)
Articles
Brian Thompson
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.55987
TOPICS: Automatic target recognition, Adaptive optics, Biomedical optics, Electrical engineering, Image processing, Associative arrays, Medical research, Data processing, Neural networks, Roads
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.55988
TOPICS: Imaging systems, Infrared imaging, Systems modeling, Thermography, Electro optical modeling, Thermal modeling, Sensors, Infrared technology, Atmospheric modeling, Electro optics
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.56001
TOPICS: Sensors, Mercury cadmium telluride, Silicon, Quantum efficiency, Infrared sensors, Lead, Imaging systems, Photovoltaics, Detector arrays, Image sensors
Donald Stauffer, Barry Cole
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.55991
TOPICS: Projection systems, Silicon, Sensors, Thermography, Infrared imaging, Image resolution, Imaging systems, Infrared radiation, Micromachining, Infrared sensors
Michael Parsons, Vincent Tseng
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.56002
TOPICS: Sensors, Thermography, Logic, Flame detectors, Signal detection, Infrared radiation, Infrared detectors, Safety, Fourier transforms, Infrared imaging
Jeffrey Sanders, Michael Currin, Carl Halford
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.55993
TOPICS: Infrared imaging, Imaging systems, Infrared radiation, Detection theory, Visualization, Interference (communication), Signal detection, Image resolution, Visible radiation, CRTs
Mark Nelson, Jerris Johnson, Terrence Lomheim
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.55996
TOPICS: Sensors, Calibration, Staring arrays, Capacitance, Field effect transistors, Amplifiers, Photodiodes, Optical amplifiers, Capacitors, Infrared radiation
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.55984
TOPICS: Target detection, Thermodynamics, Thermography, Transmittance, Electro optical modeling, Imaging systems, Thermal modeling, Performance modeling, Temperature metrology, Signal attenuation
A. Shushan, Y. Meninberg, Izhak Levy, Norman Kopeika
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.55990
TOPICS: Image quality, Aerosols, Thermography, Atmospheric particles, Atmospheric modeling, Modulation transfer functions, Spatial frequencies, Humidity, Light scattering, Scattering
Steven Shepard, David Sass, Thomas Imirowicz
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.55992
TOPICS: Imaging systems, Video, Radiometry, Infrared imaging, Transistors, Temporal resolution, Mirrors, Combustion, Image segmentation, Target acquisition
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.55994
TOPICS: Reticles, Sensors, Modulation, Frequency modulation, Imaging systems, Fermium, Mirrors, Signal detection, Staring arrays, Electronic filtering
Mark Althouse, Chein-I Chang
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.55995
TOPICS: Sensors, Optical filters, Image filtering, Digital filtering, Detection and tracking algorithms, Clouds, Chemical elements, Forward looking infrared, Detector arrays, Thermography
Eric Schildwachter, Glenn Boreman
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.56005
TOPICS: Modulation transfer functions, Acousto-optics, Projection systems, Modulation, Sensors, Acoustics, Amplitude modulation, Scanners, Diffraction, Infrared radiation
John Hubbs, Gary Dole, Douglas Arrington, Mark Gramer
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.56007
TOPICS: Staring arrays, Signal processing, Sensors, Radiation effects, Infrared radiation, Photons, Capacitance, Computing systems, Field effect transistors, Infrared detectors
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.56004
TOPICS: Infrared imaging, Infrared radiation, Data modeling, Sensors, 3D modeling, Databases, Image processing, Infrared signatures, Clouds, Scene simulation
Noel Jolivet, Stanley Voynick
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.55999
TOPICS: Computing systems, Semiconducting wafers, Clocks, Data acquisition, Failure analysis, Control systems, Infrared radiation, Multiplexers, Power supplies, Hardware testing
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.55989
TOPICS: Error analysis, Calibration, Radiometry, Infrared imaging, Imaging systems, Computing systems, Image analysis, Black bodies, Video, Sensors
Howard Kennedy
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.56000
TOPICS: Systems modeling, Sensors, Thermal modeling, Modulation transfer functions, Performance modeling, Interference (communication), Signal processing, Imaging systems, Filtering (signal processing), Data modeling
Minglun Gao, Mohammad Karim, Song Hua Zheng
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.55998
TOPICS: Imaging systems, Thermography, Minimum resolvable temperature difference, Thermal modeling, Performance modeling, Systems modeling, Fourier transforms, Instrument modeling, Modulation transfer functions, Electro optical modeling
James Whitlock, Glenn Boreman, Harold Brown, Allen Plogstedt
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.56003
TOPICS: Sensors, Capacitance, Resistance, Systems modeling, Optimization (mathematics), Electronics, Signal processing, Information security, Semiconductor materials, Black bodies
Mohammad Karim, Minglun Gao, Song Hua Zheng
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.55997
TOPICS: Minimum resolvable temperature difference, Solids, Spatial frequencies, Eye models, Signal to noise ratio, Black bodies, Imaging systems, Electro optical modeling, Temperature metrology, Systems modeling
William Kreiss, Arman Tchoubineh, William Lanich
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.56006
TOPICS: Electro optical modeling, Atmospheric modeling, Infrared imaging, Data modeling, Sensors, Systems modeling, Video, Thermal modeling, Imaging systems, Infrared sensors
Juergen Richter, Herbert Hughes
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.55981
TOPICS: LIDAR, Atmospheric modeling, Aerosols, Electro optical modeling, Coastal modeling, Systems modeling, Atmospheric particles, Temperature metrology, Humidity, Visibility
John Greivenkamp, Kevin Sullivan, Russell Palum
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.55983
TOPICS: Interferometry, Interferometers, Wavefronts, Fringe analysis, Phase interferometry, Reflection, Aspheric lenses, Picosecond phenomena, Optics manufacturing, Etching
Tomoaki Eiju, Kiyofumi Matsuda
Opt. Eng. 30(11), (1 November 1991) doi:10.1117/12.55982
TOPICS: Laser Doppler velocimetry, Velocity measurements, Microscopes, Holography, Doppler effect, Holographic optical elements, Light scattering, Diffraction, Beam splitters, Spindles
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